Systems and methods involving write training to improve data valid windows
US-2022101898-A1 · Mar 31, 2022 · US
US12094513B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12094513-B2 |
| Application number | US-202217966680-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 14, 2022 |
| Priority date | Oct 27, 2021 |
| Publication date | Sep 17, 2024 |
| Grant date | Sep 17, 2024 |
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Tracking circuitry for a memory device is disclosed. The tracking circuitry includes an inverter, a level shifter, delay circuitry, and a logic gate. The inverter is configured to receive a first clock signal and generate an inverted clock signal. The level shifter is configured to receive the first clock signal and the inverted clock signal and generate a level shifted clock signal. The delay circuitry is configured to receive the level shifted clock signal and generate an inverted level shifted clock signal. The logic gate comprises a first input configured to receive the first clock signal and a second input configured to receive the inverted level shifted clock signal. The logic gate is configured to generate a second clock signal based on the first clock signal and the inverted level shifted clock signal.
Opening claim text (preview).
What is claimed is: 1. A tracking circuitry comprising: an inverter configured to receive a first clock signal and generate an inverted clock signal in a first power supply voltage domain; a level shifter configured to receive the first clock signal and the inverted clock signal and generate a level shifted clock signal in a second power supply voltage domain different from the first power supply voltage domain; delay circuitry configured to receive the level shifted clock signal and generate an inverted level shifted clock signal; and a logic gate comprising a first input configured to receive the first clock signal and a second input configured to receive the inverted level shifted clock signal, wherein the logic gate is configured to generate a second clock signal based on the first clock signal and the inverted level shifted clock signal. 2. The tracking circuitry of claim 1 , wherein the logic gate is a NOR gate. 3. The tracking circuitry of claim 1 , wherein a rising edge of the second clock signal corresponds to the first power supply voltage domain and a falling edge of the second clock signal corresponds to the second power supply voltage domain. 4. The tracking circuitry of claim 1 , wherein the logic gate comprises a first transistor having a gate coupled to the first input and a second transistor having a gate coupled to the second input and a source coupled to a drain of the first transistor, wherein the first transistor blocks current flow from the second transistor when a voltage value of the first input is a low voltage level. 5. The tracking circuitry of claim 1 , wherein the inverted clock signal is used by a data latch to generate a bitline input to a bitcell of a memory device. 6. The tracking circuitry of claim 1 , wherein the inverted clock signal is used by a bitline precharge latch to precharge a bitline input path to a bitcell. 7. The tracking circuitry of claim 1 , wherein the inverted clock signal is used by an address signal latch to generate a wordline input to a bitcell of a memory device. 8. The tracking circuitry of claim 1 , wherein the delay circuitry comprises an odd number of inverters. 9. A memory device comprising: bitcells configured to operate in a first power supply voltage domain; a memory core circuitry coupled to the bitcells and configured to generate a control signal in the first power supply voltage domain to write data to the bitcells; and a control circuitry coupled to the memory core circuitry, the control circuitry configured to generate a data clock signal in a second power supply voltage domain different than the first power supply voltage domain, wherein a rising edge of the data clock signal corresponds to the second power supply voltage domain and a falling edge of the data clock signal correspond to the first power supply voltage domain. 10. The memory device of claim 9 , wherein the data clock signal generated by the control circuitry is used by the memory core circuitry to generate a bitline input to the bitcells. 11. The memory device of claim 9 , wherein a wordline input to the bitcells operates in the first power supply voltage domain and a bitline input to the bitcells operates in the second power supply voltage domain. 12. The memory device of claim 9 , wherein the first power supply voltage domain is higher than the second power supply voltage domain. 13. The memory device of claim 9 , wherein the first power supply voltage domain is lower than the second power supply voltage domain. 14. The memory device of claim 9 , wherein the control circuitry is further configured to generate an address clock signal in the second power supply voltage domain. 15. The memory device of claim 9 , wherein the control circuitry generates the data clock signal in the second power supply voltage domain via a tracking circuitry in a buffer of the control circuitry. 16. A memory device comprising: bitcells configured to operate in a first power supply voltage domain; a memory core circuitry coupled to the bitcells and configured to generate a control signal in the first power supply voltage domain to write data to the bitcells; and a control circuitry coupled to the memory core circuitry, the control circuitry configured to generate an address clock signal in a second power supply voltage domain different than the first power supply voltage domain, wherein a rising edge of the address clock signal corresponds to the second power supply voltage domain and a falling edge of the address clock signal correspond to the first power supply voltage domain. 17. The memory device of claim 16 , wherein the address clock signal generated by the control circuitry is used by the memory core circuitry to generate a wordline input to the bitcells. 18. The memory device of claim 16 , wherein a wordline input to the bitcells operates in the first power supply voltage domain and a bitline input to the bitcells operates in the second power supply voltage domain. 19. The memory device of claim 16 , wherein the control circuitry generates the address clock signal in the second power supply voltage domain via a tracking circuitry in a buffer of the control circuitry. 20. The memory device of claim 16 , wherein the first power supply voltage domain is less than the second power supply voltage domain.
Cell access · CPC title
Bit-line or column circuits · CPC title
Timing of a write operation · CPC title
for memory cells of the field-effect type · CPC title
Power supply arrangements {, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels} · CPC title
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