Reference switch architectures for noncontact sensing of substances

US12085500B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12085500-B2
Application numberUS-202318111740-A
CountryUS
Kind codeB2
Filing dateFeb 20, 2023
Priority dateSep 1, 2015
Publication dateSep 10, 2024
Grant dateSep 10, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

First claim

Opening claim text (preview).

What is claimed is: 1. A light measurement system for measuring concentration of a substance, the system comprising: a light source configured to emit light into a sample; a lens located at an interface of the system and configured to receive a first portion of the light from a first location within the sample and a second portion of the light from a second location within the sample; a detector comprising a first detector pixel and second detector pixel; and an optics unit comprising: a first optics configured to receive the first portion of the light from the lens and direct the first portion of the light to the first detector pixel; and a second optics configured to receive the second portion of the light from the lens and direct the second portion of the light to the second detector pixel. 2. The light measurement system of claim 1 , wherein: the light comprises a first light that is emitted into the sample and a second light that is emitted toward a reference; and the optics unit comprises a third optics that receives the second light from the reference and directs the second light to the detector. 3. The light measurement system of claim 2 , wherein the third optics directs a first portion of the second light to the first detector pixel and a second portion of the second light to the second detector pixel. 4. The light measurement system of claim 2 , wherein the reference comprises a reflector comprising a titanium, cobalt, niobium, tungsten, nickel chrome, titanium tungsten, chrome, aluminum, gold or silver material, or combination thereof. 5. The light measurement system of claim 1 , wherein the lens comprises: a first output region configured to receive the first portion of the light from the first location within the sample and direct the first portion of the light to the first optics; and a second output region configured to receive the second portion of the light from the second location within the sample and direct the second portion of the light to the second optics. 6. The light measurement system of claim 1 , wherein the lens comprises a Fresnel lens. 7. The light measurement system of claim 1 , wherein: the optics unit comprises a microoptics unit having an array of microlenses; and the first optics is a first microlens of the array of microlenses; and the second optics is a second microlens of the array of microlenses. 8. The light measurement system of claim 7 , wherein: the microoptics unit comprises a substrate; and each microlens in the array of microlenses is attached to the substrate. 9. The light measurement system of claim 7 , wherein microlenses of the array of microlenses are separated by a patterned aperture comprising opaque section between the microlenses. 10. A light measurement system, comprising: a light source configured to emit a first light into a sample and a second light toward a reference; a lens located at an interface of the system and configured to receive the first light from the sample; a detector comprising a first detector pixel and second detector pixel; and an optics unit comprising: a first optics configured to receive the first light from the lens and direct the first light to the first detector pixel; and a second optics configured receive the second light from the reference and direct a first portion of the second light to the first detector pixel and a second potion of the second light to the second detector pixel. 11. The light measurement system of claim 10 , wherein: the lens is configured to receive a first portion of the first light from a first location within the sample and a second portion of the first light from a second location within the sample; the first optics is configured to receive the first portion of the first light and direct the first portion of the first light to the first detector pixel; the optics unit further comprises a third optics that is configured to receive the second portion of the first light and direct the second portion of the first light to the second detector pixel. 12. The light measurement system of claim 10 , wherein the optics unit comprises an array of the microlenses attached to a substrate. 13. The system of claim 12 , wherein the optics unit comprises a light blocker that is configured to block stray light from reaching the detector. 14. The system of claim 13 , wherein the light blocker comprises a light absorbing material. 15. The light measurement system of claim 10 , wherein: the optics unit comprises a microoptics unit comprising an array of microlenses; the detector comprises a plurality of detector pixels; and each microlens is optically coupled to a detector pixel of the plurality of detector pixels to form lens-pixel pair. 16. The light measurement system of claim 15 , wherein each lens-pixel pair is associated with a different location in the sample. 17. The light measurement system of claim 10 , further comprising an aperture positioned between the lens and the optics unit, wherein: the aperture has a first opening along a first path of the first light; and the aperture has a second opening along a second path of the second light. 18. A system for measuring concentration of a substance in a sample, the system comprising: a light source configured to emit light into the sample; a plurality of output regions location at an interface of the system and configured to receive the light from the sample; a detector comprising a plurality of detector pixels; and a microoptics unit comprising an array of microlenses; wherein each output region is optically coupled to a microlens of the microoptics unit; each output region transmits a portion of the light associated with a different region of the sample to a respective microlens; and each microlens is optically coupled to a detector pixel of the plurality of detector pixels. 19. The system of claim 18 , further comprising a reference, wherein: the light comprises a first light emitted into the sample and a second light emitted to the reference; and the microoptics unit is configured to receive the second light from the reference and direct it to the detector. 20. The system of claim 19 , wherein: the microoptics unit comprises a reference optic in the array of microlenses; and the reference optic is configured to receive the second light and direct the second light to the plurality of detector pixels.

Assignees

Inventors

Classifications

  • Correcting variations in front distance · CPC title

  • Pre-test of apparatus, e.g. dark test, sensor test · CPC title

  • Polarisation-affecting properties (G01N21/19 takes precedence) · CPC title

  • G01J3/42Primary

    Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08) · CPC title

  • within a body or fluid · CPC title

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What does patent US12085500B2 cover?
This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing o…
Who is the assignee on this patent?
Apple Inc
What technology area does this patent fall under?
Primary CPC classification G01J3/42. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 10 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).