Voxel-based electromagnetic-aware integrated circuit routing

Patent metadata

Field	Value
Publication number	US-12067339-B2
Application number	US-202217570019-A
Country	US
Kind code	B2
Filing date	Jan 6, 2022
Priority date	Jan 6, 2022
Publication date	Aug 20, 2024
Grant date	Aug 20, 2024

Abstract

A computer-implemented method for integrated circuit routing is described. The computer-implemented method comprising receiving a description of interconnected terminals of an integrated circuit with a wiring route electrically coupling the interconnected terminals and configuring a simulated environment defined via a plurality of voxels based on the description. The individual voxels included in the plurality of voxels each correspond to a spatial representation for a corresponding region of a layout associated with the integrated circuit. The computer-implemented method further includes determining local contributions of the individual voxels to a characteristic metric of the integrated circuit based on an electromagnetic simulation of the integrated circuit and revising the wiring route based on the local contributions of the individual voxels.

First claim

What is claimed is:

1. A computer-implemented method for integrated circuit routing, the computer-implemented method comprising:
receiving a description of interconnected terminals of an integrated circuit, the description including a wiring route electrically coupling the interconnected terminals;
configuring a simulated environment defined via a plurality of voxels based on the description, and wherein individual voxels included in the plurality of voxels each correspond to a spatial representation for a corresponding region of a layout associated with the integrated circuit;
determining local contributions of the individual voxels to a characteristic metric of the integrated circuit based on an electromagnetic simulation of the integrated circuit;
revising the wiring route based on the local contributions of the individual voxels.

2. The computer-implemented method of claim 1 , wherein the characteristic metric is representative of at least one of a resistance, a capacitance, an admittance, an admittance density, an impedance, or an RC time constant associated with the integrated circuit.

3. The computer-implemented method of claim 2 , wherein the characteristic metric is further representative of a manufacturing constraint associated with a fabricability of the wiring route.

4. The computer-implemented method of claim 1 , wherein the individual voxels each include a material parameter indicative of a material property of the corresponding region, and wherein the local contributions are calculated, at least in part, based on the material parameter of the individual voxels.

5. The computer-implemented method of claim 4 , wherein the electromagnetic simulation is based on the material parameter of the individual voxels and a bias signal applied to the interconnected terminals.

6. The computer-implemented method of claim 4 , wherein the material parameter is associated with at least one of conductivity or relative permittivity.

7. The computer-implemented method of claim 4 , further comprising:
applying a penalty to the individual voxels to adjust the characteristic metric, wherein the penalty influences the material parameter of the individual voxels such that the local contributions determined via the electromagnetic simulation are affected by the penalty; and
determining recalculated local contributions of the individual voxels to the characteristic metric with the material parameter of the individual voxels affected by the penalty, and wherein the wiring route is revised based on the recalculated local contributions.

8. The computer-implemented method of claim 1 , wherein the spatial representation provided by the plurality of voxels is three-dimensional, and wherein the plurality of voxels includes a first voxel with a first volume and a second voxel with a second volume different than the first volume.

9. The computer-implemented method of claim 1 , further comprising determining the characteristic metric based, at least in part, on the electromagnetic simulation.

10. A computer-implemented method for generating integrated circuit layouts, the computer-implemented method comprising:
receiving a description of an integrated circuit, the description providing interconnections between individual terminals included in a plurality of terminals associated with the integrated circuit;
separating the plurality of terminals into different nets based on the interconnections;
configuring instances of a simulated environment collectively representative of a layout associated with the integrated circuit, wherein the simulated environment is spatially discretized via a plurality of voxels, wherein individual voxels included in the plurality of voxels correspond to respective regions of the layout, and wherein each instance included in the instances of the simulated environment is representative of a corresponding one of the different nets;
determining local contributions of the individual voxels to a characteristic metric of the integrated circuit for the instances of the simulated environment based on an electromagnetic simulation of the integrated circuit; and
generating wiring routes for the different nets based on the local contributions of the individual voxels.

11. The computer-implement method of claim 10 , wherein the characteristic metric is representative of at least one of a resistance, a capacitance, an admittance, an admittance density, an impedance, or an RC time constant associated with the integrated circuit.

12. The computer-implemented method of claim 10 , wherein the individual voxels each include a material parameter indicative of a material property of the corresponding region, and wherein the local contributions are calculated, at least in part, based on the material parameter of the individual voxels.

13. The computer-implemented method of claim 12 , further comprising:
applying a penalty to the individual voxels to adjust the characteristic metric, wherein the penalty influences the material parameter of the individual voxels such that the local contributions determined via the electromagnetic simulation are affected by the penalty.

14. The computer-implemented method of claim 13 , further comprising:
determining recalculated local contributions of the individual voxels to the characteristic metric with the material parameter of the individual voxels affected by the penalty; and
revising the wiring routes based on the recalculated local contributions.

15. The computer-implemented method of claim 14 , further comprising:
determining a convergence metric indicative of a presence of routing conflicts between different nets based on the wiring routes; and
converging the wiring routes into a finalized layout of the integrated circuit when the convergence metric is below a convergence threshold.

16. The computer-implemented method of claim 15 , further comprising:
updating the penalty when the convergence metric is greater than the convergence threshold, wherein updating the penalty includes:
identifying incompatible regions of the layout corresponding to where conductivity collisions across different instances included in the instances of the simulated environment occur between spatially overlapping voxels included in the plurality of voxels; and
revising the penalty applied to corresponding voxels associated with the incompatible regions.

17. The computer-implemented method of claim 14 , further comprising:
determining whether the wiring routes are fabricable, and wherein the characteristic metric is representative of a manufacturing constraint associated with a fabricability of the wiring routes;
identifying one or more unfabricable voxels associated with the wiring routes; and
revising the penalty applied to the unfabricable voxels.

18. The computer-implemented method of claim 17 , wherein the determining whether the wiring routes are fabricable includes performing a process simulation to generate a fabrication maskset representative of the wiring routes.

19. The computer-implemented method of claim 12 , wherein the material parameter is associated with at least one of conductivity or relative permittivity.

20. The computer-implemented method of claim 10 , wherein the electromagnetic simulation is based on the material parameter of the individual voxels and a bias signal applied to the plurality of terminals.

21. The computer-implemented method of claim 10 , wherein each instance included in the plurality of instances of the simulated environment is represen

Assignees

• X Dev Llc

Inventors

• Apte Raj
• Pan Zhigang
• Ruic Dino
• Behroozi Cyrus

Classifications

• G06F30/392

  Floor-planning or layout, e.g. partitioning or placement · CPC title

• G06F2119/18

  Manufacturability analysis or optimisation for manufacturability · CPC title

• G06F30/398

  Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] (optical proximity correction [OPC] design processes G03F1/36) · CPC title

• G06F30/394 Primary

  Routing (G06F30/396 takes precedence) · CPC title