Designing method of semiconductor integrated circuit device, semiconductor integrated circuit device, and non-transitory computer-readable recording medium
US-2023299070-A1 · Sep 21, 2023 · US
US12002720B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12002720-B2 |
| Application number | US-202017101888-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 23, 2020 |
| Priority date | Nov 23, 2020 |
| Publication date | Jun 4, 2024 |
| Grant date | Jun 4, 2024 |
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A process includes measuring at least one component parameter of a plurality of components with a testing device; and arranging at least a portion of the plurality of components in a sequential order based on the at least one component parameter with an implementation system in at least one of the following: a shipping format and a device implementation of the portion of the plurality of components. A system is disclosed as well.
Opening claim text (preview).
What is claimed is: 1. A power module, comprising: at least one electrically conductive power substrate; a housing arranged on the at least one electrically conductive power substrate; and a plurality of power devices arranged on and connected to the at least one electrically conductive power substrate, wherein each of the plurality of power devices are arranged in a sequential order based on at least one component parameter such that a variation of the at least one component parameter between adjacent pairs of the power devices in the sequential order is minimized; wherein the plurality of power devices are configured as an array of paralleled devices on the at least one electrically conductive power substrate; wherein the plurality of power devices comprise at least one of the following: a MEtal Semiconductor Field-Effect Transistor (MESFET), a Metal Oxide Field Effect Transistor (MOSFET), a Junction Field Effect Transistor (JFET), a Bipolar Junction Transistor (BJT), an Insulated Gate Bipolar Transistor (IGBT), a static induction transistor (SiT), a High-Electron-Mobility Transistor (HEMT), a metal insulator semiconductor FET (MISFET), a Thyristor, a Gate Turn-Off Thyristor (GTO), an Integrated Gate-Commutated Thyristor (IGCT), and/or a diode: wherein the sequential order of the plurality of power devices comprises at least one of the following: an Ascending-Descending Sequencing (ADS) where the plurality of power devices are sequenced from a low value of the at least one component parameter to a high value of the at least one component parameter or a high value of the at least one component parameter to a low value of the at least one component parameter, a Half-Sine Sequencing (HSS) where the plurality of power devices are sequenced to start and end with a low value of the at least one component parameter, a Half-Sine Sequencing (HSS) where the plurality of power devices are sequenced to start and end with a high value of the at least one component parameter, and a Full-Sine Sequencing (FSS) where the plurality of power devices are sequenced to start and end with a median value of the at least one component parameter; and wherein the at least one component parameter comprises at least one of the following for each of the plurality of power devices: a threshold voltage, an on-state resistance, a static conduction characteristic, a dynamic switching characteristic, a drain current magnitude, a transconductance, a gate threshold voltage, a gate-source leakage current, a drain-source leakage current, a drain-source on-state resistance, a total gate charge, a gate-source charge, a gate-drain charge, an input capacitance, a reverse transfer capacitance, a gate resistance, a turn-on delay time, a turn-on rise time, a turn-off delay time, a turn-off fall time, a forward voltage, a reverse recovery time, a reverse recovery charge, a turn-on drain current, a drain-source current, a gate-source voltage, a transfer function, a drain-source voltage, a pulsed drain current, a DC body diode forward current, a pulsed body diode current, a max transient voltage, a turn-off gate voltage, a power dissipation, a virtual function temperature, a body diode thermal resistance, a thermal resistance, a body diode forward voltage, a gate-source threshold voltage, a zero-gate voltage drain current, an internal gate resistance, an output capacitance, a reverse capacitance, a stored energy, a rise time, a fall time, a turn-on energy, a turn-off energy, a total switching energy, a diode reverse recovery charge, a diode peak reverse recovery current, a resistance, a capacitance, resonant points, an inductance, transfer data, parametric data, data characterizing static losses, a device transfer curve, a transfer function, data representative of an independent scalar input versus a dependent scalar output, time domain waveforms, and/or data characterizing dynamic losses. 2. The power module of claim 1 , wherein the plurality of power devices comprise power semiconductor devices that comprise at least one of the following: Silicon Carbide (SiC) MOSFETs, Silicon Carbide (SiC) JFETs, Silicon Carbide (SiC) IGBTs, Silicon Carbide (SiC) Schottky Diodes, and Gallium Nitride (GaN) HEMTs. 3. The power module of claim 1 , wherein the plurality of power devices comprise wide band gap power semiconductor devices that comprise at least one of the following: Silicon Carbide (SiC) MOSFETs, Silicon Carbide (SiC) JFETs, Silicon Carbide (SiC) IGBTs, Silicon Carbide (SiC) Schottky Diodes, and Gallium Nitride (GaN) HEMTs. 4. The power module of claim 1 , wherein the plurality of power devices comprise devices fabricated from wide bandgap materials that comprise at least one of the following: Gallium Nitride (GaN) and Silicon Carbide (SiC). 5. The power module of claim 1 , further comprising: a first terminal electrically connected to the at least one electrically conductive power substrate; a second terminal; a third terminal electrically connected to the at least one electrically conductive power substrate; and a base plate. 6. The power module of claim 1 , wherein the sequential order of the plurality of power devices comprises the Ascending-Descending Sequencing (ADS) where the plurality of power devices are sequenced from a low value of the at least one component parameter to a high value of the at least one component parameter or a high value of the at least one component parameter to a low value of the at least one component parameter. 7. The power module of claim 1 , wherein the sequential order of the plurality of power devices comprises the Half-Sine Sequencing (HSS) where the plurality of power devices are sequenced to start and end with a low value of the at least one component parameter. 8. The power module of claim 1 , wherein the sequential order of the plurality of power devices comprises the Half-Sine Sequencing (HSS) where the plurality of power devices are sequenced to start and end with a high value of the at least one component parameter. 9. The power module of claim 1 , wherein the sequential order of the plurality of power devices comprises the Full-Sine Sequencing (FSS) where the plurality of power devices are sequenced to start and end with a median value of the at least one component parameter. 10. A system comprising a plurality of the power modules according to claim 1 , wherein: each of the plurality of the power modules comprise a subset of the plurality of power devices that are arranged in a sequential order based on at least one component parameter such that the sequential order of the plurality of power devices ensures that a variation of the at least one component parameter between adjacent pairs of the power devices in the sequential order is minimized; and a variation of the at least one component parameter between the plurality of the power modules is minimized. 11. The power module of claim 1 , wherein the plurality of power devices comprise at least three power devices. 12. The power module of claim 11 , wherein the at least one component parameter comprises a plurality of the at least one component parameter for each of the plurality of power devices. 13. A power module, comprising: at least one power substrate; a housing arranged on the at least one power substrate; and a plurality of power devices arranged on to the at least one power substrate, wherein each of the plurality of power devices are arranged in a sequential order based on at least one component parameter such that a variation of the at least one component parameter between adjacent pairs of the power devices in the sequential order is minimized; wherein the plurality of power devices
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