Compositions and methods for making silicon containing films
US-2015014823-A1 · Jan 15, 2015 · US
US11996289B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11996289-B2 |
| Application number | US-202117141360-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 5, 2021 |
| Priority date | Apr 16, 2020 |
| Publication date | May 28, 2024 |
| Grant date | May 28, 2024 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Methods and systems for forming structures including one or more layers comprising silicon germanium and one or more layers comprising silicon are disclosed. Exemplary methods can include using a surfactant, using particular precursors, and/or using a transition step to improve an interface between adjacent layers comprising silicon germanium and comprising silicon.
Opening claim text (preview).
What is claimed is: 1. A method of forming a structure, the method comprising the steps of: providing a substrate within a reaction chamber; forming a first layer comprising silicon and germanium overlying a surface of the substrate; and forming a second layer comprising silicon overlying the first layer, wherein the step of forming the first layer comprises providing a surfactant precursor to the reaction chamber only during the last twenty-five percent of the step of forming the first layer, and wherein the second layer consists essentially of silicon and is in direct contact with the first layer. 2. The method of claim 1 , wherein the surfactant precursor comprises one or more of gallium, tellurium, antimony, indium, tin, and aluminum. 3. The method of claim 1 , wherein the surfactant precursor comprises a halogen. 4. The method of claim 3 , wherein the surfactant precursor comprises a chloride, bromide, or iodine. 5. The method of claim 1 , wherein the surfactant precursor is selected from one or more of the group consisting of GaCl 3 , SnCl 4 , SbCl 3 , AlCl 3 , and InCl 3 . 6. The method of claim 1 , wherein an etchant is provided during the step of forming the first layer. 7. The method of claim 1 , wherein the step of forming the first layer comprises flowing two or more silicon precursors.
Nanowires · CPC title
P-type · CPC title
N-type · CPC title
Silicon, silicon germanium or germanium · CPC title
Alternating layers, e.g. superlattice · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.