NEUTRAL pH COPPER PLATING SOLUTION FOR UNDERCUT REDUCTION
US-2020248329-A1 · Aug 6, 2020 · US
US11984418B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11984418-B2 |
| Application number | US-202217884284-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 9, 2022 |
| Priority date | Dec 19, 2019 |
| Publication date | May 14, 2024 |
| Grant date | May 14, 2024 |
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Official abstract text for this publication.
A method for manufacturing a package includes positioning a copper layer above a die. A zinc layer is positioned on the copper layer. The zinc and copper layers are then heated to produce a brass layer, the brass layer abutting the copper layer. Further, a polymer layer is positioned abutting the brass layer.
Opening claim text (preview).
What is claimed is: 1. A method for manufacturing a package, comprising: positioning a copper layer above a die; positioning a zinc layer on the copper layer; heating the zinc and copper layers to produce a brass layer, the brass layer abutting the copper layer; and positioning a polymer layer abutting the brass layer. 2. The method of claim 1 , wherein positioning the zinc layer on the copper layer comprises using physical vapor deposition to deposit the zinc layer on the copper layer. 3. The method of claim 1 , wherein positioning the zinc layer on the copper layer comprises using an immersion technique to deposit the zinc layer on the copper layer. 4. The method of claim 1 , wherein heating the zinc and copper layers includes heating at a temperature ranging from 100 degrees Celsius to 900 degrees Celsius. 5. The method of claim 1 further comprising etching areas of the zinc layer not abutting the copper layer. 6. The method of claim 1 further comprising patterning the polymer layer to create an orifice that exposes a portion of the brass layer. 7. The method of claim 6 further comprising dropping a solder ball in the orifice abutting the polymer layer and the brass layer, the solder ball electrically connected to the die. 8. The method of claim 6 further comprising plating over the orifice to create an under bump metallization layer and then dropping a solder ball on the under bump metallization layer. 9. The method of claim 1 , wherein prior to positioning a copper layer above a die, depositing a seed layer comprising a titanium/titanium-tungsten layer on the die. 10. The method of claim 9 , wherein the titanium/titanium-tungsten layer has a thickness ranging from 500 A to 5000 A. 11. The method of claim 1 , wherein the copper layer has a thickness ranging from 2 microns to 30 microns. 12. The method of claim 1 , wherein the brass layer has a thickness ranging from 0.05 microns to 2 microns. 13. The method of claim 1 , wherein the polymer layer has a thickness ranging from 3 microns to 35 microns.
Chemical or physical modification, e.g. by sintering or anodisation (patterning H10W72/01951) · CPC title
in gaseous form, e.g. by CVD or PVD · CPC title
by plating, e.g. electroless plating or electroplating · CPC title
Thermally treating (reflowing H10W72/01257) · CPC title
in gaseous form, e.g. by CVD or PVD · CPC title
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