Closing block family based on soft and hard closure criteria

Patent metadata

Field	Value
Publication number	US-11940892-B2
Application number	US-202217868008-A
Country	US
Kind code	B2
Filing date	Jul 19, 2022
Priority date	Dec 19, 2019
Publication date	Mar 26, 2024
Grant date	Mar 26, 2024

Abstract

A system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is to perform operations, including initializing a block family associated with the memory device; aggregating temperature values received from one or more temperature sensors of the memory device over time to determine an aggregate temperature; responsive to beginning to program a block residing on the memory device, associating the block with the block family; and in response to the aggregate temperature being greater than or equal to a specified threshold temperature value: performing a soft closure of the block family; initializing an extension timer; continuing to program data to the block; and performing a hard closure of the block family in response to one of the extension timer reaching an extension time value or the block family satisfying a hard closure criteria.

First claim

What is claimed is:

1. A system comprising:
a memory device including temperature sensors; and
a processing device, operatively coupled to the memory device, the processing device to perform operations, comprising:
initializing a block family associated with the memory device;
aggregating a plurality of temperature values received from one or more of the temperature sensors of the memory device over time to determine an aggregate temperature;
responsive to beginning to program a block residing on the memory device, associating the block with the block family; and
in response to the aggregate temperature being greater than or equal to a specified threshold temperature value:
performing a soft closure of the block family;
initializing an extension timer;
continuing to program data to the block; and
performing a hard closure of the block family in response to one of the extension timer reaching an extension time value or the block family satisfying a hard closure criteria.

2. The system of claim 1 , wherein the operations further comprise:
measuring an opening temperature of the memory device at initialization of the block family; and
wherein aggregating comprises determining a temperature metric value by integrating, over time, an absolute temperature difference between the opening temperature and an immediate temperature of the memory device.

3. The system of claim 1 , wherein the operations further comprise setting the extension time value based on at least one of a workload of the processing device, an immediate reference temperature for the block family, or a performance expectation of the processing device.

4. The system of claim 1 , wherein the operations further comprise evaluating the hard closure criteria by:
determining an amount of time until filling the block completely with the data being received from a host system; and
deciding whether to finish programming the block based on the amount of time and a remainder of time left until the timer reaches the extension time value.

5. The system of claim 4 , wherein the operations further comprise, in response to deciding to not finish programming the block, one of:
leaving empty an unwritten portion of the block; or
writing dummy data to the unwritten portion of the block.

6. The system of claim 4 , wherein the operations further comprise, in response to deciding to not finish programming the block:
creating a first partition of a written portion of the block;
associating the first partition with the block family; and
creating a second partition of an unwritten portion of the block for association with a new block family.

7. The system of claim 4 , wherein, in response to deciding to finish programming the block, the operations further comprise finish programming the block with the data received from the host system before performing the hard closure of the block family.

8. The system of claim 1 , wherein the operations further comprise:
detecting a bit error rate of a previously closed block family that employed the extension time value, wherein the bit error rate is above a threshold acceptable bit error rate; and
reducing the extension time value by an amount of time calculated to reduce the bit error rate to below the threshold acceptable bit error rate.

9. The system of claim 1 , wherein the operations further comprise:
detecting a write amplification of a previously closed block family that employed the extension time value, wherein the write amplification is above a threshold acceptable write amplification; and
increasing the extension time value by an amount of time calculated to reduce the write amplification to below the threshold acceptable write amplification.

10. A method comprising:
initializing, by a processing device, a block family associated with a memory device;
aggregating a plurality of temperature values received from one or more temperature sensors of the memory device over time to determine an aggregate temperature;
responsive to beginning to program a block residing on the memory device, associating the block with the block family; and
in response to the aggregate temperature being greater than or equal to a specified threshold temperature value:
performing a soft closure of the block family;
initializing an extension timer;
continuing to program data to the block; and
performing a hard closure of the block family in response to one of the extension timer reaching an extension time value or the block family satisfying a hard closure criteria.

11. The method of claim 10 , further comprising:
measuring an opening temperature of the memory device at initialization of the block family; and
wherein aggregating comprises determining a temperature metric value by integrating, over time, an absolute temperature difference between the opening temperature and an immediate temperature of the memory device.

12. The method of claim 10 , further comprising setting the extension time value based on at least one of a workload of the processing device, an immediate reference temperature for the block family, or a performance expectation of the processing device.

13. The method of claim 10 , further comprising evaluating the hard closure criteria by:
determining an amount of time until filling the block completely with data being received from a host system; and
deciding whether to finish programming the block based on the amount of time and a remainder of time left until the extension timer reaches the extension time value.

14. The method of claim 13 , further comprising, in response to deciding to not finish programming the block, one of:
leaving empty an unwritten portion of the block; or
writing dummy data to the unwritten portion of the block.

15. The method of claim 13 , further comprising, in response to deciding to not finish programming the block:
creating a first partition of a written portion of the block;
associating the first partition with the block family; and
creating a second partition of an unwritten portion of the block for association with a new block family.

16. The method of claim 13 , further comprising, in response to deciding to finish programming the block, finish programming the block with the data received from the host system before performing the hard closure of the block family.

17. The method of claim 10 , further comprising:
detecting a bit error rate of a previously closed block family that employed the extension time value, wherein the bit error rate is above a threshold acceptable bit error rate; and
reducing the extension time value by an amount of time calculated to reduce the bit error rate to below the threshold acceptable bit error rate.

18. The method of claim 10 , further comprising:
detecting a write amplification of a previously closed block family that employed the extension time value, wherein the write amplification is above a threshold acceptable write amplification; and
increasing the extension time value by an amount of time calculated to reduce the write amplification to below the threshold acceptable write amplification.

19. A non-transitory computer-readable storage medium that stores instructions, which when executed by a processing device of a memory device, cause the processing device to perform operations comprising:
initializing a block family associated with the memory device;
aggregating a plurality of temperature values received from one or more temperature sensors of the memory device over time to determine an aggregate temperature;
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Assignees

• Micron Technology Inc

Inventors

• Sheperek Michael
• Koudele Larry J
• Williams Steven S

Classifications

• G06F11/3037 Primary

  where the computing system component is a memory, e.g. virtual memory, cache (accessing, addressing or allocating within memory systems or architectures G06F12/00; checking stores for correct operation G11C29/00) · CPC title

• G06F3/0619

  in relation to data integrity, e.g. data losses, bit errors · CPC title

• G06F3/064 Primary

  Management of blocks · CPC title

• G06F3/0679

  Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP] · CPC title

• G06F11/0757

  by exceeding a time limit, i.e. time-out, e.g. watchdogs · CPC title