Mask protective module, pellicle having the same, and lithography apparatus having the same

US11940726B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11940726-B2
Application numberUS-202217851580-A
CountryUS
Kind codeB2
Filing dateJun 28, 2022
Priority dateSep 12, 2016
Publication dateMar 26, 2024
Grant dateMar 26, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A lithography apparatus comprises a light source for emitting light; a mask mounting zone where a mask for reflecting the light is disposed; and a mask protective module disposed on the mask to transmit the light from the light source toward the mask. The mask protective module comprises a frame and a membrane supported by the frame, wherein the membrane includes a penetration region for transmitting the light and a peripheral region of which a light transmittance is lower than that of the penetration region.

First claim

Opening claim text (preview).

What is claimed is: 1. A lithography apparatus comprising: a light source for emitting light; a mask mounting zone where a mask for reflecting the light is disposed; and a mask protective module disposed on the mask to transmit the light from the light source toward the mask, and a penetration region replacing device, wherein the penetration region replacing device comprises: a rod; and a penetration region mounting unit connected to an end of the rod and configured to turn on the rod as an axis, wherein the penetration region mounting unit comprises a plurality of penetration region modules providing a penetration region of a membrane and turns to provide a new penetration region module not used on the mask protective module, wherein the mask protective module comprises, a frame; and the membrane supported by the frame, wherein the membrane includes the penetration region for transmitting the light and a peripheral region of which a light transmittance is lower than that of the penetration region. 2. The lithography apparatus of claim 1 , wherein the light comprises extreme ultraviolet light. 3. The lithography apparatus of claim 1 , wherein the peripheral region surrounds the penetration region, and wherein mechanical strength or heat conductivity of the peripheral region is higher than that of the penetration region. 4. The lithography apparatus of claim 1 , wherein the penetration region comprises a first penetration region and a second penetration region which are spaced apart from each other, and the peripheral region surrounds the first and second penetration regions.

Assignees

Inventors

Classifications

  • Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography · CPC title

  • G03F1/66Primary

    Containers specially adapted for masks, mask blanks or pellicles; Preparation thereof · CPC title

  • Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof · CPC title

  • G03F1/62Primary

    Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof · CPC title

  • Exposure; Apparatus therefor (photographic printing apparatus for making copies G03B27/00) · CPC title

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What does patent US11940726B2 cover?
A lithography apparatus comprises a light source for emitting light; a mask mounting zone where a mask for reflecting the light is disposed; and a mask protective module disposed on the mask to transmit the light from the light source toward the mask. The mask protective module comprises a frame and a membrane supported by the frame, wherein the membrane includes a penetration region for transm…
Who is the assignee on this patent?
Univ Hanyang Ind Univ Coop Found
What technology area does this patent fall under?
Primary CPC classification G03F1/66. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 26 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).