Method and device for illuminating a sample plane

Patent metadata

Field	Value
Publication number	US-11933956-B2
Application number	US-202017247210-A
Country	US
Kind code	B2
Filing date	Dec 3, 2020
Priority date	Dec 4, 2019
Publication date	Mar 19, 2024
Grant date	Mar 19, 2024

Abstract

An illumination apparatus for illuminating a sample plane and a sample that is optionally arranged therein along an illumination beam path includes: a first light source (for outputting light of at least one first wavelength (λphoto), a second light source for outputting light of at least one second wavelength (λexc), and a diffraction grating in the illumination beam path between the first and second light sources and the sample plane. Light of the first wavelength (λphoto) is not diffracted by the diffraction grating, and light of the second wavelength (λexc) is diffracted due to the effect of the diffraction grating. The illumination apparatus can be used in a microscope.

First claim

The invention claimed is:

1. An illumination apparatus for illuminating a sample plane and a sample that is arranged therein along an illumination beam path, the apparatus comprising:
a first light source configured for outputting light of at least one first wavelength (λ.sub.photo);
a second light source configured for outputting light of at least one second wavelength (λ.sub.exc); and
a diffraction grating disposed in the illumination beam path between the first and second light sources and the sample plane,
wherein light of the first wavelength (λ.sub.photo) is not diffracted by the diffraction grating and light of the second wavelength (λ.sub.exc) is diffracted due to the diffraction grating.

2. The illumination apparatus according to claim 1 , wherein the diffraction grating is configured to generate a predetermined illumination pattern of the light of the second wavelength (λ exc ) in the sample plane.

3. The illumination apparatus according to claim 2 ,
wherein the light of the first wavelength (λ photo ) is selected for changing a first property of an emitter in the sample, and
wherein light of the second wavelength (λ exc ) is selected for changing a second property of the emitter.

4. The illumination apparatus according to claim 3 , wherein the light of the first wavelength (λ photo ) is selected to place the emitter into an activated state and the light of the second wavelength (λ exc ) is selected to place the emitter into an excited state.

5. The illumination apparatus according to claim 4 , wherein the emitter fluoresces in the excited state.

6. The illumination apparatus according to claim 3 , wherein the light of the first wavelength (λ photo ) is selected to place the emitter into a deexcited or bleached state.

7. A microscope comprising:
a first light source configured for outputting light of at least one first wavelength (λ.sub.photo) to illuminate a sample plane and a sample that is arranged therein along an illumination beam path;
a second light source configured for outputting light of at least one second wavelength (λ.sub.exc) to illuminate the sample plane;
a diffraction grating disposed in the illumination beam path between the first and second light sources and a sample plane, wherein light of the first wavelength (λ.sub.photo) is not diffracted by the diffraction grating and light of the second wavelength (λ.sub.exc) is diffracted due to the diffraction grating; and
a detector configured for detection of light emitted from the sample in response to the light of the at least one second wavelength that illuminates the sample plane.

8. The microscope of claim 7 , wherein the diffraction grating is configured to generate a predetermined illumination pattern of the light of the second wavelength (λ exc ) in the sample plane.

9. A method comprising: illuminating a sample plane and a sample that is arranged therein along an illumination beam path with light of a first wavelength (λ.sub.photo); illuminating the sample plane and the sample that is arranged therein along the illumination beam path with light of a second wavelength (λ.sub.exc), diffracting, with a diffraction grating in the illumination beam path, light of the second wavelength (λ.sub.exc) but not diffracting the light of the first wavelength (λ.sub.photo) with the diffraction grating.

10. The method of claim 9 , wherein diffracting, with the diffraction grating in the illumination beam path, light of the second wavelength (λ exc ) generates a predetermined illumination pattern of the light of the second wavelength (λ exc ) in the sample plane.

Assignees

• Zeiss Carl Microscopy Gmbh

Inventors

• Siebenmorgen Jörg
• Netz Ralf

Classifications

• G02B21/08 Primary

  Condensers · CPC title

• G02B21/16 Primary

  adapted for ultraviolet illumination {; Fluorescence microscopes (G02B21/0076 takes precedence)} · CPC title

• G02B27/425

  in illumination systems (mask illumination systems in photolithographic systems G03F7/70158) · CPC title

• G02B27/4294

  in multispectral systems, e.g. UV and visible · CPC title

• G02B21/06

  Means for illuminating specimens · CPC title