Imprint method, imprint apparatus, and article manufacturing method

US11833720B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11833720-B2
Application numberUS-202117239795-A
CountryUS
Kind codeB2
Filing dateApr 26, 2021
Priority dateMay 1, 2020
Publication dateDec 5, 2023
Grant dateDec 5, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

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An imprint method of molding an imprint material on a shot region of a substrate using a mold, includes aligning the shot region and the mold in a state where the imprint material and a pattern region of the mold are in contact with each other; and curing the imprint material by irradiating the imprint material with curing light after the aligning. The aligning is controlled so as to include an overlap period during which a period during which deformation light used to deform the shot region is applied to the substrate through the imprint material and a period during which polymerization light used to increase a viscosity of the imprint material is applied to the imprint material overlap each other. The polymerization light to be applied to the imprint material is controlled in accordance with the deformation light to be applied to the imprint material during the overlap period.

First claim

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What is claimed is: 1. An imprint method of molding an imprint material on a shot region of a substrate using a mold, the method comprising: aligning the shot region and the mold in a state where the imprint material and a pattern region of the mold are in contact with each other; and curing the imprint material by irradiating the imprint material with curing light after the aligning, wherein the aligning is controlled so as to include an overlap period during which a period during which deformation light used to deform the shot region is applied to the substrate through the imprint material and a period during which polymerization light used to increase a viscosity of the imprint material is applied to the imprint material overlap each other, and light amount of the polymerization light to be applied to the imprint material is controlled in accordance with light amount of the deformation light to be applied to the imprint material during the overlap period. 2. The method according to claim 1 , wherein a wavelength band of the curing light and a wavelength band of the deformation light are different from each other. 3. The method according to claim 2 , wherein in a case where both the deformation light and the polymerization light are applied to the imprint material, the viscosity of the imprint material is increased more than in a case in which only the polymerization light out of the deformation light and the polymerization light is applied to the imprint material. 4. The method according to claim 1 , further comprising: generating deformation control information used to control irradiation of the deformation light to the substrate; and generating, based on the deformation control information, polymerization control information used to control irradiation of the polymerization light to the imprint material. 5. The method according to claim 4 , wherein in the generating the polymerization control information, the polymerization control information is generated by correcting, based on the deformation control information, reference information set in advance to control the polymerization light. 6. The method according to claim 4 , wherein an illuminance of the polymerization light to be applied to the imprint material during the overlap period is based on the deformation control information. 7. The method according to claim 4 , wherein the overlap period is based on the deformation control information. 8. The method according to claim 4 , wherein in the generating the polymerization control information, the polymerization control information is generated based on a value obtained in the shot region by averaging light amounts of the deformation light to be applied to the shot region during the overlap period. 9. The method according to claim 4 , wherein the deformation control information includes information used to control at least one of an illuminance distribution, an irradiation area, and an irradiation time of the deformation light. 10. The method according to claim 4 , wherein the deformation control information is information used to control a shape of the shot region so as to make an alignment error between the shot region and the pattern region fall within a target accuracy range, and the polymerization control information is information used to control irradiation of the polymerization light such that the viscosity of the imprint material reaches a target viscosity. 11. An imprint method of molding an imprint material on a shot region of a substrate using a mold, the method comprising: aligning the shot region and the mold in a state where the imprint material and a pattern region of the mold are in contact with each other; and curing the imprint material by irradiating the imprint material with curing light after the aligning, wherein the aligning is controlled so as to include an overlap period during which a period during which deformation light used to deform the shot region is applied to the substrate through the imprint material and a period during which polymerization light used to increase a viscosity of the imprint material is applied to the imprint material overlap each other, and the polymerization light to be applied to the imprint material is controlled in accordance with the deformation light to be applied to the imprint material during the overlap period, wherein the period during which the polymerization light is applied to the imprint material includes a period after the overlap period in addition to the overlap period, and in the period after the overlap period, a first irradiator applies the polymerization light to the imprint material, and in the overlap period, a second irradiator different from the first irradiator applies the polymerization light to the imprint material. 12. The method according to claim 11 , wherein the deformation light is applied to the substrate by the second irradiator. 13. The method according to claim 11 , wherein a wavelength band of the deformation light and a wavelength band of the polymerization light in the period after the overlap period are different from each other. 14. The method according to claim 11 , wherein the curing light is applied to the imprint material by the first irradiator. 15. The method according to claim 14 , wherein the polymerization light during the overlap period is applied to the imprint material through a first passing portion of a shutter plate provided in the first irradiator, and the curing light is applied to the imprint material through a second passing portion of the shutter plate. 16. The method according to claim 12 , wherein the curing light is applied to the imprint material by the first irradiator. 17. The method according to claim 16 , wherein the polymerization light during the overlap period is applied to the imprint material through a first passing portion of a shutter plate provided in the first irradiator, and the curing light is applied to the imprint material through a second passing portion of the shutter plate. 18. An article manufacturing method comprising: forming a pattern on a substrate following an imprint method defined in claim 1 ; and processing the substrate on which the pattern has been formed in the forming, wherein an article is obtained from the substrate having undergone the processing.

Assignees

Inventors

Classifications

  • using transparant moulds · CPC title

  • Controlling heating or curing of polymers during moulding, e.g. by measuring temperatures or properties of the polymer and regulating the process (controlling or regulating chemical, physical or physico- chemical processes in general B01J19/0006) · CPC title

  • by mechanical means, e.g. pressing {(B29C59/007 takes precedence; embossing expanded porous articles B29C44/5627)} · CPC title

  • by wave energy or particle radiation {, e.g. infrared heating (B29C59/007 takes precedence)} · CPC title

  • G03F7/0002Primary

    Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping · CPC title

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What does patent US11833720B2 cover?
An imprint method of molding an imprint material on a shot region of a substrate using a mold, includes aligning the shot region and the mold in a state where the imprint material and a pattern region of the mold are in contact with each other; and curing the imprint material by irradiating the imprint material with curing light after the aligning. The aligning is controlled so as to include an…
Who is the assignee on this patent?
Canon Kk
What technology area does this patent fall under?
Primary CPC classification B29C35/0888. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Dec 05 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).