Optical configuration for measurement device using emitter material configuration with quadrant photodetectors
US-10006757-B1 · Jun 26, 2018 · US
US11740064B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11740064-B2 |
| Application number | US-202117527655-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 16, 2021 |
| Priority date | Nov 1, 2018 |
| Publication date | Aug 29, 2023 |
| Grant date | Aug 29, 2023 |
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An inductive position detection configuration for stylus position measurement in a scanning probe comprises a stylus position detection portion arranged along a central axis in the probe. The stylus position detection portion includes a field generating coil configuration and top and bottom axial and rotary sensing coil configurations. The field generating coil configuration generates a changing magnetic flux, and coil signals indicate conductive disruptor element and/or stylus positions. A field generating coil coupling and crosstalk reducing configuration couples signal processing and control circuitry to the field generating coil configuration to provide a coil drive signal, and is configured to reduce crosstalk that would otherwise occur if the field generating coil configuration were directly connected to the signal processing and control circuitry without the field generating coil coupling and crosstalk reducing configuration.
Opening claim text (preview).
The invention claimed is: 1. A scanning probe for a coordinate measuring machine, the scanning probe comprising: a stylus suspension portion that is coupled to a frame of the scanning probe, comprising: a stylus coupling portion that is configured to be rigidly coupled to a stylus; and a stylus motion mechanism that is configured to enable axial motion of the stylus coupling portion along an axial direction, and rotary motion of the stylus coupling portion about a rotation center; and a stylus position detection portion arranged along a central axis that is parallel to the axial direction and nominally aligned with the rotation center, comprising: a field generating coil configuration comprising at least one field generating coil; a top axial sensing coil configuration comprising at least one top axial sensing coil; a bottom axial sensing coil configuration comprising at least one bottom axial sensing coil; and N top rotary sensing coils and N bottom rotary sensing coils, where N is an integer greater than 3; a disruptor configuration comprising a conductive disruptor element that provides a disruptor area, wherein the disruptor element is located along the central axis in a disruptor motion volume and the disruptor element is coupled to the stylus suspension portion by a coupling configuration, wherein the disruptor element moves in the disruptor motion volume relative to an undeflected position in response to a deflection of the stylus suspension portion, the disruptor element moving over operating motion ranges+/−Rz along the axial direction in response to the axial motion, and over respective operating motion ranges+/−Rx and +/−Ry along orthogonal X and Y directions that are orthogonal to the axial direction in response to the rotary motion, the field generating coil configuration generating a changing magnetic flux generally along the axial direction in the disruptor motion volume in response to a coil drive signal; signal processing and control circuitry that is operably connected to the coils of the stylus position detection portion to provide the coil drive signal and configured to input signals comprising respective signal components provided by the respective rotary and axial sensing coils, and output signals indicative of an axial position and a rotary position of at least one of the disruptor element or the stylus relative to the frame of the scanning probe; and a field generating coil coupling and crosstalk reducing configuration that couples the signal processing and control circuitry to the at least one field generating coil to provide the coil drive signal and that is configured to reduce crosstalk that would otherwise occur if the at least one field generating coil were directly connected to the signal processing and control circuitry without the field generating coil coupling and crosstalk reducing configuration. 2. The scanning probe of claim 1 , wherein the field generating coil coupling and crosstalk reducing configuration comprises a first upper branch and a first lower branch. 3. The scanning probe of claim 2 , wherein the at least one field generating coil comprises a first field generating coil that defines a first field generating coil plane that is orthogonal to the central axis and passes through the first field generating coil, for which the first upper branch and the first lower branch of the field generating coil coupling and crosstalk reducing configuration are located above and below the first field generating coil plane, respectively. 4. The scanning probe of claim 3 , wherein the first upper branch and the first lower branch are at least one of: symmetric about the first field generating coil plane; parts of a mirrored current distribution configuration; configured to carry similar currents at approximately equal distances and at similar relative X and Y coordinate locations above and below, respectively, the first field generating coil plane; or connected in parallel. 5. The scanning probe of claim 3 , wherein the first upper branch comprises a first upper capacitor and the first lower branch comprises a first lower capacitor for which the first upper capacitor and the first lower capacitor are connected in parallel. 6. The scanning probe of claim 3 , wherein the at least one field generating coil comprises a second field generating coil that defines a second field generating coil plane that is orthogonal to the central axis and passes through the second field generating coil, for which the first and second field generating coils correspond to top and bottom field generating coils, respectively, and the field generating coil coupling and crosstalk reducing configuration comprises a second upper branch and a second lower branch that are located above and below the second field generating coil plane, respectively. 7. The scanning probe of claim 6 , wherein: the first upper branch comprises a first upper capacitor and the first lower branch comprises a first lower capacitor for which the first upper capacitor and the first lower capacitor are connected in parallel; and the second upper branch comprises a second upper capacitor and the second lower branch comprises a second lower capacitor for which the second upper capacitor and the second lower capacitor are connected in parallel. 8. The scanning probe of claim 1 , wherein the field generating coil coupling and crosstalk reducing configuration comprises a mirrored current distribution configuration. 9. The scanning probe of claim 8 , wherein the mirrored current distribution configuration comprises a pair of capacitors connected in parallel. 10. The scanning probe of claim 8 , wherein the mirrored current distribution configuration comprises a three current branch configuration which comprises a middle current branch with current flow in a first direction, and upper and lower current branches that are each coupled to the middle current branch and have a current flow in a second direction that is approximately opposite to the first direction. 11. The scanning probe of claim 1 , wherein: the at least one field generating coil comprises a first field generating coil; and the field generating coil coupling and crosstalk reducing configuration comprises: a first conductive coupling portion comprising first conductors that couple the first field generating coil to the signal processing and control circuitry, for which a first twist configuration is provided which causes contributions of the first conductors to cancel. 12. The scanning probe of claim 1 , wherein: the at least one field generating coil comprises a first field generating coil; and the field generating coil coupling and crosstalk reducing configuration comprises: a first conductive coupling portion that couples the first field generating coil to the signal processing and control circuitry; and a first conductive shield that is positioned proximate to the first field generating coil and the first conductive coupling portion for shielding the first conductive coupling portion. 13. The scanning probe of claim 12 , wherein the field generating coil coupling and crosstalk reducing configuration further comprises a second conductive shield that is at a second location relative to the central axis and the first conductive shield is at a first location relative to the central axis for which the first and second locations are symmetric about the central axis. 14. A method, comprising: moving a scanning probe along a surface of a workpiece; and generating three-dimensional position information based on inductive sensing signals generated by the scanning probe as the scanning pro
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