Measurement device with multiplexed position signals

Patent metadata

Field	Value
Publication number	US-9791262-B2
Application number	US-201514973376-A
Country	US
Kind code	B2
Filing date	Dec 17, 2015
Priority date	Dec 17, 2015
Publication date	Oct 17, 2017
Grant date	Oct 17, 2017

Abstract

A scanning probe responsive in three axes is provided for use with a coordinate measuring machine. The scanning probe utilizes multiplexing techniques for producing X, Y and Z position signals. The X and Y position signals are indicative of a rotation of a stylus coupling portion about a rotation center, and the Z position signal is indicative of the position of the stylus coupling portion along the axial direction. The Z position signal is substantially insensitive to motion of the axial detection deflector in at least one direction that is transverse to the axial direction. The X, Y and Z position signals may be processed to determine a 3D position of a contact portion of the stylus, which may include utilizing the Z position signal in combination with known trigonometry of the scanning probe to remove axial motion cross coupling components from the X and Y position signals.

First claim

The invention claimed is:

1. A scanning probe for use with a coordinate measuring machine, the scanning probe comprising:
a stylus suspension portion, comprising:
a stylus coupling portion that is configured to be rigidly coupled to a stylus; and
a stylus motion mechanism that is configured to enable axial motion of the stylus coupling portion along an axial direction, and rotary motion of the stylus coupling portion about a rotation center; and

a stylus position detection portion, comprising:
a light source configuration comprising a controllable rotary detection light source that is configured to provide a rotary detection beam and a controllable axial detection light source that is configured to provide an axial detection beam;
a multiple-spot position detector portion;
multiplexing signal processing and control circuitry;
a rotary position detection configuration, comprising:
a rotary position detection beam path configured to receive the rotary detection beam from the controllable rotary detection light source; and
a rotary detection deflector that is located along the rotary position detection beam path and that is coupled to the stylus suspension portion and that is configured to output a variable-deflection rotary detection light beam to the multiple-spot position detector portion; and

an axial position detection configuration, comprising:
an axial detection beam path configured to receive the axial detection beam from the controllable axial detection light source; and
an axial detection deflector that is located along the axial detection beam path and that is coupled to the stylus suspension portion and that is configured to output a variable-deflection axial detection light beam to the multiple-spot position detector portion, wherein the axial detection deflector is configured to move in the axial direction in response to the axial motion, wherein the axial detection deflector is also configured to move in at least one direction transverse to the axial direction in response to the rotary motion;

wherein:
the multiple-spot position detector portion is configured to receive the variable-deflection rotary detection light beam and in response thereto to output X and Y position signals indicative of rotation of the stylus coupling portion about the rotation center, and is also configured to receive the variable-deflection axial detection light beam and in response thereto to output a Z position signal indicative of a position of the stylus coupling portion about the axial direction;
the multiplexing signal processing and control circuitry is configured to multiplex the variable-deflection rotary detection light beam and the variable-deflection axial detection light beam onto the multiple-spot position detector portion, and to provide demultiplexing to separate the X and Y position signals from the Z position signal; and
the stylus position detection portion is configured such that the Z position signal is substantially insensitive to motion of the axial detection deflector in the at least one direction that is transverse to the axial direction.

2. The scanning probe of claim 1 , wherein the multiple-spot position detector portion comprises a position photodetector that outputs the Z position signal responsive to a position along a Z detection axis of the position photodetector of an axial detection spot or line formed by the variable-deflection axial detection light beam.

3. The scanning probe of claim 2 , wherein the variable-deflection axial detection light beam is at least partially focused by the axial detection deflector to form the axial detection spot or line on the position photodetector, and motion of the axial detection deflector along a first direction transverse to the axial direction alters the axial detection spot or line without substantially altering an effective position of the axial detection spot or line on the position photodetector.

4. The scanning probe of claim 3 , wherein the axial detection deflector comprises a lens.

5. The scanning probe of claim 3 , wherein the axial position detection configuration is further configured such that:
the variable-deflection axial detection light beam is at least partially focused by the axial detection deflector to form the axial detection spot on the position photodetector;
the Z position signal is responsive to a position of the axial detection spot along the Z detection axis of the position photodetector; and
motion of the axial detection deflector along a second direction transverse to the axial direction alters a position of the axial detection spot formed on the position photodetector along a direction that is orthogonal to the Z detection axis of the position photodetector.

6. The scanning probe of claim 1 , wherein the axial detection deflector and the rotary detection deflector are rigidly coupled to one another.

7. The scanning probe of claim 1 , wherein the axial detection deflector and the rotary detection deflector are rigidly coupled to the stylus coupling portion.

8. canning probe of claim 1 , wherein the scanning probe further comprises a housing, and the light source configuration and the multiple-spot position detector portion are rigidly coupled to the housing.

9. The scanning probe of claim 8 , wherein the X and Y position signals in combination with the Z position signal enables determination of an absolute 3D position of the stylus coupling portion relative to the housing.

10. The scanning probe of claim 1 , wherein the multiple-spot position detector portion comprises a position photodetector that is configured to output the X position signal responsive to a position along a first axis of the position photodetector of a rotary detection spot formed by the variable-deflection rotary detection light beam, and that is configured to output the Y position signal responsive to a position along a second axis of the position photodetector of the rotary detection spot.

11. The scanning probe of claim 10 , wherein:
the rotary detection deflector is coupled to the stylus suspension portion to move in response to the rotary motion, and the axial detection deflector also moves in the axial direction in response to the axial motion; and
the rotary position detection configuration is nominally configured such that when there is no rotation of the stylus coupling portion about the rotation center the X and Y position signals are substantially insensitive to motion of the rotary detection deflector along the axial direction.

12. The scanning probe of claim 10 , wherein the rotary position detection configuration is configured such that the variable-deflection rotary detection light beam is at least partially focused by the rotary detection deflector to form the rotary detection spot on the position photodetector.

13. The scanning probe of claim 12 , wherein the rotary detection deflector comprises a concave mirror.

14. The scanning probe of claim 1 , wherein:
the rotary detection deflector comprises a concave mirror having an optical axis oriented along the axial direction, and is located along a portion of the rotary position detection beam path that extends along the axial direction, and the rotary motion moves the rotary detection deflector transverse to its optical axis; and
the axial detection deflector comprises a lens having an optical axis oriented transverse to the axial direction, and is located along a portion of the axial detection beam path that extends along a transverse direction, and the axial motion moves the axial detection deflector transverse to its optical axis.

15. The scanning probe of claim 14 , wh

Assignees

• Mitutoyo Corp

Inventors

• Harsila Scott Allen
• Sesko David William

Classifications

• G01B5/012

  Contact-making feeler heads therefor · CPC title

• G01B1/00

  Measuring instruments characterised by the selection of material therefor · CPC title

• G01B11/005

  coordinate measuring machines · CPC title

• G01B11/007 Primary

  feeler heads therefor · CPC title