Device and method for bonding substrates

US11697281B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11697281-B2
Application numberUS-202117341509-A
CountryUS
Kind codeB2
Filing dateJun 8, 2021
Priority dateMay 29, 2013
Publication dateJul 11, 2023
Grant dateJul 11, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for bonding a contact surface of a first substrate to a contact surface of a second substrate comprising of the steps of: positioning the first substrate on a first receiving surface of a first receiving apparatus and positioning the second substrate on a second receiving surface of a second receiving apparatus; establishing contact of the contact surfaces at a bond initiation site; and bonding the first substrate to the second substrate along a bonding wave which is travelling from the bond initiation site to the side edges of the substrates, wherein the first substrate and/or the second substrate is/are deformed for alignment of the contact surfaces.

First claim

Opening claim text (preview).

Having described the invention, the following is claimed: 1. A method for bonding a first substrate to a second substrate on respective contact surfaces of the substrates, the method comprising: accommodating the first substrate on a first mounting surface of a first mounting apparatus and the second substrate on a second mounting surface of a second mounting apparatus, the second mounting apparatus comprising an opening, the opening having a nozzle configured to deform the second substrate by applying pressure thereto for alignment of the contact surfaces; bringing the contact surface of the first substrate into contact with the contact surface of the second substrate at a bond initiation site; and bonding the first substrate to the second substrate along a bonding wave which is traveling from the bond initiation site to side edges of the substrates, wherein the first substrate and/or the second substrate is/are deformed for the alignment of the contact surfaces outside the bond initiation site before and/or during the bonding, wherein a radii of curvature of the substrates deviates only marginally from each other at least in a region at which the contact surfaces are brought into contact at a bond front of the bonding wave. 2. The method as claimed in claim 1 , wherein the radii of curvature of the substrates deviate from each other at the bond front less than 5%. 3. The method as claimed in claim 1 , wherein the radii of curvature of the substrates are the same at the bond front. 4. The method as claimed in claim 1 , wherein the deformation of the first substrate and/or the second substrate depends on given factors that influence the traveling of the bonding wave. 5. The method as claimed in claim 1 , wherein the bond initiation site is located in a center of the contact surfaces. 6. The method as claimed in claim 1 , wherein the deformation of the first substrate and/or the second substrate takes place in a lateral direction, convexly, concavely, or a combination one or more thereof. 7. The method as claimed in claim 1 , wherein the deformation of the first substrate and/or the second substrate comprises one of expansion, compression, or curving the first substrate and/or the second substrate. 8. The method as claimed in claim 1 , wherein diameters of the substrates deviate from one another by less than 5 mm. 9. The method as claimed in claim 1 , wherein the deformation comprises mechanically actuating and/or controlling a temperature of the first and/or second mounting apparatus. 10. The method as claimed in claim 1 , wherein the first substrate and/or the second substrate are fixed solely in a region of the side edges on the first and/or second mounting surfaces.

Assignees

Inventors

Classifications

  • Electricity · mapped topic

  • Positioning, e.g. registration or centering · CPC title

  • Semiconductor wafers · CPC title

  • involving the assembly of discrete sheets or panels only · CPC title

  • Electrical conductivity · CPC title

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Frequently asked questions

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What does patent US11697281B2 cover?
A method for bonding a contact surface of a first substrate to a contact surface of a second substrate comprising of the steps of: positioning the first substrate on a first receiving surface of a first receiving apparatus and positioning the second substrate on a second receiving surface of a second receiving apparatus; establishing contact of the contact surfaces at a bond initiation site; an…
Who is the assignee on this patent?
Ev Group E Thallner Gmbh
What technology area does this patent fall under?
Primary CPC classification B32B38/1833. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jul 11 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).