Terahertz device
US-2021066811-A1 · Mar 4, 2021 · US
US11626839B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11626839-B2 |
| Application number | US-202017027875-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 22, 2020 |
| Priority date | Sep 24, 2019 |
| Publication date | Apr 11, 2023 |
| Grant date | Apr 11, 2023 |
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A device, comprising: an antenna array provided with a plurality of antennas each having a semiconductor layer having terahertz-wave gain; and a coupling line for mutual frequency-locking of at least two of the antennas at a frequency of the terahertz-wave, wherein the coupling line is connected to a shunt device, and the shunt device is connected in parallel to the semiconductor layer of each of the two antennas.
Opening claim text (preview).
What is claimed is: 1. A device comprising: an antenna array provided with a plurality of antennas each having a semiconductor layer having terahertz-wave gain; and a coupling line electrically connecting at least two of the antennas at a frequency of the terahertz waves, wherein the coupling line is electrically connected to a shunt device, wherein the shunt device is electrically connected in parallel to the semiconductor layer of each of the two antennas, and wherein the terahertz waves are electromagnetic waves in a frequency region of at least 30 GHz and not more than 30 THz. 2. The device according to claim 1 , wherein the plurality of antennas are each electrically connected to a bias circuit including a power source supplying a bias signal to the semiconductor layer. 3. The device according to claim 1 , wherein, in the shunt device, a resistor and a capacitor are serially connected. 4. The device according to claim 3 , wherein the resistor and the capacitor in the shunt device are each set to an impedance lower than an impedance of the semiconductor layer in a frequency band lower than the frequency of the terahertz waves. 5. The device according to claim 1 , wherein the shunt device is configured as a resistor. 6. The device according to claim 1 , wherein the shunt device is electrically connected to a node of an electric field of the terahertz waves in the coupling line. 7. The device according to claim 1 , wherein the antenna array is formed to have the antennas in an m×n matrix form (where m≥2 and n≥2). 8. The device according to claim 1 , wherein the antennas are formed at a pitch of an integer multiple of a wavelength of the terahertz waves. 9. The device according to claim 1 , wherein the antennas are patch antennas. 10. The device according to claim 1 , wherein the semiconductor layer includes a negative resistance element. 11. The device according to claim 10 , wherein the negative resistance element is a resonant tunneling diode. 12. A manufacturing method for a device provided with an antenna array having a plurality of antennas, the method comprising: a step of forming, on a substrate, a semiconductor layer having terahertz-wave gain; a step of forming, on the substrate, a first conductor layer; a step of forming a shunt device electrically connected in parallel to a semiconductor layer of each of two antennas, and electrically connected to a coupling line for mutual frequency-locking of the plurality of antennas at the frequency of the terahertz waves; and a step of forming a third conductor layer to form the coupling line that has a structure where a first dielectric layer is sandwiched between the first conductor layer and the third conductor layer. 13. A device comprising: an antenna array provided with a plurality of antennas each having a semiconductor layer having terahertz-wave gain; and a coupling line for mutual frequency-locking of at least two of the antennas at a frequency of the terahertz waves, wherein the coupling line is electrically connected to a shunt device, wherein the shunt device is electrically connected in parallel to the semiconductor layer of each of the two antennas, and wherein each of the plurality of antennas includes: a substrate; a first conductor layer stacked on the substrate; the semiconductor layer electrically connected to the first conductor layer; a second conductor layer electrically connected to the semiconductor layer and facing the first conductor layer across the semiconductor layer; and a dielectric layer formed between the first conductor layer and the second conductor layer. 14. The device according to claim 13 , further comprising a third conductor layer, wherein the coupling line has a structure where the dielectric layer is sandwiched between the third conductor layer and the first conductor layer. 15. The device according to claim 14 , wherein the dielectric layer is a first dielectric layer, wherein the second conductor layer is formed in a layer between the third conductor layer and the first conductor layer, and wherein the second conductor layer and the third conductor layer form a capacitor by sandwiching therebetween a second dielectric layer, which differs from the first dielectric layer. 16. The device according to claim 15 , wherein each of the plurality of antennas further includes a fourth conductor layer formed in a layer between the first conductor layer and the second conductor layer, and wherein in the shunt device, a capacitor, in which a part of the first dielectric layer is sandwiched between the fourth conductor layer and the first conductor layer, and a resistor are serially connected. 17. The device according to claim 1 , wherein the shunt device includes at least a resistor. 18. The device according to claim 17 , wherein the coupling line and the resistor are made of different materials. 19. The device according to claim 1 , wherein each of the plurality of antennas comprises a terahertz-wave oscillator. 20. The device according to claim 1 , wherein the shunt device is configured to shunt to ground. 21. The device according to claim 3 , wherein a value of the resistor is typically set in the range of 0.1 to 1000 Ω, and a value of the capacitor is typically set in the range of 0.1 to 1000 pF. 22. The device according to claim 3 , wherein the capacitor is formed by a MIM capacitor structure. 23. The device according to claim 1 , wherein the shunt device includes a first resistor and a first capacitor that are serially connected, and a second resistor and a second capacitor that are serially connected. 24. The device according to claim 23 , wherein each of the first and the second capacitors is formed by a MIM capacitor structure. 25. The device according to claim 23 , wherein, in a top view, the coupling line extends along a first direction, and the first resistor and the second resistor extend along a second direction crossing the first direction.
at high-frequency [HF] or radio frequency [RF] · CPC title
the frequency being determined by a stripline resonator (H03B9/141 - H03B9/143, H03B9/148 take precedence) · CPC title
using a particular conducting material, e.g. superconductor · CPC title
being a tunnel diode · CPC title
Antennas with active circuits or circuit elements integrated within them or attached to them · CPC title
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