Multi-pass mass spectrometer with high duty cycle

Patent metadata

Field	Value
Publication number	US-11587779-B2
Application number	US-201917256258-A
Country	US
Kind code	B2
Filing date	Jun 28, 2019
Priority date	Jun 28, 2018
Publication date	Feb 21, 2023
Grant date	Feb 21, 2023

Abstract

A multi-pass time-of-flight mass spectrometer is disclosed having an elongated orthogonal accelerator ( 30 ). The orthogonal accelerator ( 30 ) has electrodes ( 31 ) that are transparent to the ions so that ions that are reflected or turned back towards it are able to pass through the orthogonal accelerator ( 30 ). The electrodes ( 31 ) of the orthogonal accelerator ( 30 ) may be pulsed from ground potential in order to avoid the reflected or turned ion packets being defocused. The spectrometer has a high duty cycle and/or space charge capacity of pulsed conversion.

First claim

The invention claimed is:

1. A time-of-flight mass analyser comprising:
at least one ion mirror or electrostatic sector for reflecting or turning ions, respectively;
an orthogonal accelerator having electrodes for receiving ions and orthogonally pulsing packets of the ions into the ion mirror or electrostatic sector such that the ions are reflected or turned, respectively, in a first dimension (x-direction) as they drift in a drift direction (z-direction); and
an ion detector;
wherein the electrodes of the orthogonal accelerator define slits or comprise meshes for allowing ions that have been reflected by the ion mirror, or turned by the electrostatic sector, to pass back into and through the orthogonal accelerator as they travel towards the detector;
wherein the time-of-flight mass analyser is configured to determine the mass to charge ratio of an ion based on its time-of-flight from the orthogonal accelerator to the ion detector.

2. The mass analyser of claim 1 , wherein either:
(i) the mass analyser is a multi-reflecting time-of-flight mass analyser having the orthogonal accelerator arranged between two ion mirrors, and arranged and configured so that the ions are reflected multiple times between the ion mirrors and pass through the orthogonal accelerator, via the slits or meshes, multiple times as the ions travel from the orthogonal accelerator to the detector; or
(ii) wherein the mass analyser is a multi-turn time-of-flight mass analyser having the orthogonal accelerator arranged between electrostatic sectors of a plurality of electrostatic sectors that turn the ions a plurality of times such that the ions pass through the orthogonal accelerator multiple times, via the slits or meshes, as they travel from the orthogonal accelerator to the detector.

3. The mass analyser of claim 1 , wherein the electrodes of the orthogonal accelerator and their slits or meshes extend in the drift direction (z-direction) from an upstream end of the orthogonal accelerator to a point proximate or downstream of the detector.

4. The mass analyser of claim 1 , wherein the electrodes of the orthogonal accelerator define said slits; and wherein at least one slit, or each slit, is provided as an aperture through an electrode of the orthogonal accelerator that is elongated in the drift direction, such that electrode material completely surrounds the perimeter of the slit; and/or
wherein at least one slit, or each slit, is defined between electrode portions that are elongated in the drift direction and spaced apart in a direction perpendicular to the first dimension and drift direction.

5. The mass analyser of claim 1 , wherein the downstream ends of the orthogonal accelerator electrodes are spaced apart from the detector, in the drift direction (z-direction); wherein the electrodes of the orthogonal accelerator define said slits; and wherein each slit is defined between elongated electrode portions that are not joined together at their downstream ends.

6. The mass analyser of claim 1 , comprising: one or more voltage supply for applying one or more voltage pulse to the electrodes of the orthogonal accelerator for performing said step of orthogonally pulsing the packets of the ions; and control circuitry configured to control the one or more voltage supply so as to only apply said one or more voltage pulse to the electrodes for orthogonally pulsing a packet of ions out of the orthogonal accelerator when ions that have previously been pulsed out of the orthogonal accelerator are not passing back through the orthogonal accelerator.

7. The mass analyser of claim 1 , wherein the orthogonal accelerator comprises an ion guide portion having electrodes arranged to receive ions, and one or more voltage supply configured to apply potentials to these electrodes for confining ions in at least one dimension (X- or Y-dimension) orthogonal to the drift direction.

8. The mass analyser of claim 1 , wherein the orthogonal accelerator comprises: an ion guide portion having electrodes arranged to receive ions travelling along a first axis (Z-direction), including a plurality of DC electrodes spaced along the first axis; and DC voltage supplies configured to apply different DC potentials to different ones of said DC electrodes such that when ions travel through the ion guide portion along the first axis they experience an ion confining force, generated by the DC potentials, in at least one dimension (X- or Y-dimension) orthogonal to the first axis.

9. The mass analyser of claim 1 , comprising focusing electrodes that are arranged and configured to control the motion of ions along the drift direction (z-direction) so as to spatially focus or compress each of the ion packets so that it is smaller, in the drift direction, at the detector than when pulsed out of the orthogonal accelerator.

10. The mass analyser of claim 9 , wherein the focusing electrodes are configured to impart ions located at different positions, in the drift direction, within the ion packet with different velocities in the drift direction so as to perform the spatial focusing or compression.

11. The mass analyser of claim 9 , wherein the focusing electrodes comprise a plurality of electrodes configured to generate an electric field region through which ions travel in use that has equipotential field lines that curve and/or diverge as a function of position along the drift direction so as to focus ions in the drift direction.

12. The mass analyser of claim 9 , wherein the focusing electrodes comprise a plurality of electrodes configured to control the velocities of the ions such that ions within the orthogonal accelerator when it is pulsed have velocities, in the drift direction, that decrease as a function of distance in the drift direction towards the detector.

13. The mass analyser of claim 12 , wherein the plurality of electrodes comprise an ion guide or ion trap upstream of the orthogonal accelerator and one or more electrodes configured to pulse ions out of the ion guide or ion trap such that the ions arrive at the orthogonal accelerator at different times and with velocities in the drift direction that increase as a function of the time at which they arrive at the orthogonal accelerator.

14. The mass analyser of claim 13 , comprising circuitry that synchronises the pulsing of ions out of the ion guide or ion trap with the pulsing of ion packets out of the orthogonal accelerator, wherein the circuitry is configured to provide a time delay between the pulsing of ions out of the ion guide or ion trap and the pulsing of ion packets out of the orthogonal accelerator, wherein the time delay is set based on a predetermined range of mass to charge ratios of interest to be mass analysed.

15. The mass analyser of claim 12 , wherein the plurality of electrodes comprise electrodes arranged within the orthogonal accelerator to generate an axial potential distribution along the drift direction that slows ions by different amounts depending on their location, in the drift direction, within the orthogonal accelerator.

16. The mass analyser of claim 1 , configured such that the length of the orthogonal accelerator from which ions are pulsed (Lz) is longer, in the drift direction, than half of the distance (Az) that the ion packet advances for each mirror reflection or sector turn in the first dimension.

17. A method of mass spectrometry comprising:
providing a mass analyser as claimed in claim 1 ;
receiving ions in said orthogonal accelerator;
pulsing ions from said orthogonal accelerator into said ion mirror or sector;
reflecting or turning the ions with the ion mir

Assignees

• Micromass Ltd

Inventors

• Verenchikov Anatoly

Classifications

• H01J49/401 Primary

  characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode · CPC title

• H01J49/405

  characterised by the reflectron, e.g. curved field, electrode shapes · CPC title

• H01J49/406

  with multiple reflections · CPC title

• H01J49/22

  Electrostatic deflection · CPC title

• H01J49/408

  with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight · CPC title