Multi-pass mass spectrometer with high duty cycle
US-11587779-B2 · Feb 21, 2023 · US
Electrostatic deflection
Electrostatic deflection · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J49/22 |
| Official title | Electrostatic deflection |
| Display label | Electrostatic deflection |
| Total patents | 68 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 11 |
| 2016 | 15 |
| 2017 | 8 |
| 2018 | 10 |
| 2019 | 2 |
| 2020 | 6 |
| 2021 | 6 |
| 2022 | 1 |
| 2023 | 2 |
| 2024 | 5 |
| 2025 | 1 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Dynamic electron impact ion source
US-11276544-B2 · Mar 15, 2022 · US
Orthogonal acceleration time-of-flight mass spectrometer and lead-in electrode for the same
US-11201046-B2 · Dec 14, 2021 · US
Dynamic Electron Impact Ion Source
US-2021257180-A1 · Aug 19, 2021 · US
Fields for multi-reflecting TOF MS
US-11049712-B2 · Jun 29, 2021 · US
Orthogonal acceleration time-of-flight mass spectrometer and lead-in electrode for the same
US-2021142999-A1 · May 13, 2021 · US
Multi-pass mass spectrometer with high duty cycle
US-2021134581-A1 · May 6, 2021 · US
Mass analyser
US-2021020421-A1 · Jan 21, 2021 · US
Dynamic electron impact ion source
US-10879030-B2 · Dec 29, 2020 · US
Mass analysis apparatus and mass analysis method
US-10763093-B2 · Sep 1, 2020 · US
Device for collecting particles contained in an aerosol, comprising electrometres to determine nanoparticle concentration and particle size
US-10675639-B2 · Jun 9, 2020 · US
Fields for multi-reflecting tof ms
US-2020168448-A1 · May 28, 2020 · US
Multiplexing method for separators
US-2020080967-A1 · Mar 12, 2020 · US
Dynamic Electron Impact Ion Source
US-2020020502-A1 · Jan 16, 2020 · US
Mass Analysis Apparatus and Mass Analysis Method
US-2019287783-A1 · Sep 19, 2019 · US
Electrodynamic mass analysis
US-10192727-B2 · Jan 29, 2019 · US
Quasi-planar multi-reflecting time-of-flight mass spectrometer
US-10141175-B2 · Nov 27, 2018 · US
Electrodynamic Mass Analysis
US-2018286653-A1 · Oct 4, 2018 · US
Ion mass separation using RF extraction
US-10068758-B2 · Sep 4, 2018 · US
Ion Mass Separation Using RF Extraction
US-2018218894-A1 · Aug 2, 2018 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J49/22?
- CPC H01J49/22 is the Cooperative Patent Classification code for “Electrostatic deflection.”
- How many patents are filed under CPC H01J49/22 (Electrostatic deflection)?
- Our database includes 68 publications tagged with this CPC code.
- Is patent activity under CPC H01J49/22 growing?
- Publication counts under this code: 5 in 2024 vs 1 in 2025 (latest complete years).