Polishing apparatus

US11224956B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11224956-B2
Application numberUS-201916374590-A
CountryUS
Kind codeB2
Filing dateApr 3, 2019
Priority dateNov 1, 2004
Publication dateJan 18, 2022
Grant dateJan 18, 2022

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A polishing apparatus has a polishing pad, a top ring for holding a semiconductor wafer, and a vertical movement mechanism operable to move the top ring in a vertical direction. The polishing apparatus also has a distance measuring sensor operable to detect a position of the top ring when a lower surface of the top ring is brought into contact with the polishing pad, and a controller operable to calculate an optimal position of the top ring to polish the semiconductor wafer based on the position detected by the distance measuring sensor. The vertical movement mechanism includes a ball screw mechanism operable to move the top ring to the optimal position.

First claim

Opening claim text (preview).

The invention claimed is: 1. A polishing apparatus comprising: a top ring body configured to press a substrate against a polishing surface; a retainer ring having a ring member configured to press the polishing surface; a retainer ring guide which is brought to into contact with a lower surface of the ring member; and a retainer ring wear detector configured to detect wear of the ring member when the retainer ring guide is in contact with the lower surface of the ring member, wherein the retainer ring guide is provided on a pusher which is configured to deliver the substrate to the top ring body, and wherein the retainer ring wear detector is provided on the pusher. 2. The polishing apparatus according to claim 1 , further comprising: a controller configured to issue a signal to indicate that the ring member should be replaced when an amount of wear of the ring member reaches a predetermined value. 3. The polishing apparatus according to claim 1 , further comprising: a controller configured to change a pressing force applied to the substrate according to an amount of wear of the ring member. 4. The polishing apparatus according to claim 1 , further comprising: a controller configured to control a pressing force applied to the ring member based on correlation data of an amount of wear of the ring member and a polishing profile of the substrate. 5. The polishing apparatus according to claim 1 , wherein a push stage operable to push the substrate on a lower surface of the top ring body is provided on the pusher and, wherein, when the retainer ring guide is brought into contact with ring member, the position of the retainer ring guide is varied according to the amount of wear of the ring member while the position of the push stage is fixed, the retainer ring wear detector is operable to measure a distance between the retainer ring guide and the push stage. 6. The polishing apparatus according to claim 1 , wherein the retainer ring guide has a recess formed at its upper end surface, and wherein, when the retainer ring guide is brought into contact with ring member, a lower portion of the ring member can be fitted into the recess. 7. A polishing apparatus comprising a top ring body configured to press a substrate against a polishing surface; a retainer ring having a ring member configured to press the polishing surface; a retainer ring wear detector configured to detect weary the ring member when in contact with the lower surface of the ring member; and a pusher configured to deliver the substrate to the top ring body, wherein the retainer ring wear detector is provided on the pusher.

Assignees

Inventors

Classifications

  • H10P52/00Primary

    Grinding, lapping or polishing of wafers, substrates or parts of devices · CPC title

  • Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (B24B33/06, B24B37/005 take precedence; if applicable to other machine tools, B23Q15/00 - B23Q17/00 take precedence) · CPC title

  • taking regard of the presence of dressing tools · CPC title

  • taking regard of the load · CPC title

  • Retaining rings · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US11224956B2 cover?
A polishing apparatus has a polishing pad, a top ring for holding a semiconductor wafer, and a vertical movement mechanism operable to move the top ring in a vertical direction. The polishing apparatus also has a distance measuring sensor operable to detect a position of the top ring when a lower surface of the top ring is brought into contact with the polishing pad, and a controller operable t…
Who is the assignee on this patent?
Ebara Corp
What technology area does this patent fall under?
Primary CPC classification H10P52/00. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jan 18 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).