X-ray imaging with a detector capable of resolving photon energy

Patent metadata

Field	Value
Publication number	US-11201000-B2
Application number	US-202016891152-A
Country	US
Kind code	B2
Filing date	Jun 3, 2020
Priority date	Aug 27, 2015
Publication date	Dec 14, 2021
Grant date	Dec 14, 2021

Abstract

The present teaching relates to methods, systems, and apparatus for X-ray imaging with a detector capable of resolving photon energy. In one example, an X-ray microscope is disclosed. The X-ray microscope comprises an X-ray source and a detector. The X-ray source is configured for irradiating X-ray to a sample. The detector is configured for: detecting X-ray photons from the irradiated X-ray, determining energy of each of the detected X-ray photons, and generating an image of the sample based on detected X-ray photons that have energies in a predetermined range.

First claim

What is claimed is:

1. An X-ray microscope, comprising:
an X-ray source configured emit X-ray;
focusing optics configured to focus the X-ray from the X-ray source into a focal point where a sample is placed; and
a detector configured to:
detect X-ray photons from the sample,
determine energy of the detected X-ray photons, and
generate an image of the sample based on the detected X-ray photons that have energies in a predetermined range;

wherein the detector comprises:
an X-ray absorption layer comprising an electrode;
a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
a second voltage comparator configured to compare the voltage to a second threshold;
a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
a controller;
wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
wherein the controller is configured to activate the second voltage comparator during the time delay;
wherein the controller is configured to cause the number registered by the counter to increase by one, when the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold.

2. The X-ray microscope of claim 1 , wherein the X-ray photons from the sample comprise X-ray photons having energies in the predetermined range and X-ray photons having energies outside the predetermined range.

3. The X-ray microscope of claim 1 , wherein the focusing optics are further configured to focus the X-ray from the X-ray source into a virtual point source before the sample.

4. The X-ray microscope of claim 1 , wherein the detector is further configured to determine a number of the detected X-ray photons that have energies in the predetermined range.

5. The X-ray microscope of claim 1 , wherein:
the detector comprises an array of pixels; and
the detector is further configured to determine a number of the detected X-ray photons that have energies in the predetermined range, for each of the pixels.

6. The X-ray microscope of claim 1 , wherein the detector is further configured to:
determine a first number of X-ray photons that are detected by the detector and have energies in a first range; and
determine a second number of X-ray photons that are detected by the detector and have energies in a second range.

7. The X-ray microscope of claim 6 , wherein the detector is further configured to generate a first image of the sample based on the first number of X-ray photons and a second image of the sample based on the second number of X-ray photons.

8. A method, comprising:
focusing X-ray into a focal point where a sample is placed;
detecting a first plurality of X-ray photons from the sample using a detector, at a first distance from the sample;
determining energy of the first plurality of X-ray photons; and
generating a first image of the sample based on the first plurality of X-ray photons that have energies in a predetermined range;
wherein the detector comprises:
an X-ray absorption layer comprising an electrode;
a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
a second voltage comparator configured to compare the voltage to a second threshold;
a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
a controller;
wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
wherein the controller is configured to activate the second voltage comparator during the time delay;

wherein the controller is configured to cause the number registered by the counter to increase by one, when the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold.

9. The method of claim 8 , wherein the first plurality of X-ray photons from the sample comprise X-ray photons having energies in the predetermined range and X-ray photons having energies outside the predetermined range.

10. The method of claim 8 , further comprising focusing the X-ray into a virtual X-ray point source before the sample.

11. The method of claim 8 , wherein generating the first image is performed by a detector comprising a plurality of pixels and generating the image further comprises:
determining a number of the first plurality of X-ray photons that have energies in the predetermined range, for each of the pixels; and
generating the image of the sample based on the number.

12. The method of claim 8 , further comprising:
determining a first number of X-ray photons that are detected and have energies in a first range; and
determining a second number of X-ray photons that are detected and have energies in a second range.

13. The method of claim 12 , further comprising generating a first image of the sample based on the first number of X-ray photons and a second image of the sample based on the second number of X-ray photons.

14. The method of claim 8 , further comprising:
detecting a second plurality of X-ray photons from the sample, at a second distance from the sample, the second distance being different from the first distance;
determining energy of the second plurality of X-ray photons; and
generating a second image of the sample based on the second plurality of X-ray photons that have energies in a predetermined range.

Assignees

• Shenzhen Xpectvision Tech Co Ltd

Inventors

• Cao Peiyan
• Liu Yurun

Classifications

• G01T1/366

  with semi-conductor detectors · CPC title

• G01N2223/423

  multispectral imaging-multiple energy imaging · CPC title

• A61B6/4241

  using energy resolving detectors, e.g. photon counting · CPC title

• G21K7/00 Primary

  Gamma- or X-ray microscopes · CPC title

• G01N23/046 Primary

  using tomography, e.g. computed tomography [CT] · CPC title