System and method of charging a buffer capacitor
US-10862472-B1 · Dec 8, 2020 · US
US11075622B1 · US · B1
| Field | Value |
|---|---|
| Publication number | US-11075622-B1 |
| Application number | US-202017112172-A |
| Country | US |
| Kind code | B1 |
| Filing date | Dec 4, 2020 |
| Priority date | Sep 10, 2020 |
| Publication date | Jul 27, 2021 |
| Grant date | Jul 27, 2021 |
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In one aspect, a gate driver circuit includes a gate driver having a first input connected to a first node and a second input connected to a second node. The gate driver circuit also includes a current source circuit that includes a first transistor and a capacitor having a top plate connected to the source of the first transistor and a bottom plate connected to ground. The gate driver circuit further includes a switch that includes a second transistor. A gate of the second transistor is connected to a drain of the first transistor and a source of the second transistor is connected to the first node.
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What is claimed is: 1. A gate driver circuit comprising: a gate driver having a first input connected to a first node and a second input connected to a second node; a current source circuit comprising: a first transistor; and a capacitor having a top plate connected to the source of the first transistor and a bottom plate connected to ground; and a switch, wherein the switch comprises a second transistor, wherein a gate of the second transistor is connected to a drain of the first transistor, and a source of the second transistor is connected to the first node. 2. The gate driver circuit of claim 1 , wherein the current source further comprises a static bias configured to provide a current to the gate of the second transistor. 3. The gate driver circuit of claim 1 , wherein the first transistor is an n-channel metal-oxide-semiconductor field-effect transistor (NMOS). 4. The gate driver circuit of claim 1 , further comprising an epi diode connected to the first node. 5. The gate driver circuit of claim 4 , wherein the gate driver is fabricated in an n-type epitaxial layer. 6. The gate driver circuit of claim 5 , wherein the epi diode comprises the n-type epitaxial layer and a p-type substrate. 7. The gate driver circuit of claim 4 , wherein the capacitor is a first capacitor, wherein the gate driver circuit is configured to be connected to a second capacitor, wherein the second capacitor has a top plate connected to a drain of the second transistor and a bottom plate connected to the second node, and, with the switch being open, the epi diode is off in response to a magnitude of negative voltages on the second node not exceeding either (1) a sum of a breakdown voltage of the first clamp and a turn-on voltage of the epi diode, or (2) a sum of a breakdown voltage of the second clamp, the turn-on voltage of the epi diode and a boot voltage of the second capacitor. 8. The gate driver circuit of claim 1 , further comprising a clamp connected to the first node and to the second node. 9. The gate driver circuit of claim 8 , wherein the clamp is a Zener-activated clamp. 10. The gate driver circuit of claim 1 , wherein the switch comprises a clamp connected to the first node and to the top plate of the second capacitor. 11. The gate driver circuit of claim 10 , wherein the switch further comprises a Zener diode having an anode connected to a gate of the second transistor and a cathode connected to the first node. 12. The gate driver circuit of claim 11 , wherein the switch further comprises a resistor having one end connected to the gate of the second transistor and the other end connected to the first node. 13. The gate driver circuit of claim 12 , wherein the second transistor is a p-channel metal-oxide-semiconductor field-effect transistor (PMOS). 14. The gate driver circuit of claim 1 , wherein an output of the gate driver is connected to an external device. 15. The gate driver circuit of claim 14 , wherein the external device is a third transistor. 16. The gate driver circuit of claim 15 , wherein the third transistor is an n-channel metal-oxide-semiconductor field-effect transistor (NMOS), wherein a gate of the NMOS is connected to the output of the gate driver, and and a source of the NMOS is connected to the second node. 17. The gate driver circuit of claim 1 , wherein the second node is connected to a load. 18. The gate driver circuit of claim 17 , wherein the load comprises a coil. 19. The gate driver circuit of claim 1 , wherein the circuit is an integrated circuit. 20. The gate driver circuit of claim 1 , the capacitor is a capacitance multiplier. 21. An integrated circuit (IC) comprising: a gate driver having a first input connected to a first node and a second input connected to a second node; a current source circuit comprising: a first transistor; a capacitor having a top plate connected to the source of the first transistor and a bottom plate connected to ground; and a static bias configured to provide a current to the gate of a second transistor; and a switch, wherein the switch comprises the second transistor, wherein a gate of the second transistor is connected to a drain of the first transistor, wherein a source of the second transistor is connected to the first node, wherein the first transistor is an n-channel metal-oxide-semiconductor field-effect transistor (NMOS), and the second transistor is a p-channel metal-oxide-semiconductor field-effect transistor (PMOS). 22. The IC of claim 21 , wherein the switch further comprises: a clamp connected to the first node and to the top plate of the second capacitor; a Zener diode having an anode connected to the gate of the second transistor and a cathode connected to the first node; and a resistor having one end connected to the gate of the second transistor and the other end connected to the first node. 23. The IC of claim 22 , wherein the second node is connected to a load, and the load comprises a coil.
in field-effect transistor switches · CPC title
in field-effect transistor switches · CPC title
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