First principles design automation tool

Patent metadata

Field	Value
Publication number	US-11068631-B2
Application number	US-201916539129-A
Country	US
Kind code	B2
Filing date	Aug 13, 2019
Priority date	Sep 26, 2013
Publication date	Jul 20, 2021
Grant date	Jul 20, 2021

Abstract

An electronic design automation tool includes an application program interface API which includes a set of parameters and procedures supporting atomistic scale modeling of electronic materials. The procedures include a procedure to execute first principles calculations, a procedure to process results from the first principles calculations to extract device scale parameters from the results, a procedure to determine whether the extracted device scale parameters lie within a specified range. The procedures also include a procedure to parameterize an input parameter of a first principles procedure, including a procedure to execute a set of DFT computations across an input parameter space to characterize sensitivity of one of the intermediate parameter and the output parameter. Also included is a procedure to execute a second set of DFT computations across a refined input parameter space. The procedures include a procedure that utilizes DFT computations to parameterize the force field computations.

First claim

The invention claimed is:

1. A system comprising:
a memory; and
a processor coupled to the memory and configured to:
produce inputs defining initial conditions of first principles calculations for a specified material of a candidate integrated circuit device;
execute sequences of first principles calculations using the produced inputs;
process results from the first principles calculations to extract device scale parameters from the results;
determine whether the device scale parameters extracted from the results lie within a specified range of stored information for the specified material; and
in response to determining that the extracted device scale parameters do not lie within the specified range, provide updated input parameters for the first principles calculations and repeat the executing and processing.

2. The system of claim 1 , wherein the producing of the inputs includes a parameterizing an input parameter of the first principles calculations, executing a set of density functional theory (DFT) computations across an input parameter space to characterize sensitivity of one of an intermediate parameter and an output parameter for the specified material across the input parameter space, and identifying regions in the input parameter space of relatively higher sensitivity and regions in the input parameter space of relatively lower sensitivity,
and wherein the executing of the sequences of the first principles calculations includes executing a second set of DFT computations across the input parameter space in which the second set includes a first subset of computations in the identified regions in the input parameter space of relatively higher sensitivity to changes in the input parameter, and a second subset of computations in the identified regions in the input parameter space of relatively lower sensitivity to changes in the input parameter, the first subset having a higher density in the input parameter space than the second subset.

3. The system of claim 2 , wherein the parameterizing of the input parameter includes a first atomistic scale procedure to produce a set of preliminary configurations for the specified material,
and wherein the executing of the sequences of first principles calculations includes a second atomistic scale procedure that utilizes DFT computations to refine the preliminary configurations and to produce a parameter set using refined configurations.

4. The system of claim 3 , wherein the processor is further configured to utilize DFT computations to parameterize force field computations.

5. The system of claim 2 , wherein the processor is further configured to utilize DFT computations to parameterize force field computations.

6. The system of claim 1 , wherein the producing of the inputs includes:
parameterizing an input parameter including a first atomistic scale procedure to produce a set of preliminary configurations for the specified material; and
executing sequences of first principles calculations including a second atomistic scale procedure that utilizes density functional theory (DFT) computations to refine the preliminary configurations and to produce a parameter set using refined configurations.

7. The system of claim 6 , wherein the processor is further configured to utilize DFT computations to parameterize force field computations.

8. The system of claim 1 , wherein the processor is further configured to utilize DFT computations to parameterize force field computations.

9. An electronic design automation EDA tool comprising:
a memory; and
a processor coupled to the memory and configured to:
produce inputs defining initial conditions of first principles calculations for a specified material of a candidate integrated circuit device;
execute sequences of first principles calculations using the produced inputs; and
process results from the first principles calculations to extract device scale parameters from the results,

wherein the producing of the inputs includes parameterizing an input parameter of the first principles calculations, executing a set of density functional theory (DFT) computations across an input parameter space to characterize sensitivity of one of an intermediate parameter and an output parameter for the specified material across the input parameter space, and identifying regions in the input parameter space of relatively higher sensitivity and regions in the input parameter space of relatively lower sensitivity,
and wherein the executing of the sequences of first principles calculations includes executing a second set of DFT computations across the input parameter space in which the second set includes a first subset of computations in the identified regions in the input parameter space of relatively higher sensitivity to changes in the input parameter, and a second subset of computations in the identified regions in the input parameter space of relatively lower sensitivity to changes in the input parameter, the first subset having a higher density in the input parameter space than the second subset.

10. The tool of claim 9 , wherein:
the parameterizing of the input parameter includes a first atomistic scale procedure to produce a set of preliminary configurations for the specified material; and
the executing of the sequences of first principles calculations includes a second atomistic scale procedure that utilizes DFT computations to refine the preliminary configurations and to produce a parameter set using refined configurations.

11. The tool of claim 10 , wherein the processor is further configured to utilize DFT computations to parameterize force field computations.

12. The tool of claim 9 , wherein the processor is further configured to utilize DFT computations to parameterize force field computations.

13. A method comprising:
producing inputs defining initial conditions of first principles calculations for a specified material of a candidate integrated circuit device;
executing sequences of first principles calculations using the produced inputs; and
processing results from the first principles calculations to extract device scale parameters from the results,
wherein the producing of the inputs includes:
parameterizing an input parameter including a first atomistic scale procedure to produce a set of preliminary configurations for the specified material; and
executing sequences of first principles calculations including a second atomistic scale procedure that utilizes density functional theory (DFT) computations to refine the preliminary configurations and to produce a parameter set using refined configurations.

14. The method of claim 13 , further comprising utilizing DFT computations to parameterize force field computations.

15. The method of claim 13 , wherein the second atomistic scale procedure utilizes the DFT computations by using the set of preliminary configurations produced from the first atomistic scale procedure as starting parameters of the DFT computations.

16. The method of claim 13 , wherein the set of preliminary configurations is produced by the first atomistic scale procedure (i) relaxing a structure of the specified material, (ii) determining a total energy parameter of the relaxed structure or another energy based parameter of the relaxed structure and (iii) producing the set of preliminary configurations based on the determined total energy parameter or the other energy based parameter.

17. An electronic design automation EDA tool comprising:
a memory;
a processor coupled to the memory and configured to:
produce inputs defining initial conditions of firs

Assignees

• Synopsys Inc

Inventors

• Oh Yong-Seog
• Shaughnessy-Culver Michael C
• Smith Stephen L
• Liu Jie
• Moroz Victor
• Balasingam Pratheep
• Ma Terry Sylvan Kam-Chiu

Classifications

• G06F30/30 Primary

  Circuit design · CPC title

• G06F17/14

  Fourier, Walsh or analogous domain transformations {, e.g. Laplace, Hilbert, Karhunen-Loeve, transforms (for correlation function computation G06F17/156; spectrum analysers G01R23/16)} · CPC title

• G06F30/33 Primary

  Design verification, e.g. functional simulation or model checking · CPC title

• G06F30/3308 Primary

  using simulation · CPC title

• G06F2119/14

  Force analysis or force optimisation, e.g. static or dynamic forces · CPC title