Voltage control of learning rate for rpu devices for deep neural network training
US-2018060726-A1 · Mar 1, 2018 · US
US11023802B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-11023802-B2 |
| Application number | US-201715803957-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 6, 2017 |
| Priority date | Mar 13, 2017 |
| Publication date | Jun 1, 2021 |
| Grant date | Jun 1, 2021 |
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Methods for controlling the resistance of a controllable resistive element include determining an amount of electrical resistance change for the controllable resistive element. A concentration difference is determined for a charge carrier ion in a resistor layer of the controllable resistance element that corresponds to the electrical resistance change for the controllable resistive element. A duration and amplitude of a current pulse is determined that changes the charge carrier ion concentration by the determined difference. A positive or negative current pulse is applied to a controllable resistive element for the determined duration.
Opening claim text (preview).
The invention claimed is: 1. A method for adjusting the electrical resistance of a controllable resistive element, comprising: determining an amount of electrical resistance change for the controllable resistive element; determining a concentration difference for a charge carrier ion in a resistor layer of the controllable resistive element that corresponds to the electrical resistance change for the controllable resistive element; determining a duration and amplitude of a current pulse that changes the charge carrier ion concentration by the determined difference; applying a positive or negative current pulse to a controllable resistive element for the determined duration, thereby causing charge carrier ions to travel through an electrolyte layer of the controllable resistive element, to or from the resistor layer; and waiting a predetermined time before applying a read voltage to the controllable resistive element to allow charge carrier ions in the resistor layer to settle. 2. The method of claim 1 , wherein applying the positive or negative current pulse comprises applying a current pulse between a write electrode of the controllable resistive element and the shared read/write electrode of the controllable resistive element to decrease the charge carrier ion concentration by the determined difference. 3. The method of claim 1 , wherein applying the positive or negative current pulse comprises applying a current pulse between a write electrode of the controllable resistive element and the shared read/write electrode of the controllable resistive element to increase the charge carrier ion concentration by the determined difference. 4. The method of claim 1 , wherein applying the positive or negative pulse causes charge carrier ions to move from or to a reservoir layer. 5. The method of claim 1 , wherein the resistor layer is formed from a lithium-containing material. 6. The method of claim 5 , wherein the lithium-containing material is selected from the group consisting of LiCoO 2 , LiNbO 3 , LiMnO 2 , LiV 2 O 5 , LiFePO 4 , LiNi x Mn y Co z , V 2 O 5 —LiBO 2 , Li 4 Ti 5 O 12 , Li x Al, Li x C, and Li x Si. 7. The method of claim 1 , wherein the electrolyte layer is formed from a material selected from the group consisting of lithium phosphorous oxy-nitride and an organic material-based electrolyte. 8. The method of claim 1 , wherein applying the positive or negative current pulse to the controllable resistive element causes charge carrier ions to travel from or to a reservoir layer. 9. The method of claim 8 , wherein the reservoir layer is formed from a lithium compound material selected from the group consisting of LiCoO 2 , LiNbO 3 , LiMnO 2 , LiV 2 O 5 , LiFePO 4 , LiNi x Mn y Co z , V 2 O 5 —LiBO 2 , Li 4 Ti 5 O 12 , Li 2 TiO 3 , Li x Al, Li x C, Li, and Li x Si.
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