X-ray detector for grating-based phase-contrast imaging

Patent metadata

Field	Value
Publication number	US-11000249-B2
Application number	US-201716347992-A
Country	US
Kind code	B2
Filing date	Nov 9, 2017
Priority date	Nov 10, 2016
Publication date	May 11, 2021
Grant date	May 11, 2021

Abstract

An X-ray detector (10) for a phase contrast imaging system (100) and a phase contrast imaging system (100) with such detector (10) are provided. The X-ray detector (10) comprises a scintillation device (12) and a photodetector (14) with a plurality of photosensitive pixels (15) optically coupled to the scintillation device (12), wherein the X-ray detector (10) comprises a primary axis (16) parallel to a surface normal vector of the scintillation device (12), and wherein the scintillation device (12) comprises a wafer substrate (18) having a plurality of grooves (20), which are spaced apart from each other. Each of the grooves (20) extends to a depth (22) along a first direction (21) from a first side (13) of the scintillation device (12) into the wafer substrate (18), wherein each of the grooves (20) is at least partially filled with a scintillation material. Therein, the first direction (21) of at least a part of the plurality of grooves (20) is different from the primary axis (16), such that at least a part of the plurality grooves (20) is tilted with respect to the primary axis (16). An angle between the first direction (21) of a groove (20) arranged in a center region (24) of the scintillation device (12) and the primary axis (16) is smaller than an angle between the first direction (21) of a groove (20) arranged in an outer region (26) of the scintillation device (12) and the primary axis (16).

First claim

The invention claimed is:

1. An X-ray detector for phase contrast imaging, the X-ray detector comprising:
a scintillation device comprising a wafer substrate having a plurality of grooves spaced apart from each other, wherein each groove of the plurality of grooves extends to a depth along a first direction from a first side of the scintillation device into the wafer substrate, each groove of the plurality of grooves being at least partially filled with a scintillation material; and
a photodetector comprising a plurality of photosensitive pixels optically coupled to the scintillation device;
wherein a primary axis is substantially parallel to a surface normal vector of the scintillation device;
wherein first directions of at least a part of the plurality of grooves are different from the primary axis, such that at least a part of the plurality of grooves is tilted with respect to the primary axis; and
wherein an angle between a first direction of a groove arranged in a center region of the scintillation device and the primary axis is smaller than an angle between a first direction of a groove arranged in an outer region of the scintillation device and the primary axis.

2. The X-ray detector according to claim 1 , wherein grooves of the plurality of grooves arranged in an outer region are more tilted with respect to the primary axis than grooves of the plurality of grooves arranged in a center region.

3. The X-ray detector according to claim 1 , wherein at least one groove of the plurality of grooves has a first direction parallel to the primary axis; and wherein the at least one groove of the plurality of grooves is arranged in a center region of the scintillation device.

4. The X-ray detector according to claim 1 , wherein an angle between a first direction of a groove of the plurality of grooves and the primary axis increases with an increasing distance of the groove of the plurality of grooves from a center region to an outer region of the scintillation device.

5. The X-ray detector according claim 1 , wherein each groove of the plurality of grooves is completely filled with a scintillation material.

6. The X-ray detector according to claim 1 , wherein each groove of the plurality of grooves is divided into a plurality of sections along a longitudinal extension direction.

7. The X-ray detector according to claim 1 , wherein at least a part of the plurality of grooves has at least one of the following shapes: a rectangular shape, a trapezoidal shape, a tubular shape, a cylindrical shape, a conical shape, and an asymmetric shape.

8. The X-ray detector according to claim 1 , wherein the detector comprises a flat detector.

9. The X-ray detector according to claim 1 , wherein the wafer substrate comprises silicone; and/or wherein the scintillation material comprises at least one of CsI, NaI, CsI(Tl), CsI(Na), CsI(pure), CsF, KI(Tl), LiI(Eu) and gadolinium oxysulfide.

10. The X-ray detector according to claim 1 , wherein each groove of the plurality of grooves has a depth of about 0.5 mm to 5 mm; and/or wherein each groove of the plurality of grooves has a width of about 1 μm to 200 μm.

11. The X-ray detector according to claim 1 , wherein each groove of the plurality of grooves has a length along a longitudinal extension direction that corresponds to a length of a photosensitive pixel of the plurality of photosensitive pixels.

12. A phase contrast imaging system, comprising:
an X-ray source for emitting a beam of X-rays centered around an optical axis;
an X-ray detector comprising:
a scintillation device comprising a wafer substrate having a plurality of grooves spaced apart from each other, wherein each groove of the plurality of grooves extends to a depth along a first direction from a first side of the scintillation device into the wafer substrate, each groove of the plurality of grooves being at least partially filled with a scintillation material; and
a photodetector comprising a plurality of photosensitive pixels optically coupled to the scintillation device, wherein a primary axis of the X-ray detector is substantially parallel to a surface normal vector of the scintillation device, wherein the first direction of at least a part of the plurality of grooves is different from the primary axis, such that at least a part of the plurality of grooves is tilted with respect to the primary axis, and wherein an angle between the first direction of a groove of the plurality of grooves arranged in a center region of the scintillation device and the primary axis is smaller than an angle between the first direction of a groove of the plurality of grooves arranged in an outer region of the scintillation device and the primary axis; and

at least one grating arranged between the X-ray source and the X-ray detector, wherein the primary axis of the X-ray detector is substantially parallel to the optical axis.

13. The phase contrast imaging system according to claim 12 , wherein the X-ray detector is arranged such that the first direction of each groove of the plurality of grooves is oriented towards a focal spot of the X-ray source.

14. A method of fabricating an X-ray detector, the method comprising:
forming a plurality of grooves into a wafer substrate of a scintillation device, such that the plurality of grooves are spaced apart from each other and such that each groove of the plurality of grooves extends to a depth along a first direction from a surface of the wafer substrate into the wafer substrate;
at least partially filling each groove of the plurality of grooves with a scintillation material; and
arranging the wafer substrate with the at least partially filled plurality of grooves on a photodetector;
wherein the X-ray detector comprises a primary axis parallel to a surface normal vector of the wafer substrate;
wherein the first direction of at least a part of the plurality of grooves is different from the primary axis, such that at least a part of the plurality of grooves is tilted with respect to the primary axis, and
wherein an angle between the first direction of a groove of the plurality of grooves arranged in a center region of the scintillation device and the primary axis is smaller than an angle between the first direction of a groove of the plurality of grooves arranged in an outer region of the scintillation device and the primary axis.

Assignees

• Koninklijke Philips Nv

Inventors

• Daerr Heiner
• Koehler Thomas

Classifications

• G01N23/041

  Phase-contrast imaging, e.g. using grating interferometers · CPC title

• A61B6/4225 Primary

  using image intensifiers · CPC title

• A61B6/4435

  the source unit and the detector unit being coupled by a rigid structure · CPC title

• G21K1/02

  using diaphragms, collimators · CPC title

• G21K2207/005

  Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast · CPC title