Semiconductor storage device
US-2016189801-A1 · Jun 30, 2016 · US
US10943639B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10943639-B2 |
| Application number | US-202016733140-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 2, 2020 |
| Priority date | Dec 18, 2017 |
| Publication date | Mar 9, 2021 |
| Grant date | Mar 9, 2021 |
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A storage device comprising: a nonvolatile memory device including a plurality of memory blocks; and a device controller configured to control the nonvolatile memory device to determine a memory block to perform a refresh operation and to control the memory block to perform the refresh operation to recover data of the memory block.
Opening claim text (preview).
What is claimed is: 1. A memory device comprising: a plurality of memory blocks each including a plurality of pages; and a control logic configured to determine a memory block to perform a refresh operation in response to a refresh scan command from a host and to control the memory block to perform the refresh operation to recover data of the memory block, wherein the memory block has a read count exceeding a first predetermined threshold number. 2. The memory device of claim 1 , wherein the refresh operation includes a read reclaim operation. 3. The memory device of claim 1 , wherein the refresh operation includes a wear leveling operation. 4. The memory device of claim 1 , wherein the memory block has a program-erase count exceeding a second predetermined threshold number. 5. The memory device of claim 1 , wherein the control logic controls to copy the data to one of the plurality of memory blocks. 6. A memory device comprising: a plurality of memory blocks each including a plurality of pages; and a control logic configured to perform a refresh operation to recover data of a selected memory block among the plurality of memory blocks without a request of a host device, wherein the selected memory block has a program-erase count exceeding a first predetermined threshold number. 7. The memory device of claim 6 , wherein the refresh operation includes a read reclaim operation. 8. The memory device of claim 6 , wherein the refresh operation includes a wear leveling operation. 9. The memory device of claim 6 , wherein the selected memory block has a program-erase count exceeding a second predetermined threshold number. 10. The memory device of claim 6 , wherein the control logic controls to copy the data to one of the plurality of memory blocks. 11. A storage device comprising: a nonvolatile memory device including a plurality of memory blocks; and a device controller configured to control the nonvolatile memory device to determine a memory block to perform a refresh operation and to control the memory block to perform the refresh operation to recover data of the memory block, wherein the memory block has a read count exceeding a first predetermined threshold number. 12. The storage device of claim 11 , wherein the refresh operation includes a read reclaim operation. 13. The storage device of claim 11 , wherein the refresh operation includes a wear leveling operation. 14. The storage device of claim 11 , wherein the memory block has a program-erase count exceeding a second predetermined threshold number. 15. The storage device of claim 11 , wherein the device controller controls to copy the data to one of the plurality of memory blocks.
Circuits or methods to detect overerased nonvolatile memory cells, usually during erasure verification · CPC title
Programming or data input circuits · CPC title
Identification of the type of error · CPC title
by changing the state or mode of one or more devices · CPC title
in relation to data integrity, e.g. data losses, bit errors · CPC title
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