Method of making a semi-polar nitride layer on a crystalline substrate

Patent metadata

Field	Value
Publication number	US-10892378-B2
Application number	US-201716078203-A
Country	US
Kind code	B2
Filing date	Feb 21, 2017
Priority date	Feb 22, 2016
Publication date	Jan 12, 2021
Grant date	Jan 12, 2021

Abstract

A method is provided for obtaining a semi-polar nitride layer obtained from a gallium and nitrogen based material on an upper surface of a crystalline substrate of cubic symmetry, including: etching parallel grooves from the upper surface having two opposed inclined facets, one having a crystalline orientation <111>; forming a mask above the upper surface such that the facets having <111> orientation are not masked; and then forming the layer by epitaxial growth from the non-masked facets, including: a first epitaxial growth phase to form a seed in parallel grooves; interrupting the first phase when the seed has an inclined facet having a crystalline orientation 0001 and an upper facet having a crystalline semi-polar orientation 1011; a surface treatment step including modifying an upper portion of the seed to include silicon; and a second epitaxial growth phase from the inclined facet, continuing until coalescence of seeds of adjacent parallel grooves.

First claim

The invention claimed is:

1. A method for obtaining at least one semi-polar nitride layer obtained from a gallium and nitrogen based material on an upper surface of a crystalline substrate of cubic symmetry, the method comprising:
(i) etching a plurality of parallel grooves from the upper surface of the crystalline substrate, each groove comprising at least two opposed inclined facets, at least one of the two opposed facets having a crystalline orientation <111>;
(ii) forming a mask above the upper surface of the crystalline substrate such that the facets opposite to the facets having the crystalline orientation <111> are masked and that the facets having the crystalline orientation <111> are not masked; and
(iii) after forming the mask in (ii), forming the semi-polar nitride layer by epitaxial growth from the non-masked facets having the crystalline orientation <111>;
wherein forming the semi-polar nitride layer in (iii) comprises:
at least one first epitaxial growth phase, carried out from the non-masked facets having the crystalline orientation <111> so as to form a seed in a plurality at least of parallel grooves;
interrupting of the first epitaxial growth phase when the seed has an inclined facet having a crystalline orientation 0001 and an upper facet having a crystalline semi-polar orientation 10 1 1;
a surface treatment comprising a modification of an upper portion of the seed by placing the seed in presence with at least one gas comprising silicon so as to form on the surface of the seed a modified portion comprising silicon; and
at least one second epitaxial growth phase of the material, carried out from the inclined facet having the crystalline orientation 0001, the second epitaxial growth phase being continued until coalescence of seeds of adjacent parallel grooves.

2. The method of claim 1 , wherein during the second epitaxial growth phase the semi-polar layer of nitride covers one part at least of the modified portion comprising silicon.

3. The method of claim 1 , wherein the modified portion comprising silicon is continuous on the upper facet of the seed.

4. The method of claim 1 , wherein the modified portion comprising silicon is absent or discontinuous on the inclined facet having the crystalline orientation 0001.

5. The method of claim 1 , wherein the silicon content of the modified portion located above the upper facet having the crystalline semi-polar orientation 10 1 1 is between 3% and 20% in atomic percentage.

6. The method of claim 1 , wherein the modification of an upper portion of the seed comprises an exposure of the seed to a combined flow of gas comprising SiH4 and NH3.

7. The method of claim 6 , wherein a thickness of the modified portion comprising silicon is controlled by regulating at least a ratio of flow rates of SiH4 and NH3 and/or by regulating an exposure time.

8. The method of claim 1 , wherein a thickness of the modified portion comprising silicon is controlled by regulating at least one parameter selected from the group consisting of flow rate, temperature, and injection pressure of at least one gas comprising silicon.

9. The method of claim 1 , wherein the modified portion comprising silicon sitting on top of the upper facet has a thickness strictly greater than one monoatomic layer.

10. The method of claim 1 , wherein the modified portion comprising silicon sitting on top of the upper facet has a thickness strictly greater than 0.3 nm.

11. The method of claim 1 , wherein the modified portion comprising silicon sitting on top of the inclined facet has a thickness less than or equal to one single monoatomic layer.

12. The method of claim 1 , wherein the modified portion comprising silicon sitting on top of the inclined facet has a thickness equal to or less than 0.3 nm.

13. The method of claim 1 , wherein at least one first epitaxial growth phase and the modification of an upper portion of the seed are performed in the same reactor.

14. The method of claim 1 , wherein the modification of an upper portion of the seed is performed by metalorganic chemical vapor deposition.

15. The method of claim 1 , wherein the interruption is triggered after a predetermined period.

16. The method of claim 1 , wherein the first epitaxial growth phase of the material from the facet having the crystalline orientation <111> is interrupted before the seed fills the groove.

17. The method of claim 1 , wherein before the epitaxial growth stage of the material from the facets having the crystalline orientation <111>, a buffer layer of AlN is formed on the facets having the crystalline orientation <111>.

18. The method of claim 1 , wherein the crystalline substrate comprises at least one material selected from the group consisting of Si, Ge, and GaAs.

Assignees

• Commissariat Energie Atomique
• Centre Nat Rech Scient

Inventors

• Feuillet Guy
• El Khoury Maroun Michel
• Vennegues Philippe
• Zuniga Perez Jesus

Classifications

• H10H20/81

  Bodies · CPC title

• H10H20/825

  containing nitrogen, e.g. GaN · CPC title

• H10H20/817

  characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous · CPC title

• H10H20/815

  having stress relaxation structures, e.g. buffer layers · CPC title

• H10H20/01335 Primary

  the light-emitting regions comprising nitride materials · CPC title