Frequency tunable filter with voltage stressed relaxed switch, and associated apparatus
US-2017126205-A1 · May 4, 2017 · US
US10862032B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10862032-B2 |
| Application number | US-201916692296-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 22, 2019 |
| Priority date | Aug 14, 2018 |
| Publication date | Dec 8, 2020 |
| Grant date | Dec 8, 2020 |
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A radio frequency (RF) switch includes a heating element, thermally conductive and electrically insulating layer over the heating element, a wetting dielectric layer over the thermally conductive and electrically insulating layer, and a phase-change material (PCM) over the wetting dielectric layer. At least one cladding dielectric layer can be situated over sides and/or over a top surface of the PCM. Each of the wetting dielectric layer, phase change material, and cladding dielectric layer can comprise at least germanium. A transitional dielectric layer can be situated between the thermally conductive and electrically insulating layer and the wetting dielectric layer. A contact uniformity support layer can be situated over the cladding dielectric layer.
Opening claim text (preview).
The invention claimed is: 1. A radio frequency (RF) switch comprising: a heating element; a thermally conductive and electrically insulating layer situated over said heating element; a wetting dielectric layer comprising at least germanium situated over said thermally conductive and electrically insulative layer; at least one transitional dielectric layer situated between said thermally conductive and electrically insulating layer and said wetting dielectric layer; a phase-change material (PCM) comprising at least germanium situated over said wetting dielectric layer. 2. The RF switch of claim 1 , wherein said wetting dielectric layer comprises a material selected from the group consisting of germanium oxide (Ge X O Y ), germanium nitride (Ge X N Y ), germanium oxynitride (Ge X O Y N Z ), germanium silicon oxide (Ge X Si Y O Z ), germanium silicon nitride (Ge X Si Y N Z ), and germanium silicon oxynitride (Ge W Si X O Y N Z ). 3. The RF switch of claim 1 , further comprising a cladding dielectric layer comprising at least germanium situated over a top surface of said PCM. 4. The RF switch of claim 1 , further comprising a cladding dielectric layer comprising at least germanium situated over sides of said PCM. 5. The RF switch of claim 3 , wherein said cladding dielectric layer comprises a material selected from the group consisting of germanium oxide (Ge X O Y ), germanium nitride (Ge X N Y ), germanium oxynitride (Ge X O Y N Z ), germanium silicon oxide (Ge X Si Y O Z ), germanium silicon nitride (Ge X Si Y N Z ), and germanium silicon oxynitride (Ge W Si X O Y N Z ). 6. The RF switch of claim 3 , further comprising at least one contact uniformity support layer situated over said cladding dielectric layer. 7. The RF switch of claim 6 , wherein said at least one contact uniformity support layer comprises a material selected from the group consisting of silicon nitride (Si X N Y ) and silicon oxide (Si X O Y ). 8. The RF switch of claim 1 , wherein said least one transitional dielectric layer comprises a material selected from the group consisting of silicon nitride (Si X N Y ) and silicon oxide (Si X O Y ). 9. The RF switch of claim 1 , wherein said thermally conductive and electrically insulating layer comprises a material selected from the group consisting of silicon carbide (Si X C Y ), aluminum nitride (Al X N Y ), aluminum oxide (Al X O Y ), beryllium oxide (Be X O Y ), diamond, and diamond-like carbon. 10. The RF switch of claim 1 , wherein said PCM is selected from the group consisting of germanium telluride (Ge X Te Y ), germanium antimony telluride (Ge X Sb Y Te Z ), germanium selenide (Ge X Se Y ), and any other chalcogenide. 11. A radio frequency (RF) switch comprising: a heating element; a thermally conductive and electrically insulating layer situated over said heating element; a transitional dielectric layer situated over said thermally conductive and electrically insulating layer, said transitional dielectric layer comprising a material selected from the group consisting of silicon nitride (Si X N Y ) and silicon oxide (Si X O Y ); a wetting dielectric layer situated over said transitional dielectric layer, said wetting dielectric layer comprising a material selected from the group consisting of germanium oxide (Ge X O Y ), germanium nitride (Ge X N Y ), germanium oxynitride (Ge X O Y N Z ), germanium silicon oxide (Ge X Si Y O Z ), germanium silicon nitride (Ge X Si Y N Z ), and germanium silicon oxynitride (Ge W Si X O Y N Z ); a phase-change material (PCM) comprising at least germanium situated over said wetting dielectric layer; a cladding dielectric layer situated over a top surface of said PCM, said cladding dielectric layer comprising a material selected from the group consisting of Ge X O Y , Ge X N Y , Ge X O Y N Z , Ge X Si Y O Z , Ge X Si Y N Z , and Ge W Si X O Y N Z . 12. The RF switch of claim 11 , wherein said heating element is transverse to said PCM and approximately underlying an active segment of said PCM. 13. The RF switch of claim 11 , further comprising PCM contacts situated over passive segments of said PCM. 14. The RF switch of claim 11 , further comprising another cladding dielectric layer situated over sides of said PCM. 15. The RF switch of claim 11 , further comprising at least one contact uniformity support layer situated over said cladding dielectric layer, said at least one contact uniformity support layer comprising a material selected from the group consisting of silicon nitride (Si X N Y ) and silicon oxide (Si X O Y ). 16. A radio frequency (RF) switch comprising: a heating element; a thermally conductive and electrically insulating layer situated over said heating element; a phase-change material (PCM) comprising at least germanium situated over said thermally conductive and electrically insulating layer; a cladding dielectric layer comprising at least germanium situated over said PCM; at least one contact uniformity support layer situated over said cladding dielectric layer. 17. The RF switch of claim 16 , wherein said cladding dielectric layer comprises a material selected from the group consisting of germanium oxide (Ge X O Y ), germanium nitride (Ge X N Y ), germanium oxynitride (Ge X O Y N Z ), germanium silicon oxide (Ge X Si Y O Z ), germanium silicon nitride (Ge X Si Y N Z ), and germanium silicon oxynitride (Ge W Si X O Y N Z ). 18. The RF switch of claim 16 , further comprising another cladding dielectric layer situated over sides of said PCM. 19. The RF switch of claim 16 , wherein said at least one contact uniformity support layer comprises a material selected from the group consisting of silicon nitride (Si X N Y ) and silicon oxide (Si X O Y ). 20. The RF switch of claim 13 , wherein said heating element is transverse to said PCM such that said PCM contacts situated over said passive segments of said PCM do not overlie said heating element.
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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