Defect control and stability of dc bias in rf plasma-based substrate processing systems using molecular reactive purge gas
US-2015354061-A1 · Dec 10, 2015 · US
US10790174B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10790174-B2 |
| Application number | US-201815951333-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 12, 2018 |
| Priority date | Oct 20, 2015 |
| Publication date | Sep 29, 2020 |
| Grant date | Sep 29, 2020 |
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A wafer transport assembly includes a first wafer transport module and a second wafer transport module. A buffer module, arranged between the first wafer transport module and the second wafer transport module, includes a first buffer stack and a second buffer stack. Outer sides of the first wafer transport module are coupled to first and second process modules, respectively, and outer sides of the second wafer transport module are coupled to third and fourth process modules, respectively. The first wafer transport module, the second wafer transport module, and the buffer module define a continuous wafer transport volume providing a controlled environment within the wafer transport assembly.
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What is claimed is: 1. A wafer transport assembly, comprising: a first wafer transport module; a second wafer transport module; and a buffer module, arranged between the first wafer transport module and the second wafer transport module, including a first buffer stack and a second buffer stack, wherein outer sides of the first wafer transport module are coupled to first and second process modules, respectively, and outer sides of the second wafer transport module are coupled to third and fourth process modules, respectively, wherein the first wafer transport module, the second wafer transport module, and the buffer module define a continuous wafer transport volume providing a controlled environment within the wafer transport assembly, and wherein the wafer transport assembly is defined over a service tunnel that extends from a front end of the wafer transport assembly to a rear end of the wafer transport assembly. 2. A wafer transport assembly, comprising: a first wafer transport module; a second wafer transport module; a buffer module, arranged between the first wafer transport module and the second wafer transport module, including a first buffer stack and a second buffer stack, wherein outer sides of the first wafer transport module are coupled to first and second process modules, respectively, and outer sides of the second wafer transport module are coupled to third and fourth process modules, respectively, and wherein the first wafer transport module, the second wafer transport module, and the buffer module define a continuous wafer transport volume providing a controlled environment within the wafer transport assembly; first, second, third and fourth gas boxes arranged in the continuous wafer transport volume and configured to deliver gas mixtures to the first, second, third and fourth process modules, respectively; and an exhaust duct to selectively evacuate the first, second, third and fourth process modules, wherein the first, second, third and fourth gas boxes include perforations along surfaces thereof such that gases are evacuated from the first, second, third and fourth gas boxes into the exhaust duct. 3. The wafer transport assembly of claim 2 , further comprising: a plurality of gas lines supplying gases to the first, second, third and fourth gas boxes, wherein the plurality of gas lines run through the exhaust duct to the first, second, third and fourth gas boxes. 4. The wafer transport assembly of claim 3 , wherein the plurality of gas lines supplying the first, second, third and fourth gas boxes run in the exhaust duct from a region outside of the continuous wafer transport volume to a region inside of the continuous wafer transport volume. 5. A wafer transport assembly, comprising: a first wafer transport module; a second wafer transport module; a buffer module, arranged between the first wafer transport module and the second wafer transport module, including a first buffer stack and a second buffer stack, wherein outer sides of the first wafer transport module are coupled to first and second process modules, respectively, and outer sides of the second wafer transport module are coupled to third and fourth process modules, respectively, and wherein the first wafer transport module, the second wafer transport module, and the buffer module define a continuous wafer transport volume providing a controlled environment within the wafer transport assembly; and a service tunnel defined underneath the wafer transport assembly, wherein the service tunnel has a vertical dimension defined between an underside of the wafer transport assembly and a service floor that is positioned underneath the wafer transport assembly. 6. The wafer transport assembly of claim 5 , wherein the service floor is defined at a height that is less than a height of a fabrication facility floor. 7. The wafer transport assembly of claim 6 , wherein the height of the service floor is between 30.5 cm to 61 cm below the height of the fabrication facility floor. 8. The wafer transport assembly of claim 7 , wherein a height of the service tunnel is in a range from 183 cm to 244 cm. 9. A wafer transport assembly, comprising: a first wafer transport module; a second wafer transport module; and a buffer module, arranged between the first wafer transport module and the second wafer transport module, including a first buffer stack and a second buffer stack, wherein outer sides of the first wafer transport module are coupled to first and second process modules, respectively, and outer sides of the second wafer transport module are coupled to third and fourth process modules, respectively, wherein the first wafer transport module, the second wafer transport module, and the buffer module define a continuous wafer transport volume providing a controlled environment within the wafer transport assembly, wherein a first portion of the first buffer stack defines a first plurality of wafer storage slots and includes one or more separators defined between each of the first plurality of wafer storage slots, and wherein a second portion of the first buffer stack defines a second plurality of wafer storage slots that does not include separators defined between each of the second plurality of wafer storage slots. 10. The wafer transport assembly of claim 9 , wherein at least one of the first wafer transport module and the second wafer transport module stores at least one of a seasoning wafer and a cover wafer in the second portion of the first buffer stack and at least one of a processed wafer and an unprocessed wafer in the first portion of the first buffer stack.
characterised by the construction of the processing chambers, e.g. modular processing chambers · CPC title
characterised by the layout of the process chambers · CPC title
characterised by the construction of the transfer chamber · CPC title
Mechanical parts of transfer devices · CPC title
Storage means · CPC title
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