Porous semiconductor handle substrate

US10784348B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10784348-B2
Application numberUS-201715669704-A
CountryUS
Kind codeB2
Filing dateAug 4, 2017
Priority dateMar 23, 2017
Publication dateSep 22, 2020
Grant dateSep 22, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An integrated circuit (IC) may include an active device layer on a front-side surface of a semiconductor device substrate. The IC may also include a front-side dielectric layer having a first surface opposite a second surface, the first surface contacting the active device layer. The IC may further include a porous semiconductor handle substrate contacting the second surface of the front-side dielectric layer. The porous semiconductor handle substrate may be uniformly doped.

First claim

Opening claim text (preview).

What is claimed is: 1. An integrated circuit (IC), comprising: an active device layer on a front-side surface of a semiconductor layer on an insulator layer of a semiconductor on insulator (SOI) device substrate; a front-side dielectric layer having a first surface opposite a second surface, the first surface contacting the active device layer; and a semiconductor handle substrate having a porous semiconductor layer contacting the second surface of the front-side dielectric layer and distal from the SOI device substrate, in which the semiconductor handle substrate is uniformly doped, and the porous semiconductor layer comprises a high porosity portion corresponding to dicing streets on the semiconductor device substrate, a first low porosity portion and a second low porosity portion adjacent to and side-by-side with the high porosity portion, the high porosity portion between the first low porosity portion and the second low porosity portion. 2. The IC of claim 1 , in which the porous semiconductor layer has a depth greater than 10 microns. 3. The IC of claim 1 , in which the semiconductor handle substrate comprises a bulk silicon wafer having the porous semiconductor layer. 4. The IC of claim 1 , in which the porous semiconductor layer is sealed or capped with oxide. 5. The IC of claim 1 , further comprising an oxide and/or adhesive between the porous semiconductor layer of the semiconductor handle substrate and the front-side dielectric layer. 6. The IC of claim 1 , further comprising an oxide within pores of the porous semiconductor layer of the semiconductor handle substrate. 7. The IC of claim 1 , in which the porous semiconductor layer comprises sealed oxide porous silicon. 8. The IC of claim 1 , in which the porous semiconductor layer comprises different porosities. 9. The IC of claim 1 , in which the porous semiconductor layer comprises different levels of porosity in different layers. 10. The IC of claim 9 , in which the different levels of porosity are graded or stepped. 11. The IC of claim 1 , in which the porous semiconductor layer comprises a 50 micron thick layer proximate to the front-side dielectric layer. 12. The IC of claim 1 , integrated into an RF front end module, the RF front end module incorporated into at least one of a music player, a video player, an entertainment unit, a navigation device, a communications device, a personal digital assistant (PDA), a fixed location data unit, a mobile phone, and a portable computer. 13. An integrated circuit (IC), comprising: an active device layer on a front-side surface of a semiconductor layer on an insulator layer of a semiconductor on insulator (SOI) device substrate; a front-side dielectric layer having a first surface opposite a second surface, the first surface contacting the active device layer; and means for reducing radio frequency (RF) harmonics contacting the second surface of the front-side dielectric layer and distal from the SOI device substrate, and the means for reducing RF harmonics comprising a high porosity portion corresponding to dicing streets on the semiconductor device substrate, a first low porosity portion and a second low porosity portion adjacent to and side-by-side with the high porosity portion, the high porosity portion between the first low porosity portion and the second low porosity portion. 14. The IC of claim 13 , integrated into an RF front end module, the RF front end module incorporated into at least one of a music player, a video player, an entertainment unit, a navigation device, a communications device, a personal digital assistant (PDA), a fixed location data unit, a mobile phone, and a portable computer.

Assignees

Inventors

Classifications

  • of bump connectors, dummy bumps or thermal bumps · CPC title

  • relative to the surface, e.g. recessed, protruding · CPC title

  • forming a chip-scale package [CSP] · CPC title

  • using temporarily an auxiliary support · CPC title

  • used as a support during manufacture of interconnect decals or build up layers · CPC title

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Frequently asked questions

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What does patent US10784348B2 cover?
An integrated circuit (IC) may include an active device layer on a front-side surface of a semiconductor device substrate. The IC may also include a front-side dielectric layer having a first surface opposite a second surface, the first surface contacting the active device layer. The IC may further include a porous semiconductor handle substrate contacting the second surface of the front-side d…
Who is the assignee on this patent?
Qualcomm Inc
What technology area does this patent fall under?
Primary CPC classification H10D86/201. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 22 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).