Semiconductor device, structure and methods
US-9721927-B1 · Aug 1, 2017 · US
US10784348B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10784348-B2 |
| Application number | US-201715669704-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 4, 2017 |
| Priority date | Mar 23, 2017 |
| Publication date | Sep 22, 2020 |
| Grant date | Sep 22, 2020 |
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Official abstract text for this publication.
An integrated circuit (IC) may include an active device layer on a front-side surface of a semiconductor device substrate. The IC may also include a front-side dielectric layer having a first surface opposite a second surface, the first surface contacting the active device layer. The IC may further include a porous semiconductor handle substrate contacting the second surface of the front-side dielectric layer. The porous semiconductor handle substrate may be uniformly doped.
Opening claim text (preview).
What is claimed is: 1. An integrated circuit (IC), comprising: an active device layer on a front-side surface of a semiconductor layer on an insulator layer of a semiconductor on insulator (SOI) device substrate; a front-side dielectric layer having a first surface opposite a second surface, the first surface contacting the active device layer; and a semiconductor handle substrate having a porous semiconductor layer contacting the second surface of the front-side dielectric layer and distal from the SOI device substrate, in which the semiconductor handle substrate is uniformly doped, and the porous semiconductor layer comprises a high porosity portion corresponding to dicing streets on the semiconductor device substrate, a first low porosity portion and a second low porosity portion adjacent to and side-by-side with the high porosity portion, the high porosity portion between the first low porosity portion and the second low porosity portion. 2. The IC of claim 1 , in which the porous semiconductor layer has a depth greater than 10 microns. 3. The IC of claim 1 , in which the semiconductor handle substrate comprises a bulk silicon wafer having the porous semiconductor layer. 4. The IC of claim 1 , in which the porous semiconductor layer is sealed or capped with oxide. 5. The IC of claim 1 , further comprising an oxide and/or adhesive between the porous semiconductor layer of the semiconductor handle substrate and the front-side dielectric layer. 6. The IC of claim 1 , further comprising an oxide within pores of the porous semiconductor layer of the semiconductor handle substrate. 7. The IC of claim 1 , in which the porous semiconductor layer comprises sealed oxide porous silicon. 8. The IC of claim 1 , in which the porous semiconductor layer comprises different porosities. 9. The IC of claim 1 , in which the porous semiconductor layer comprises different levels of porosity in different layers. 10. The IC of claim 9 , in which the different levels of porosity are graded or stepped. 11. The IC of claim 1 , in which the porous semiconductor layer comprises a 50 micron thick layer proximate to the front-side dielectric layer. 12. The IC of claim 1 , integrated into an RF front end module, the RF front end module incorporated into at least one of a music player, a video player, an entertainment unit, a navigation device, a communications device, a personal digital assistant (PDA), a fixed location data unit, a mobile phone, and a portable computer. 13. An integrated circuit (IC), comprising: an active device layer on a front-side surface of a semiconductor layer on an insulator layer of a semiconductor on insulator (SOI) device substrate; a front-side dielectric layer having a first surface opposite a second surface, the first surface contacting the active device layer; and means for reducing radio frequency (RF) harmonics contacting the second surface of the front-side dielectric layer and distal from the SOI device substrate, and the means for reducing RF harmonics comprising a high porosity portion corresponding to dicing streets on the semiconductor device substrate, a first low porosity portion and a second low porosity portion adjacent to and side-by-side with the high porosity portion, the high porosity portion between the first low porosity portion and the second low porosity portion. 14. The IC of claim 13 , integrated into an RF front end module, the RF front end module incorporated into at least one of a music player, a video player, an entertainment unit, a navigation device, a communications device, a personal digital assistant (PDA), a fixed location data unit, a mobile phone, and a portable computer.
of bump connectors, dummy bumps or thermal bumps · CPC title
relative to the surface, e.g. recessed, protruding · CPC title
forming a chip-scale package [CSP] · CPC title
using temporarily an auxiliary support · CPC title
used as a support during manufacture of interconnect decals or build up layers · CPC title
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