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US-12270713-B2 · Apr 8, 2025 · US
Temperature measurement device using strain gauge
US10684176B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10684176-B2 |
| Application number | US-201816615463-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 17, 2018 |
| Priority date | May 30, 2017 |
| Publication date | Jun 16, 2020 |
| Grant date | Jun 16, 2020 |
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Abstract
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There is provided a device for measuring a temperature of a metal object itself without being affected by an ambient temperature. A first invention provides a device for measuring a temperature of a metal object using at least one strain gauge, wherein the at least one strain gauge is attached to the metal object and a linear expansion coefficient of the strain gauge is different from a linear expansion coefficient of the metal object. A second invention provides a device for measuring a temperature of a metal object using two strain gauges, wherein the two strain gauges are attached to the metal object, directions of grids of the two strain gauges coincide with each other, a Wheatstone bridge circuit is formed using the two strain gauges, a linear expansion coefficient of a first strain gauge of the two strain gauges is larger than the linear expansion coefficient of the metal object and the linear expansion coefficient of a second strain gauge of the two strain gauges is smaller than the linear expansion coefficient of the metal object.
First claim
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The invention claimed is: 1. A device for measuring a temperature of a metal object using two strain gauges, wherein the two strain gauges are attached to the metal object, a Wheatstone bridge circuit is formed using the two strain gauges, a linear expansion coefficient of a first strain gauge of the two strain gauges is larger than a linear expansion coefficient of the metal object, and a linear expansion coefficient of a second strain gauge of the two strain gauges is smaller than the linear expansion coefficient of the metal object. 2. A device for measuring a temperature of a metal object using four strain gauges, wherein the four strain gauges are attached to the metal object, a Wheatstone bridge circuit is formed using the four strain gauges, a linear expansion coefficient of each of first and third strain gauges of the four strain gauges is larger than a linear expansion coefficient of the metal object, and a linear expansion coefficient of each of second and fourth strain gauges of the four strain gauges is smaller than the linear expansion coefficient of the metal object. 3. A device for measuring a temperature of a metal object using two strain gauges, wherein the two strain gauges are attached to the metal object, directions of grids of the two strain gauges coincide with each other, a Wheatstone bridge circuit is formed using the two strain gauges, a linear expansion coefficient of a first strain gauge of the two strain gauges is larger than a linear expansion coefficient of the metal object, and a linear expansion coefficient of a second strain gauge of the two strain gauges is smaller than the linear expansion coefficient of the metal object. 4. A device for measuring a temperature of a metal object using four strain gauges, wherein the four strain gauges are attached to the metal object, directions of grids of the four strain gauges coincide with one another, a Wheatstone bridge circuit is formed using the four strain gauges, a linear expansion coefficient of each of first and third strain gauges of the four strain gauges is larger than a linear expansion coefficient of the metal object, and a linear expansion coefficient of each of second and fourth strain gauges of the four strain gauges is smaller than the linear expansion coefficient of the metal object.
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Frequently asked questions
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- What does patent US10684176B2 cover?
- There is provided a device for measuring a temperature of a metal object itself without being affected by an ambient temperature. A first invention provides a device for measuring a temperature of a metal object using at least one strain gauge, wherein the at least one strain gauge is attached to the metal object and a linear expansion coefficient of the strain gauge is different from a linear …
- Who is the assignee on this patent?
- Minebea Mitsumi Inc
- What technology area does this patent fall under?
- Primary CPC classification G01K5/52. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Jun 16 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).