Semiconductor device and method of manufacturing thereof
US-2019326344-A1 · Oct 24, 2019 · US
US10645818B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10645818-B2 |
| Application number | US-201716462719-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 6, 2017 |
| Priority date | Nov 22, 2016 |
| Publication date | May 5, 2020 |
| Grant date | May 5, 2020 |
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Official abstract text for this publication.
A solder scattering is prevented at the time of reflow and the oxide films formed on the surfaces of solder or electrodes are thoroughly removed. The soldering method according to the present invention contains the steps of: applying solder paste to the electrode on a printed circuit board and mounting an electronic part on the solder paste, volatilizing the residue-free flux contained in the solder paste by heating the printed circuit board in a chamber set to be a vacuum state and approximately 180 degree C. at the time of pre-heating (interval A), removing oxide films formed on the electrode and the like by heating the printed circuit board in the chamber set to be a formic acid atmospheric state and the temperature of approximately 200 degree C. at the time of reducing (interval B), and melting solder powder contained in the solder paste by heating the printed circuit board in the chamber set to be a vacuum state and the temperature of 250 degree C. at the time of main heating (interval C).
Opening claim text (preview).
The invention claimed is: 1. A soldering method characterized in that the soldering method comprises: a first step of applying solder paste in which a solder alloy is mixed with residue-free flux to a soldering portion on a circuit board, and mounting an electronic part on the solder paste; a second step of volatilizing the residue-free flux contained in the solder paste by heating the circuit board in a furnace set to be a vacuum state and a first temperature to become a residue-free condition, wherein the residue-free condition contains an amount of flux residue that is 1% by weight or less of the flux; a third step of removing an oxide film on at least the soldering portion by heating the circuit board in the furnace set to be a reducing atmospheric state and a second temperature; and a fourth step of melting solder contained in the solder paste by heating the circuit board in the furnace set to be a vacuum state and a third temperature which is higher than the second temperature. 2. The soldering method according to claim 1 characterized in that in the first step, the solder paste is applied to the soldering portion on the circuit board with the use of a metal mask having an opening that is open at area corresponding to the soldering portion on the circuit board. 3. The soldering method according to claim 1 characterized in that the solder alloy has tensile strength which is equal to or more than 55 MPa, percentage elongation which is equal to or less than 40%, and 0.2% yield strength which is equal to or more than 40 MPa. 4. The soldering method according to claim 2 characterized in that the solder alloy has tensile strength which is equal to or more than 55 MPa, percentage elongation which is equal to or less than 40%, and 0.2% yield strength which is equal to or more than 40 MPa.
Preheating, e.g. before soldering · CPC title
Using vacuum or low pressure · CPC title
Heating processes for reflow soldering · CPC title
relating to soldering or welding · CPC title
Printed circuits · CPC title
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