Aperture measuring device and an aperture measuring method

Patent metadata

Field	Value
Publication number	US-10627207-B2
Application number	US-201815977194-A
Country	US
Kind code	B2
Filing date	May 11, 2018
Priority date	Jul 12, 2017
Publication date	Apr 21, 2020
Grant date	Apr 21, 2020

Abstract

An aperture measuring device and aperture measuring method for measuring the size of the aperture of a through-hole in a conductive structure is described to reduce the aperture measurement time and improve the working efficiency. The aperture measuring device includes: an aperture testing component for being inserted into the through-hole, wherein the aperture measuring device includes a plurality of resistor segments with different diameters, the individual resistor segments being successively connected in series in an order of the sizes of their diameters; and a measuring module for measuring the resistance value of a resistor segment unable to be inserted into the through-hole in the aperture testing component to determine the size of the aperture of the through-hole.

First claim

The invention claimed is:

1. An aperture measuring device for measuring the size of an aperture of a through-hole in a conductive structure, comprising:
an aperture testing component capable of being inserted into the through-hole, wherein the aperture testing component comprises a plurality of resistor segments with different diameters, and wherein the individual resistor segments are successively connected in series in an order of sizes of the diameters of the individual resistor segments; and
a measuring module for measuring a resistance value of a resistor segment unable to be inserted into the through-hole, wherein the resistance value of the resistor segment is used to determine the size of the aperture of the through-hole.

2. The aperture measuring device according to claim 1 , wherein the measuring module is connected with an outermost end of a resistor segment with the largest diameter in the aperture testing component via a first wire, and wherein the measuring module is connected with a circumference of an insertion inlet of the through-hole via a second wire.

3. The aperture measuring device according to claim 1 , wherein the aperture testing component is arranged to be inserted into an insertion inlet of the through-hole from one end at which a resistor segment with the smallest diameter is located, until the aperture testing component cannot continue to be inserted.

4. The aperture measuring device according to claim 3 , wherein the measuring module is configured to derive the diameters of both a last resistor segment insertable into the through-hole and a first resistor segment unable to be inserted into the through-hole according to the measured resistance value and a predetermined resistance value of each of the plurality of resistor segments and the diameter of each respective resistor segment, and wherein the measuring module is configured to determine the size of the aperture of the through-hole according to the derived diameters.

5. The aperture measuring device according to claim 4 , wherein the measuring module is further configured to determine the size of the aperture of the through-hole as the diameter of the last resistor segment insertable into the through-hole in case of a distance between an outer surface of the last resistor segment insertable into the through-hole and an inner surface of the through-hole being less than a threshold distance; and wherein the measuring module is further configured to determine the size of aperture of the through-hole as the mean value of the diameter of the last resistor segment insertable into the through-hole and the diameter of the first resistor segment unable to be inserted into the through-hole in case of the distance being not less than the threshold distance.

6. The aperture measuring device according to claim 1 , wherein the materials of the plurality of resistor segments are identical.

7. The aperture measuring device according to claim 6 , wherein the plurality of resistor segments are integrally molded.

8. The aperture measuring device according to claim 1 , further comprising a display module for displaying the determined size of the aperture of the through-hole.

9. The aperture measuring device according to claim 8 , wherein the display module is a liquid crystal display or an organic electroluminescent display.

10. The aperture measuring device according to claim 1 , wherein the lengths of the plurality of resistor segments are identical.

11. The aperture measuring device according to claim 10 , wherein the length of each of the plurality of resistor segments is between 4 millimeters and 6 millimeters.

12. An aperture measuring method for measuring an aperture of a through-hole in a conductive structure, comprising:
providing an aperture measuring device for measuring the aperture of a through-hole in a conductive structure, comprising:
an aperture testing component capable of being inserted into the through-hole, wherein the aperture testing component comprises a plurality of resistor segments with different diameters, and wherein the individual resistor segments are successively connected in series in an order of sizes of the diameters of the individual resistor segments, and
a measuring module for measuring a resistance value of a resistor segment unable to be inserted into the through-hole, wherein the resistance value of the resistor segment is used to determine the size of the aperture of the through-hole;

inserting the aperture testing component into an insertion inlet of the through-hole from one end at which the resistor segment with a smallest diameter is located, until the aperture testing component cannot continue to be inserted
measuring a resistance value of a resistor segment unable to be inserted into the through-hole;
deriving the diameters of both a last resistor segment insertable into the through-hole and a first resistor segment unable to be inserted into the through-hole according to the measured resistance value and predetermined resistance values of the plurality of resistor segments in the aperture testing component and their diameters; and
determining the size of the aperture of the through-hole according to the derived diameters.

13. The aperture measuring method according to claim 12 , wherein the step of measuring the resistance value comprises:
applying a voltage to the resistor segment unable to be inserted into the through-hole in the aperture testing component,
measuring a current value flowing through the resistor segment, and
deriving the resistance value of the resistor segment unable to be inserted into the through-hole in the aperture testing component according to the Ohm' law.

14. The aperture measuring method according to claim 12 , wherein the step of determining the size of the aperture of the through-hole according to the derived diameters comprises:
determining the size of the aperture of the through-hole as the derived diameter of the last resistor segment insertable into the through-hole in case of a distance between an outer surface of the last resistor segment insertable into the through-hole and an inner surface of the through-hole being less than a threshold distance; and
determining the size of the aperture of the through-hole as a mean value of the derived diameter of the last resistor segment insertable into the through-hole and the derived diameter of the first resistor segment unable to be inserted into the through-hole in case of the distance being not less than the threshold distance.

15. The aperture measuring method according to claim 12 , further comprising displaying the determined size of the aperture of the through-hole.

Assignees

• Boe Technology Group Co Ltd
• Hefei Boe Optoelectronics Tech

Inventors

• Li Dingyuan
• Guo Ruwang
• Chen Haifeng
• Wang Jie

Classifications

• G01B7/13 Primary

  Internal diameters · CPC title

• G01B3/50

  of limit-gauge type, i.e. "go/no-go" (G01B3/48 takes precedence) · CPC title