Device monitoring using satellite ADCs having local voltage reference

Patent metadata

Field	Value
Publication number	US-10598729-B1
Application number	US-201916535726-A
Country	US
Kind code	B1
Filing date	Aug 8, 2019
Priority date	Aug 8, 2019
Publication date	Mar 24, 2020
Grant date	Mar 24, 2020

Abstract

Systems and methods for monitoring a number of operating conditions of a programmable device are disclosed. In some implementations, the system may include a root monitor including circuitry configured to generate a reference voltage, a plurality of sensors and satellite monitors distributed across the programmable device, and a network-on-chip (NoC) interconnect system coupled to the root monitor and to each of the plurality of satellite monitors. Each of the satellite monitors may be in a vicinity of and coupled to a corresponding one of the plurality of sensors via a local interconnect.

First claim

What is claimed is:

1. A programmable device, comprising:
programmable logic including a plurality of configurable logic resources;
a root monitor including a bandgap voltage generator configured to generate a temperature-independent reference voltage;
a plurality of sensors distributed in various locations across the programmable device, each of the sensors configured to generate analog signals indicative of measured operating conditions of one or more associated circuits in a vicinity of a corresponding one of the various locations; and
a plurality of satellite monitors distributed across the programmable device in the various locations, each of the satellite monitors coupled to one or more associated sensors via one or more local signal lines and comprising:
a relatively small local voltage source configured to generate a local reference voltage;
an analog-to-digital converter (ADC) including a reference terminal to receive the local reference voltage and configured to convert the analog signals generated by the one or more associated sensors into digital codes indicative of the measured operating conditions;
a calibration circuit configured to generate a correction factor indicative of errors in the digital codes; and
a correction circuit configured to correct the digital codes based on the correction factor.

2. The programmable device of claim 1 , wherein the local voltage source consists of fewer than a dozen transistors, and consumes at least one order of magnitude less circuit area than the bandgap voltage generator.

3. The programmable device of claim 1 , wherein the errors in the digital codes are associated with deviations of the local reference voltage from the temperature-independent reference voltage.

4. The programmable device of claim 1 , wherein the correction factor is based on differences between a reference code generated by the ADC in response to sampling the temperature-independent reference voltage and a predetermined digital code indicative of the temperature-independent reference voltage.

5. The programmable device of claim 1 , further comprising:
a network-on-chip (NoC) interconnect system spanning the programmable logic and configured to selectively route digital data from each of the plurality of satellite monitors to the root monitor.

6. The programmable device of claim 5 , wherein the root monitor further comprises:
a memory configured to store the digital data received from the plurality of satellite monitors via the NoC interconnect system; and
a controller configured to determine whether the measured operating conditions embodied by the digital data are within a range.

7. The programmable device of claim 5 , further comprising:
one or more analog channels configured to distribute the temperature-independent reference voltage from the root monitor to each of the plurality of satellite monitors.

8. The programmable device of claim 7 , wherein the NoC interconnect system comprises the one or more analog channels.

9. The programmable device of claim 7 , wherein each of the satellite monitors further comprises:
a switch including a first input terminal coupled to receive the temperature-independent reference voltage from the one or more analog channels, a second input terminal coupled to receive the analog signals generated by the one or more associated sensors, a control terminal coupled to receive a control signal, and an output terminal coupled to an input terminal of the ADC within the satellite monitor.

10. The programmable device of claim 9 , wherein:
during a calibration operation, the switch provides the temperature-independent reference voltage as an input signal to the ADC; and
during a monitoring operation, the switch provides the analog signals from the sensors as input signals to the ADC.

11. The programmable device of claim 10 , wherein:
during the calibration operation, the ADC samples the temperature-independent reference voltage to generate a reference code; and
during the monitoring operation, the ADC samples the analog signals from the one or more associated sensors to generate the digital codes.

12. The programmable device of claim 11 , wherein the calibration circuit is configured to generate the correction factor based on a difference between the reference code generated by the ADC and a predetermined digital code indicative of the temperature-independent reference voltage.

13. The programmable device of claim 9 , wherein the root monitor is configured to generate the control signals based at least in part on a timing schedule for calibrating the plurality of satellite monitors.

14. The programmable device of claim 13 , wherein the timing schedule is configured to sequentially enable calibration of each of the plurality of satellite monitors by providing the temperature-independent reference voltage to only one of the satellite monitors at a time.

15. A method of monitoring operating conditions of a plurality of circuits distributed in various locations across a programmable device, the method comprising:
generating an analog signal indicative of the operating conditions of each of the plurality of circuits using a corresponding one of a plurality of sensors distributed in the various locations across the programmable device;
providing each of the analog signals to a corresponding one of a plurality of satellite monitors distributed in the various locations across the programmable device;
generating, in each of the plurality of satellite monitors, a local reference voltage using a relatively small local voltage source;
converting, in each of the plurality of satellite monitors, a corresponding one of the plurality of analog signals into a digital code using an analog-to-digital converter (ADC) based on the local reference voltage;
distributing a temperature-independent reference voltage from a root monitor to each of the plurality of satellite monitors;
correcting the digital code generated by the ADC within each of the plurality of satellite monitors based at least in part on the distributed temperature-independent reference voltage; and
selectively routing the corrected digital codes from each of the plurality of satellite monitors to the root monitor.

16. The method of claim 15 , wherein the local voltage source consists of fewer than a dozen transistors, and consumes at least one order of magnitude less circuit area than the bandgap voltage generator.

17. The method of claim 15 , wherein:
the corrected digital codes are selectively routed from the plurality of satellite monitors to the root monitor using a network-on-chip (NoC) interconnect system spanning the programmable device; and
the temperature-independent reference voltage is distributed from the root monitor to the plurality of satellite monitors using one or more analog channels spanning the programmable device.

18. The method of claim 15 , wherein distributing the temperature-independent reference voltage further comprises:
sequentially enabling each of the plurality of satellite monitors to access the temperature-independent reference voltage based on a corresponding plurality of control signals generated by the root monitor.

19. The method of claim 15 , wherein the correcting comprises:
providing the temperature-independent reference voltage as an input signal to the ADC;
converting the temperature-independent reference voltage into a reference code using the ADC;
generating a correction factor based on differences between the reference code and a predetermined digital code indicat

Assignees

• Xilinx Inc

Inventors

• Jennings John K

Classifications

• H03K19/17764 Primary

  for reliability · CPC title

• H03K19/17724

  Structural details of logic blocks · CPC title

• H03M1/12

  Analogue/digital converters ({H03M1/001 – } H03M1/10 take precedence) · CPC title

• H03M1/1042

  the look-up table containing corrected values for replacing the original digital values (H03M1/1052 takes precedence) · CPC title

• H03M1/06

  Continuously compensating for, or preventing, undesired influence of physical parameters (periodically, {e.g. by using stored correction values,} H03M1/10) · CPC title