Zone selective interlocking test apparatus

Patent metadata

Field	Value
Publication number	US-10591545-B2
Application number	US-201715831656-A
Country	US
Kind code	B2
Filing date	Dec 5, 2017
Priority date	Jun 15, 2016
Publication date	Mar 17, 2020
Grant date	Mar 17, 2020

Abstract

A ZSI testing apparatus includes a fault generation circuit, a plurality of cable assemblies coupled to the fault generation circuit, wherein the cable assemblies are structured to be selectively coupled to selected circuit interrupters, a human machine interface, and a controller coupled. The controller is configured to: (i) selectively cause a fault current to be provided to a number of the cable assemblies, (ii) receive an input from each circuit interrupter that is coupled to one of the cable assemblies, each input being indicative of a trip signal output of the circuit interrupter, (iii) determine based on the received inputs (a) that an error has occurred with respect to operation of the circuit interrupters and (b) a recommendation for fixing the error, and (iv) cause an output indicative of the error and the recommendation to be provided on the human machine interface.

First claim

What is claimed is:

1. An apparatus for testing the zone selective interlocking functionality of an electrical system including a plurality of circuit interrupters, comprising:
a current generation circuit configured to generate a current; and
a controller coupled to the current generation circuit, the controller being configured to: (i) selectively cause the current to be provided to a number of the circuit interrupters, (ii) receive an input from each of the number of circuit interrupters that is indicative of a trip signal output, and (iii) determine whether or not an error has occurred with respect to operation of each circuit interrupter based on each received input.

2. The apparatus according to claim 1 , further comprising a plurality of cable assemblies coupled to the current generation circuit, wherein the cable assemblies are structured to be selectively coupled to selected ones of the circuit interrupters.

3. The apparatus according to claim 2 , wherein the cable assemblies are structured to be selectively coupled to selected ones of the circuit interrupters according to a plurality of predetermined configurations, wherein for each of the predetermined configurations two or more of the cable assemblies are coupled to particular ones of circuit interrupters, wherein the controller is structured and configured to, for each of the predetermined configurations, selectively cause a plurality of fault test types to be performed, and wherein for each of the predetermined configurations and each of the fault test types associated therewith, the controller is structured and configured to cause the current to be provided to predetermined ones of the cable assemblies.

4. The apparatus according to claim 3 , wherein the controller stores, for each predetermined configuration and each associated fault test type, trip information that indicates for each circuit interrupter in the predetermined configuration: (i) whether the circuit interrupter should have tripped, and (ii) if the circuit interrupter should have tripped, a predetermined time from receipt of the current within which the circuit interrupter should have tripped.

5. The apparatus according to claim 4 , wherein the controller is structured and configured to determine that the error has occurred based on the received inputs and the stored trip information.

6. The apparatus according to claim 5 , wherein the test fault types include a main fault, a tie fault, a feeder fault, and a simultaneous main fault.

7. The apparatus according to claim 4 , wherein one or more of the predetermined configurations are for use with a single ended arrangement and a second one or more of the predetermined configurations are for use with a double ended arrangement, and wherein the controller is structured and configured to enable selection of testing for either a double ended arrangement or a single ended arrangement.

8. The apparatus according to claim 1 , wherein the controller is structured to generate an output indicative of the error.

9. The apparatus according to claim 8 , wherein the controller is structured and configured to cause the output indicative of the error to be visually displayed on a display device coupled to the controller.

10. The apparatus according to claim 8 , wherein the controller is structured and configured to determine a recommendation for fixing the error, and wherein the output is indicative of the recommendation.

11. The apparatus according to claim 1 , further comprising a human machine interface coupled to the controller.

12. A method for testing the zone selective interlocking functionality of an electrical system including a plurality of circuit interrupters, comprising:
generating a current;
providing the current to a number of the circuit interrupters;
receiving an input from each circuit interrupter, each input being indicative of a trip signal output; and
determining whether or not an error has occurred with respect to operation of each circuit interrupter based on each received input.

13. The method according to claim 12 , further comprising providing an output indicative of the error.

14. The method according to claim 13 , wherein the providing an output comprises visually displaying the output on a human machine interface.

15. The method according to claim 12 , coupling a plurality of cable assemblies to selected ones of the circuit interrupters prior to providing the current to a number of the circuit interrupters.

16. The method according to claim 15 , wherein the plurality of cable assemblies are connected to the selected ones of the circuit interrupters according to a predetermined configuration, the method further comprising receiving information relating to a type of arrangement being tested and a type of fault test to be conducted and determining which of the number of cable assemblies receives the current based on the predetermined configuration, the type of arrangement, and the type of fault test.

17. The method according to claim 16 , wherein the determining that the error has occurred is based on the predetermined configuration, the type of arrangement, the type of fault test and stored trip information that indicates for each circuit interrupter in the predetermined configuration: (i) whether the circuit interrupter should have tripped, and (ii) if the circuit interrupter should have tripped, a predetermined time from receipt of the current within which the circuit interrupter should have tripped.

18. The method according to claim 16 , wherein the type of fault test is one or more of a main fault, a tie fault, a feeder fault, and a simultaneous main fault.

19. The method according to claim 12 , further comprising determining based on the received inputs a recommendation for fixing the error.

20. An apparatus for testing the zone selective interlocking functionality of an electrical system including a plurality of circuit interrupters, comprising:
a housing, and
a test circuit provided within the housing, wherein the test circuit is structured and configured to (i) generate a current, (ii) selectively cause the current to be provided to a number of the circuit interrupters, (iii) receive an input from each of the number of circuit interrupters that is indicative of a trip signal output, and (iv) determine whether or not an error has occurred with respect to operation of each circuit interrupter based on each received input.

Assignees

• Eaton Corp
• Eaton Intelligent Power Ltd

Inventors

• Burkle Alec Dane

Classifications

• G01R31/3274

  Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance (measuring contact resistance G01R27/205) · CPC title

• G01R31/3275 Primary

  Fault detection or status indication · CPC title

• H02H7/261

  involving signal transmission between at least two stations (transmission of signals in general H02H1/0061) · CPC title

• H02H3/08

  responsive to excess current (responsive to abnormal temperature caused by excess current H02H5/04) · CPC title

• H02H7/30

  Staggered disconnection · CPC title