Electrolytic copper plating solution analyzer, and electrolytic copper plating solution analysis method

US10557819B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10557819-B2
Application numberUS-201615259734-A
CountryUS
Kind codeB2
Filing dateSep 8, 2016
Priority dateMar 11, 2014
Publication dateFeb 11, 2020
Grant dateFeb 11, 2020

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An electrolytic copper plating solution analyzer comprises an analysis container for accommodating a part of an electrolytic copper plating solution containing additives including a promoter, an inhibitor and a leveler, a working electrode immersed in the electrolytic copper plating solution accommodated in the analysis container, a reference electrode immersed in the electrolytic copper plating solution and used as a reference when a potential of the working electrode is determined, a counter electrode immersed in the electrolytic copper plating solution, a rotation drive unit for rotating the working electrode at a given speed, a current generation unit passing an electric current with a given current density between the working electrode and the counter electrode, a potential measurement unit for measuring the potential between the working electrode and the reference electrode, and an analysis unit for analyzing the relationship between an elapsed time after the current passage and the potential.

First claim

Opening claim text (preview).

What is claimed is: 1. An electrolytic copper plating solution analyzer, comprising: an analysis container for accommodating, as an analysis sample, a part of an electrolytic copper plating solution containing additives serving as a promoter and an inhibitor; a working electrode immersed in the electrolytic copper plating solution accommodated in the analysis container, the working electrode being capable of receiving and transferring electrons; a reference electrode immersed in the electrolytic copper plating solution accommodated in the analysis container and used as a reference when a potential of the working electrode is determined; a counter electrode immersed in the electrolytic copper plating solution accommodated in the analysis container; a rotation drive unit capable of rotating the working electrode at a given speed; a current generation unit capable of passing an electric current with a given current density between the working electrode and the counter electrode; a potential meter for measuring a potential between the working electrode and the reference electrode; and a computer programmed to analyze a relation between an elapsed time after passage of the current and the potential, when the relation between the elapsed time and the potential is analyzed, calculate parameters indicating a condition of the electrolytic copper plating solution based on a reaction mechanism when a Cu(I) species, the Cu(I) species being generated on a surface of the working electrode during a deposition reaction of a copper plated film and that is formed from a component of the promoter and a Cu(I) ion, is substituted for the inhibitor, the inhibitor being located on the surface of the working electrode, and when the Cu(I) species forms a complex at least with the promoter; and identify the condition of the electrolytic copper plating solution from the calculated parameters, wherein the computer is programmed to analyze the relation between the elapsed time and the potential, measured with the potential meter, based on the following equations (41) and (61) to (63) to calculate, as the parameters, i i , i a , and C a */T i η = A · T ⁡ [ ln ⁢ { i i I ⁢ exp ⁡ ( - B · I ⁢ C a * T i ⁢ t ) + i a I ⁢ { 1 - exp ⁡ ( - B · I ⁢ C a * T i ⁢ t ) } } ] ( 41 ) A = R α ⁢ ⁢ F ( 61 ) B = 1 nFd

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Classifications

  • measuring the voltage and using a constant current supply, e.g. chronopotentiometry · CPC title

  • of nickel or cobalt · CPC title

  • containing more than 50% by weight of copper · CPC title

  • G01N27/423Primary

    Coulometry · CPC title

  • Process control or regulation (controlling or regulating in general G05) · CPC title

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What does patent US10557819B2 cover?
An electrolytic copper plating solution analyzer comprises an analysis container for accommodating a part of an electrolytic copper plating solution containing additives including a promoter, an inhibitor and a leveler, a working electrode immersed in the electrolytic copper plating solution accommodated in the analysis container, a reference electrode immersed in the electrolytic copper platin…
Who is the assignee on this patent?
Toppan Printing Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01N27/423. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 11 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).