Semiconductor device and electronic device
US-2025280531-A1 · Sep 4, 2025 · US
US10546158B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10546158-B2 |
| Application number | US-201514827700-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 17, 2015 |
| Priority date | Dec 4, 2014 |
| Publication date | Jan 28, 2020 |
| Grant date | Jan 28, 2020 |
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Official abstract text for this publication.
A function generator provides a first signal unit for the delivery of a first signal at a first output. The function generator provides a second signal unit for the delivery of a second signal at a second output. The function generator provides a calibration unit for the generation of a test signal, wherein the test signal can be supplied to the first signal unit and/or to the second signal unit. A comparison unit is connected downstream of the first signal unit and/or the second signal unit. The comparison unit compares the test signal delivered at the first output and/or at the second output with a calibration signal, wherein the output signal of the comparison unit can be supplied to the calibration unit.
Opening claim text (preview).
What is claimed is: 1. A function generator for the delivery of electrical signals, comprising: a first digital to analog converter and downstream analog circuit elements configured to deliver a first signal at a first output and a programmable integrated circuit configured to deliver a second signal at a second output, wherein the programmable integrated circuit is digital, and the second signal is a digital signal, and wherein an input is configured to receive signal values to supply the digital signals, a calibration circuit comprising a phase shifter configured to evaluate a phase angle value and a buffer configured to generate a test signal, wherein the test signal can be supplied to the first digital to analog converter and/or to the programmable integrated circuit, and the buffer is further configured to store the phase angle value, wherein the calibration circuit is configured to provide an adjustable time coherence of the first signal at the first output to the second signal at the second output, a comparator comprising a comparator circuit or an AND gate, a low pass filter and a second digital-analog converter connected downstream of the first digital to analog converter and/or the programmable integrated circuit, wherein the comparator is configured to compare the test signal delivered at the first output and/or at the second output with a calibration signal, and wherein an output signal of the comparator is configured to supply the calibration circuit. 2. The function generator according to claim 1 , wherein the first signal is an analog signal. 3. The function generator according to claim 1 , wherein the first digital to analog converter or the programmable integrated circuit comprises the calibration circuit. 4. The function generator according to claim 1 , wherein the calibration circuit comprises a phase shifter, so that the phase angle of the first signal and/or of the second signal is adjustable. 5. The function generator according to claim 1 , wherein the calibration circuit is configured to register a maximal DC component of the output signal of the comparator and, upon registration of the maximal DC component of the output signal, a phase angle of the test signal agrees with a phase angle of the calibration signal. 6. The function generator according to claim 1 , wherein the calibration signal can be supplied to the function generator as an external signal. 7. A system comprising a measuring instrument and a device under test, wherein the measuring instrument provides the function generator according to claim 1 , and wherein the first signal and the second signal of the function generator are supplied to the device under test at the same time. 8. The system according to claim 7 , wherein the first signal and the second signal of the function generator are supplied to the device under test only when a phase-angle value between the first signal and the second signal corresponds to a defined phase-angle value. 9. The system according to claim 7 , wherein the first signal is an analog signal. 10. A method for the delivery of electrical signals through a function generator, wherein the function generator is set up to deliver at least one first signal by a digital to analog converter and downstream analog circuit elements and a second signal by a programmable integrated circuit, wherein the second signal is a digital signal, comprising: receiving signal values to supply the digital signals by an input; generating of a test signal by a calibration circuit comprising a phase shifter configured to evaluate a phase angle value, and a buffer in the function generator, wherein the calibration circuit is configured to provide an adjustable time coherence of the first signal at the first output to the second signal at the second output; comparing of the test signal supplied to the digital to analog converter or to the programmable integrated circuit by a comparator connected downstream of the digital to analog converter or the programmable integrated circuit with a calibration signal; time displacing of the test signal, so that the phase-angle value of the test signal is varied relative to the calibration signal; and storing the phase angle value in the buffer. 11. The method according to claim 10 , wherein the time-displacement is determined by: loading of a current phase-angle value from a buffer; variation of the current phase-angle value; and buffering of the varied phase-angle value in the buffer.
Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title
Arbitrary function generators (using orthogonal functions, e.g. Fourier series, G06G7/19) · CPC title
Calibration · CPC title
involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference · CPC title
Hybrid computing arrangements · CPC title
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