Manufacturing method of semiconductor device having magnetic substance film

US10529918B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10529918-B2
Application numberUS-201615263942-A
CountryUS
Kind codeB2
Filing dateSep 13, 2016
Priority dateSep 16, 2015
Publication dateJan 7, 2020
Grant dateJan 7, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

There is provided a semiconductor device manufacturing method which includes: loading a substrate with a magnetic substance film formed thereon into a process container; regulating an internal pressure of the process container to a first pressure lower than an atmospheric pressure; regulating the internal pressure of the process container from the first pressure to a second pressure higher than the first pressure; and magnetizing the magnetic substance film by applying a magnetic field to the magnetic substance film under the second pressure.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor device manufacturing method comprising: loading a substrate with a magnetic substance film formed thereon into a process container of a magnetic annealing apparatus, the substrate being arranged in a direction selected between a vertical posture or a horizontal posture in the process container; regulating an internal pressure of the process container to a first pressure that is lower than an atmospheric pressure; regulating the internal pressure of the process container from the first pressure to a second pressure that is higher than the first pressure; and magnetizing the magnetic substance film in the process container of the magnetic annealing apparatus by applying a magnetic field to the magnetic substance film under the second pressure such that when the substrate is arranged in the vertical posture, the magnetic substance film of the substrate is magnetized in a direction perpendicular to the magnetic substance film, and when the substrate is arranged in the horizontal posture, the magnetic substance film of the substrate is magnetized in a direction parallel with the magnetic substance film, wherein the regulating the internal pressure of the process container from the first pressure to the second pressure includes regulating a temperature of the substrate and the magnetic field within the process container, and wherein the magnetizing the magnetic substance film is performed under a condition of the second pressure, the temperature of the substrate and the magnetic field within the process container which are regulated in the regulating the internal pressure of the process container from the first pressure to the second pressure. 2. The semiconductor device manufacturing method of claim 1 , wherein the second pressure falls within a range of 0.1 Pa to 100 kPa. 3. The semiconductor device manufacturing method of claim 1 , wherein the second pressure falls within a range of 100 Pa to 100 kPa. 4. The semiconductor device manufacturing method of claim 1 , wherein the step of magnetizing includes applying the magnetic field to the magnetic substance film while heating the magnetic substance film. 5. The semiconductor device manufacturing method of claim 1 , wherein the step of magnetizing includes supplying an inert gas into the process container. 6. The semiconductor device manufacturing method of claim 1 , wherein the step of loading includes loading the substrate into the process container while vertically holding the substrate by a substrate holder. 7. The semiconductor device manufacturing method of claim 1 , wherein the step of loading includes loading the substrate into the process container while horizontally holding the substrate by a substrate holder. 8. The semiconductor device manufacturing method of claim 1 , wherein the first pressure is within a range from 100 μPa to less than 0.1 Pa.

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Classifications

  • with electromagnetic fields acting directly on the material being heated · CPC title

  • Forming or maintaining special atmospheres or vacuum within heating chambers (supplying steam, vapour, gases or liquids F27D7/02) · CPC title

  • adapted for treating the charge in vacuum or special atmosphere · CPC title

  • F27B3/08Primary

    heated electrically, with or without any other source of heat · CPC title

  • Arrangement of monitoring devices; Arrangement of safety devices · CPC title

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What does patent US10529918B2 cover?
There is provided a semiconductor device manufacturing method which includes: loading a substrate with a magnetic substance film formed thereon into a process container; regulating an internal pressure of the process container to a first pressure lower than an atmospheric pressure; regulating the internal pressure of the process container from the first pressure to a second pressure higher than…
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification F27B3/08. Mapped technology areas include Mechanical Engineering.
When was this patent published?
Publication date Tue Jan 07 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).