Method and device for severing a microchip from a wafer and arranging the microchip on a substrate

US10497589B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10497589-B2
Application numberUS-201715558859-A
CountryUS
Kind codeB2
Filing dateJan 23, 2017
Priority dateJan 29, 2016
Publication dateDec 3, 2019
Grant dateDec 3, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Method and device for severing a microchip from a wafer and arranging the microchip on a substrate, wherein the microchip is contact-bonded to the free end of a tip during severing and accordingly adheres to the tip through adhesive force while the substrate is transported. A coordinate measuring machine can advantageously be used as device.

First claim

Opening claim text (preview).

What is claimed is: 1. Method for severing a microchip from a carrier body of a wafer and arranging the microchip on a substrate, wherein the microchip is connected to the carrier body inside a cutout of the carrier body by a plurality of retaining tabs, comprising the following method steps: arranging the wafer on a rigid base; arranging a tip of a handling device above the microchip; moving the tip downward towards the microchip, wherein shear forces and/or bending forces act on the retaining tabs while the tip contacts the microchip and these retaining tabs are broken so that the microchip is severed from the carrier body, wherein a contact bonding process is initiated when the tip contacts the microchip so that the microchip which is severed from the carrier body is held at the tip by an adhesive force, and is transported to the substrate and deposited thereon. 2. Method for severing a microchip from a carrier body of a wafer and arranging the microchip on a substrate according to claim 1 , further comprising applying voltage to the tip so that electrostatic forces reinforcing the contact bonding process are generated. 3. Method for severing a microchip from a carrier body of a wafer and arranging the microchip on a substrate according to claim 1 , further comprising initiating an additional contact bonding process when the microchip contacts the substrate, wherein the adhesive force which is brought about between the substrate and the microchip is greater than the adhesive force between the tip and the microchip so that the microchip adheres to the substrate by adhesive force after the tip is lifted from the substrate. 4. Method for severing a microchip from a carrier body of a wafer and arranging the microchip on a substrate according to claim 3 , wherein said voltage is applied to the substrate so that electrostatic forces reinforcing the contact bonding process are generated. 5. Method for severing a microchip from a carrier body of a wafer and arranging the microchip on a substrate according to claim 1 , wherein the microchip contacts the tip starting from its center point as the tip moves into full contact with the microchip. 6. Method for severing a microchip from a carrier body of a wafer and arranging the microchip on a substrate according to claim 3 , further comprising generating laser-induced metal deposition, which forms a metal bead at an edge of the microchip adhering to the substrate so that the microchip is permanently connected to the substrate.

Assignees

Inventors

Classifications

  • incorporating electrostatic or magnetic grippers · CPC title

  • Apparatus for placing on an insulating substrate, e.g. tape · CPC title

  • using electrostatic chucks · CPC title

  • Apparatus therefor · CPC title

  • Connecting or disconnecting · CPC title

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Frequently asked questions

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What does patent US10497589B2 cover?
Method and device for severing a microchip from a wafer and arranging the microchip on a substrate, wherein the microchip is contact-bonded to the free end of a tip during severing and accordingly adheres to the tip through adhesive force while the substrate is transported. A coordinate measuring machine can advantageously be used as device.
Who is the assignee on this patent?
Jenoptik Optical Sys Gmbh
What technology area does this patent fall under?
Primary CPC classification H10P72/0446. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Dec 03 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 11 related publications on this page (citations in our corpus or others sharing the same primary CPC).