Methods for manufacturing well structures for low-noise chemical sensors
US-9841398-B2 · Dec 12, 2017 · US
US10386328B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10386328-B2 |
| Application number | US-201715700630-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 11, 2017 |
| Priority date | Sep 9, 2016 |
| Publication date | Aug 20, 2019 |
| Grant date | Aug 20, 2019 |
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In one embodiment, a chemical sensor is described. The chemical sensor includes a chemically-sensitive field effect transistor including a floating gate conductor having an upper surface, a first opening extending through a first material and through a portion of a second material located on the first material and a second opening extending from the bottom of the first opening to the top of a liner layer located on the upper surface of the floating gate conductor.
Opening claim text (preview).
What is claimed is: 1. A method for manufacturing a chemical sensor, the method comprising: forming a chemically-sensitive field effect transistor including a floating gate conductor having an upper surface; forming a metal layer on the upper surface; forming a first material over the floating gate conductor and the metal layer, the first material comprising an insulator; forming a first opening in the first material extending from the upper surface of the first material to the metal layer by anisotropically etching a portion of the first material to the metal layer; filling the first opening with a filler material including tungsten, titanium, or tantalum, the filler in direct contact with the first material; depositing a second material on the surface of the first material and the filler material; forming a second opening extending through the second material and a portion of the first material by etching the second material and a portion of the first material below a top surface of the filler material to expose the filler material in a void left by the etched portion of the first material; and removing the filler material from the first opening. 2. The method of claim 1 , further comprising: forming a liner layer on the metal layer prior to forming an opening in the first material. 3. The method of claim 2 , wherein the liner layer includes titanium nitride. 4. The method of claim 1 , wherein the insulator includes an oxide. 5. The method of claim 1 , wherein the second material includes a dielectric material. 6. The method of claim 5 , wherein the dielectric material includes a nitride or oxide of silicon. 7. The method of claim 1 , wherein the forming the second opening includes etching the first material and the second material during the same etch step. 8. The method of claim 1 , wherein the second opening is a well. 9. The method of claim 1 , wherein forming the second opening includes forming an opening having a larger area than the area of the first opening.
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