Method for sensing memory element coupled to selector device

Patent metadata

Field	Value
Publication number	US-10153017-B2
Application number	US-201615264847-A
Country	US
Kind code	B2
Filing date	Sep 14, 2016
Priority date	Sep 14, 2016
Publication date	Dec 11, 2018
Grant date	Dec 11, 2018

Abstract

The present invention is directed to a method for sensing the resistance state of a memory cell that includes an MTJ memory element coupled to a two-terminal selector element in series. The method includes the steps of raising a cell voltage across the memory cell above a threshold voltage for the selector element to become conductive; decreasing the cell voltage to a first sensing voltage and measuring a first sensing current passing through the memory cell, the selector element being nominally conductive irrespective of the resistance state of the MTJ memory element at the first sensing voltage; and further decreasing the cell voltage to a second sensing voltage and measuring a second sensing current, the selector element being nominally conductive if the MTJ memory element is in the low resistance state or nominally insulative if the MTJ memory element is in the high resistance state at the second sensing voltage.

First claim

What is claimed is:

1. A method for sensing a resistance state of a magnetic tunnel junction (MTJ) memory element in a magnetic memory cell that further includes a two-terminal selector element coupled to the MTJ memory element in series, the MTJ memory element having a high resistance mode and a low resistance mode, the two-terminal selector element having an on-state that is conductive and an off-state that is insulative, the method comprising the steps of:
turning on the selector element by raising a cell voltage across the magnetic memory cell above a threshold voltage for the selector element to become conductive;
decreasing the cell voltage to a first sensing voltage and measuring a first sensing current passing through the magnetic memory cell, the two-terminal selector element being conductive irrespective of the resistance state of the MTJ memory element at the first sensing voltage; and
further decreasing the cell voltage to a second sensing voltage and measuring a second sensing current passing through the magnetic memory cell, the two-terminal selector element being conductive if the MTJ memory element is in the low resistance mode or insulative if the MTJ memory element is in the high resistance mode at the second sensing voltage, calculating a difference between the first sensing current and the second sensing current;
comparing the difference to a reference value;
concluding the MTJ memory element is in the high resistance mode if the difference is greater than the reference value; and
concluding the MTJ memory element is in the low resistance mode if the difference is less than the reference value.

2. A method for sensing a resistance state of a magnetic tunnel junction (MTJ) memory element in a magnetic memory cell that further includes a two-terminal selector element coupled to the MTJ memory element in series, the MTJ memory element having a high resistance mode and a low resistance mode, the two-terminal selector element having an on-state that is conductive and an off-state that is insulative, the method comprising the steps of:
turning on the selector element by raising a cell voltage across the magnetic memory cell above a threshold voltage for the selector element to become conductive;
decreasing the cell voltage to a first sensing voltage and measuring a first sensing current passing through the magnetic memory cell, the two-terminal selector element being conductive irrespective of the resistance state of the MTJ memory element at the first sensing voltage; and
further decreasing the cell voltage to a second sensing voltage and measuring a second sensing current passing through the magnetic memory cell, the two-terminal selector element being conductive if the MTJ memory element is in the low resistance mode or insulative if the MTJ memory element is in the high resistance mode at the second sensing voltage, calculating a slope between a first point defined by the first sensing voltage and the first sensing current and a second point defined by the second sensing voltage and the second sensing current;
comparing the slope to a reference slope value;
concluding the MTJ memory element is in the high resistance mode if the slope is greater than the reference slope value; and
concluding the MTJ memory element is in the low resistance mode if the slope is less than the reference slope value.

3. The method claim 1 , further comprising the step of measuring a third sensing current at a third sensing voltage between the first and second sensing voltages.

4. The method claim 1 , further comprising the steps of measuring multiple sensing currents at multiple sensing voltage between the first and second sensing voltages.

5. The method of claim 1 , wherein a resistance ratio of the high resistance mode to the low resistance mode of the MTJ memory element is between 2 to 4.

6. The method of claim 1 , wherein a resistance ratio of the high resistance mode to the low resistance mode of the MTJ memory element is between 1.5 to 5.

7. The method of claim 1 , wherein the MTJ memory element includes:
a magnetic free layer having a variable magnetization direction perpendicular to a layer plane thereof;
a magnetic reference layer having a first invariable magnetization direction perpendicular to a layer plane thereof;
a tunnel junction layer interposed between the magnetic free layer and the magnetic reference layer;
a magnetic fixed layer having a second invariable magnetization direction opposite to the first invariable magnetization direction; and
an anti-ferromagnetic coupling layer interposed between the magnetic reference layer and the magnetic fixed layer.

8. The method claim 2 , further comprising the step of measuring a third sensing current at a third sensing voltage between the first and second sensing voltages.

9. The method claim 2 , further comprising the steps of measuring multiple sensing currents at multiple sensing voltage between the first and second sensing voltages.

10. The method of claim 2 , wherein a resistance ratio of the high resistance mode to the low resistance mode of the MTJ memory element is between 2 to 4.

11. The method of claim 2 , wherein a resistance ratio of the high resistance mode to the low resistance mode of the MTJ memory element is between 1.5 to 5.

12. The method of claim 2 , wherein the MTJ memory element includes:
a magnetic free layer having a variable magnetization direction perpendicular to a layer plane thereof;
a magnetic reference layer having a first invariable magnetization direction perpendicular to a layer plane thereof;
a tunnel junction layer interposed between the magnetic free layer and the magnetic reference layer;
a magnetic fixed layer having a second invariable magnetization direction opposite to the first invariable magnetization direction; and
an anti-ferromagnetic coupling layer interposed between the magnetic reference layer and the magnetic fixed layer.

Assignees

• Avalanche Technology Inc

Inventors

• Yang Hongxin
• Wang Xiaobin
• Zhang Jing
• Hao Xiaojie
• Wang Zihui
• Satoh Kimihiro

Classifications

• H01L43/02

  Electricity · mapped topic

• G11C11/1659

  Cell access · CPC title

• H01L27/224

  Electricity · mapped topic

• G11C11/161

  details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell · CPC title

• G11C11/1673 Primary

  Reading or sensing circuits or methods · CPC title