Surface defect inspecting device and method for hot-dip coated steel sheets

Patent metadata

Field	Value
Publication number	US-10041888-B2
Application number	US-201715717703-A
Country	US
Kind code	B2
Filing date	Sep 27, 2017
Priority date	Mar 31, 2015
Publication date	Aug 7, 2018
Grant date	Aug 7, 2018

Abstract

A surface defect inspecting device for hot-dip coated steel sheets comprising: an illuminating unit for illuminating an imaging target portion on a hot-dip coated steel sheet; a specular reflection light imaging unit for imaging specular reflection light from the imaging target portion; a diffuse reflection light imaging unit for imaging diffuse reflection light from the imaging target portion; and an image signal processing unit for processing specular reflection image and diffuse reflection image signals, the specular and diffuse reflection light imaging units simultaneously imaging light reflected from the imaging target region, the image signal processing unit extracting a portion having brightness level lower than a predetermined threshold, as a defect portion, from the specular reflection image signal, and threshold processing the diffuse reflection image signal, with respect to a portion corresponding to an extracted defect portion, to determine a defect type by classifying the extracted defect portion.

First claim

What is claimed is:

1. A surface defect inspecting device for hot-dip coated steel sheets, comprising:
an illuminating unit having a light source configured to illuminate an imaging target portion, with light of the light source, on a surface of a hot-dip coated steel sheet;
a specular reflection light imaging unit having a first light receiver configured to image specular reflection light reflected from the imaging target portion, which is received by the first light receiver;
a diffuse reflection light imaging unit having a second light receiver configured to image diffuse reflection light reflected from the imaging target portion, which is received by the second light receiver; and
an image signal processor configured to process a specular reflection image signal acquired by the specular reflection light imaging unit as a result of performing imaging and a diffuse reflection image signal acquired by the diffuse reflection light imaging unit as a result of performing imaging, so that a first defect type and a second defect type, whose diffuse reflection light is lower in brightness level than diffuse reflection light of a base texture when a diffuse reflection angle falls within a predetermined angle-difference range with respect to a specular reflection angle, and is higher in brightness level than diffuse reflection light of a base texture when a diffuse reflection angle falls outside a predetermined angle-difference range with respect to a specular reflection angle, are classified, wherein
the specular reflection light imaging unit and the diffuse reflection light imaging unit simultaneously image light reflected from the imaging target region, wherein,
the diffuse reflection angle of the diffuse reflection light imaged by the diffuse reflection light imaging unit is an angle, in accordance with which a brightness level of reflection light from the first defect type as a reflection surface is higher, and a brightness level of reflection light from the second defect type as a reflection surface is lower, in comparison with a reference level defined as a brightness level of reflection light from the base texture as a reflection surface, and wherein
the image signal processor
extracts a portion having brightness level lower than a predetermined threshold, as a surface defect portion, from the specular reflection image signal acquired by the specular reflection light imaging unit as a result of performing imaging, and
threshold processes, through the use of brightness level of reflection light from the base texture as a threshold, the diffuse reflection image signal acquired by the diffuse reflection light imaging unit as a result of performing imaging, with respect to a portion corresponding to an extracted surface defect portion, so as to determine a defect type, by classifying the extracted surface defect portion, as the first defect type and the second defect type.

2. The surface defect inspecting device for hot-dip coated steel sheets according to claim 1 , wherein
the image signal processor
calculates a shift average value of the diffuse reflection image signal acquired by the diffuse reflection light imaging unit as a result of performing imaging of a base texture, and
applies a calculated shift average value, as a threshold for threshold processing, to determining a portion having brightness level higher than the threshold as the first defect type, and a portion having brightness level lower than the threshold as the second defect type.

3. A surface defect inspecting method for hot-dip coated steel sheets, comprising the steps of:
Illuminating, by an illuminating unit having a light source, a surface of a hot-dip coated steel sheet;
imaging specular reflection light and diffuse reflection light reflected from an imaging target portion on the hot-dip coated steel sheet by a specular reflection light imaging unit having a first light receiver and a diffuse reflection light imaging unit having a second light receiver, respectively; and
processing, by an image signal processor, a specular reflection image signal and a diffuse reflection image signal acquired as a result of performing imaging, respectively, thereby classifying a first defect type and a second defect type, whose diffuse reflection light is lower in brightness level than diffuse reflection light of a base texture when a diffuse reflection angle falls within a predetermined angle-difference range with respect to a specular reflection angle, and is higher in brightness level than diffuse reflection light of a base texture when a diffuse reflection angle falls outside a predetermined angle-difference range with respect to a specular reflection angle, wherein
in a step of said imaging by the specular reflection light imaging unit and the diffuse reflection light imaging unit, the specular reflection light and the diffuse reflection light reflected from the imaging target portion are simultaneously imaged, and wherein,
the diffuse reflection angle of an imaged diffuse reflection light, in accordance with which a brightness level of reflection light from the first defect type as a reflection surface is higher, and a brightness level of reflection light from the second defect type as a reflection surface is lower, in comparison with a reference level defined as a brightness level of reflection light from the base texture as a reflection surface, and wherein
in a step of said processing by the image signal processor, a portion having brightness level lower than a predetermined threshold is extracted, as a surface defect portion, from the specular reflection image signal acquired as a result of performing imaging, and the diffuse reflection image signal acquired as a result of performing imaging is threshold processed through the use of brightness level of reflection light from the base texture as a threshold, with respect to a portion corresponding to an extracted surface defect portion, so that a defect type is determined, by classifying the extracted surface defect portion, as the first defect type and the second defect type.

4. The surface defect inspecting method for hot-dip coated steel sheets according to claim 3 , wherein
in a step of said processing by the image signal processor, a shift average value of the diffuse reflection image signal acquired as a result of performing imaging of a base texture is calculated, and a calculated shift average value is applied, as a threshold for threshold processing, to determining a portion having brightness level higher than the threshold as the first defect type, and a portion having brightness level lower than the threshold as the second defect type.

Assignees

• Nisshin Steel Co Ltd

Inventors

• Fukui Keita
• Shiga Syunsuke

Classifications

• G01N33/208

  Coatings, e.g. platings · CPC title

• G01N33/2045

  Defects · CPC title

• G01N21/4738

  Diffuse reflection (precedence is given to G01N21/55 - G01N21/57 if specular component is taken into consideration), e.g. also for testing fluids, fibrous materials · CPC title

• G01N2021/8825

  Separate detection of dark field and bright field · CPC title

• G01N2021/8918

  Metal · CPC title