Automatic optical inspection device and method
US-2019293566-A1 · Sep 26, 2019 · US
Separate detection of dark field and bright field
Separate detection of dark field and bright field · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N2021/8825 |
| Official title | {Separate detection of dark field and bright field} |
| Display label | Separate detection of dark field and bright field |
| Total patents | 147 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly growing.
| Year | Patents |
|---|---|
| 2015 | 12 |
| 2016 | 6 |
| 2017 | 17 |
| 2018 | 12 |
| 2019 | 17 |
| 2020 | 16 |
| 2021 | 10 |
| 2022 | 6 |
| 2023 | 11 |
| 2024 | 13 |
| 2025 | 25 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Compositions and methods for prognosing and treating colorectal cancer
US-2019269716-A1 · Sep 5, 2019 · US
Defect observation method and device and defect detection device
US-10401300-B2 · Sep 3, 2019 · US
Optical contrast enhancement for defect inspection
US-2019251686-A1 · Aug 15, 2019 · US
Apparatus and A Method For Inspecting A Light Transmissible Optical Component
US-2019226997-A1 · Jul 25, 2019 · US
Systems and Methods for Defect Material Classification
US-2019212277-A1 · Jul 11, 2019 · US
Surface inspection system and surface inspection method
US-2019154578-A1 · May 23, 2019 · US
System and method for multiple mode inspection of a sample
US-10295476-B1 · May 21, 2019 · US
Defect inspection device, pattern chip, and defect inspection method
US-2019107498-A1 · Apr 11, 2019 · US
Systems and methods for defect material classification
US-10234402-B2 · Mar 19, 2019 · US
Methods of defect inspection
US-2019064675-A1 · Feb 28, 2019 · US
System for inspecting a backside of a wafer
US-10215707-B2 · Feb 26, 2019 · US
Defect detection device and defect detection method
US-2019011374-A1 · Jan 10, 2019 · US
Flexible mode scanning optical microscopy and inspection system
US-2018329189-A1 · Nov 15, 2018 · US
Surface defect inspecting device and method for hot-dip coated steel sheets
US-10041888-B2 · Aug 7, 2018 · US
Optical Inspection System
US-2018213134-A1 · Jul 26, 2018 · US
Optical method and system for defects detection in three-dimensional structures
US-10018574-B2 · Jul 10, 2018 · US
Systems and Methods for Defect Material Classification
US-2018188188-A1 · Jul 5, 2018 · US
System, method and non-transitory computer readable medium for tuning sensitivies of, and determinng a process window for, a modulated wafer
US-2018144996-A1 · May 24, 2018 · US
Apparatus and a method for inspecting a light transmissive optical component
US-9970884-B1 · May 15, 2018 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N2021/8825?
- CPC G01N2021/8825 is the Cooperative Patent Classification code for “Separate detection of dark field and bright field.”
- How many patents are filed under CPC G01N2021/8825 (Separate detection of dark field and bright field)?
- Our database includes 147 publications tagged with this CPC code.
- Is patent activity under CPC G01N2021/8825 growing?
- Publication counts under this code: 13 in 2024 vs 25 in 2025 (latest complete years).