Method for flattening sample in optical metrology

Patent metadata

Field	Value
Publication number	US-10006839-B2
Application number	US-201615060385-A
Country	US
Kind code	B2
Filing date	Mar 3, 2016
Priority date	Mar 13, 2013
Publication date	Jun 26, 2018
Grant date	Jun 26, 2018

Abstract

A vacuum mechanism for flattening bowed panel samples includes a support structure with coplanar support elements and a fixture with a movable component actuated by a vacuum source. The movable component has a top surface disposed above the support elements when no vacuum is applied and is capable of being drawn to a substantially coplanar position with the support elements when actuated by the vacuum source. The top surface is fluidly connected to the vacuum source and adapted to adhere to the overlaying surface of the sample when vacuum is applied, thereby flattening the sample when the movable component is drawn in by the same vacuum source.

First claim

What is claimed is:

1. A method for removing a bowed area from a panel sample, comprising the following steps:
supporting the bowed area of the panel sample with support elements;
providing a fixture with a movable component actuated by a vacuum source, the movable component having a top surface disposed above said support elements when no vacuum is applied and being drawn to a substantially coplanar position with said support elements when actuated by the vacuum source, said top surface being fluidly connected to the vacuum source and adapted to adhere to an overlaying surface of said bowed area of the panel sample when vacuum is applied; and
operating said vacuum source to apply suction to said overlaying surface of the bowed area of the panel sample and to actuate the movable component to draw the bowed area to said substantially coplanar position with the support elements.

2. The method of claim 1 , wherein said support elements include an outer frame and a plurality of coplanar beams, said outer frame including clamping means for retaining the panel sample during a measurement.

3. The method of claim 1 , wherein said movable component is a piston slidably connected to a housing.

4. The method of claim 3 , wherein said vacuum source is fluidly connected to the top surface of the piston through an interior compartment of the housing.

5. The method of claim 3 , further including the step of urging said piston upward with a spring-loaded mechanism.

6. The method of claim 5 , further including the step of limiting a maximum extension of said spring-loaded mechanism with a device coupled to the piston.

7. The method of claim 1 , wherein said top surface of the movable component includes an O-ring.

8. The method of claim 1 , wherein said top surface of the movable component includes a polytetrafluoroethylene material.

9. The method of claim 1 , wherein said support elements comprise an outer frame and a plurality of coplanar beams, said outer frame including clamping means for retaining the panel sample during a measurement; said movable component is a piston slidably connected to a housing; said top surface of the piston includes a polytetrafluoroethylene material and an O-ring; said vacuum source is fluidly connected to the top surface of the piston through an interior compartment of the housing; and the method further includes the steps of urging the piston upward with a spring-loaded mechanism and of limiting a maximum extension of the spring-loaded mechanism with a device coupled to the piston.

Assignees

• Guenther Bryan
• Bruker Nano Inc

Inventors

• Guenther Bryan

Classifications

• F04B53/14

  Pistons, piston-rods or piston-rod connections · CPC title

• F04B37/10

  for special use (for evacuating by absorption or adsorption F04B37/02; for evacuating by thermal means F04B37/06) · CPC title

• B30B1/38 Primary

  wherein the plungers are operated by pressure of a gas, e.g. steam, air · CPC title

• G01N1/286 Primary

  involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising (microtomes G01N1/06; pulverising in general B02C; mixing in general B01F) · CPC title

• G01B9/02

  Interferometers · CPC title