Nanotube Electronics Templated Self-Assembly
US-2015342059-A1 · Nov 26, 2015 · US
US10006123B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10006123-B2 |
| Application number | US-201615151203-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 10, 2016 |
| Priority date | May 10, 2016 |
| Publication date | Jun 26, 2018 |
| Grant date | Jun 26, 2018 |
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A method for chemical vapor deposition on a substrate is disclosed. The method may include directing a process gas into a reaction chamber, and heating the process gas in the reaction chamber. Heating the process gas in the reaction chamber may decompose the process gas to thereby generate a plurality of decomposition products. The method may also include applying one or more biasing fields and/or waves to the process gas upstream of the substrate, and reacting the process gas with the substrate. The one or more biasing fields and/or waves may include electromagnetic waves, electric fields, and/or magnetic fields. The biasing fields and/or waves may urge at least a portion of the process gas towards or away from the substrate.
Opening claim text (preview).
What is claimed is: 1. A method for chemical vapor deposition on a substrate, comprising: directing a process gas into a reaction chamber; decomposing the process gas in the reaction chamber to form a decomposition product in the process gas; applying one or more biasing fields and/or waves to the process gas laterally adjacent and upstream of the substrate such that the fields and/or waves urge at least a portion of the process gas away from the substrate; reacting the decomposition product of the process gas with a surface of the substrate to deposit a product on the surface, wherein the one or more biasing fields and/or waves are applied in a direction substantially perpendicular to the surface of the substrate, wherein the one or more biasing fields and/or waves comprise a magnetic field, an electromagnetic wave, or combinations thereof. 2. The method of claim 1 , wherein the biasing fields and/or waves further comprises an electric field. 3. The method of claim 1 , wherein the biasing fields and/or waves apply a biasing force to at least a portion of the process gas. 4. The method of claim 3 , wherein decomposing of the process gas produces a plurality of decomposition products, and the biasing force urges at least one of the plurality of decomposition products away from the substrate. 5. The method of claim 1 , wherein the one or more biasing fields and/or waves consists of an electric field and at least one of a magnetic field or an electromagnetic wave. 6. A method for a chemical vapor deposition on a substrate, comprising: directing a process gas into a reaction chamber of a chemical vapor deposition system; decomposing the process gas in the reaction chamber with a furnace disposed about the reaction chamber to form a decomposition product in the process gas; urging the decomposition product of the process gas towards or away from the substrate by applying one or more biasing fields and/or waves to the process gas upstream of the substrate; and reacting the decomposition product of the process gas with a surface of the substrate to deposit a product on the surface of the substrate, wherein reacting the decomposition product with the surface of the substrate to deposit the product on the surface of the substrate comprises facilitating a reaction between the decomposition product and the substrate with a catalyst deposited on the substrate, wherein the one or more biasing fields and/or waves are applied in a direction substantially perpendicular to the surface of the substrate, and wherein the one or more biasing fields and/or waves comprise a magnetic field, an electromagnetic wave, or combinations thereof. 7. The method of claim 6 , wherein the biasing fields and/or waves further comprises an electric field. 8. The method of claim 6 , wherein the process gas comprises an impurity, and the biasing fields and/or waves urge the impurity away from the substrate. 9. The method of claim 6 , wherein decomposing of the process gas produces a plurality of decomposition products, and the biasing force urges at least one of the plurality of decomposition products away from the substrate. 10. The method of claim 6 , wherein decomposing of the process gas produces a plurality of decomposition products, and the biasing force urges at least one of the plurality of decomposition products towards the substrate. 11. The method of claim 6 , further comprising varying an intensity of the biasing fields and/or waves applied to the process gas. 12. The method of claim 6 , wherein the one or more biasing fields and/or waves consists of an electric field and at least one of a magnetic field or an electromagnetic wave. 13. The method of claim 6 , wherein the one or more biasing fields and/or waves are applied to the process gas at a position laterally adjacent and upstream to the surface of the substrate. 14. The method of claim 6 , wherein the one or more biasing fields and/or waves consists of a magnetic field or an electromagnetic wave.
characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber · CPC title
characterised by the method used for heating the substrate (C23C16/48, C23C16/50 take precedence) · CPC title
by irradiation, e.g. photolysis, radiolysis, particle radiation · CPC title
characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials · CPC title
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