Structure estimation system and structure estimation program for estimating height of structure based on data from charged particle beam device
US-12561823-B2 · Feb 24, 2026 · US
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Yumiba Ryou patents
Yumiba Ryou is listed as an inventor on 18 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Yumiba Ryou |
| Total patents | 18 |
| First publication | Nov 10, 2015 |
| Latest publication | Feb 24, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Image processing program, image processing device, and image processing method
US-12394038-B2 · Aug 19, 2025 · US
Measurement system, method for generating learning model to be used when performing image measurement of semiconductor including predetermined structure, and recording medium for storing program for causing computer to execute processing for generating learning model to be used when performing image measurement of semiconductor including predetermined structure
US-12198327-B2 · Jan 14, 2025 · US
Image Processing Program, Image Processing Device, and Image Processing Method
US-2024404043-A1 · Dec 5, 2024 · US
Image recognition device and method
US-12014530-B2 · Jun 18, 2024 · US
Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device
US-11791130-B2 · Oct 17, 2023 · US
Image Processing Program, Image Processing Device, and Image Processing Method
US-2022318975-A1 · Oct 6, 2022 · US
Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure
US-2022277434-A1 · Sep 1, 2022 · US
Structure Estimation System and Structure Estimation Program
US-2022130027-A1 · Apr 28, 2022 · US
Electron Beam Observation Device, Electron Beam Observation System, and Image Correcting Method and Method for Calculating Correction Factor for Image Correction in Electron Beam Observation Device
US-2022051868-A1 · Feb 17, 2022 · US
Recent patents
Latest publications not already listed above.
Image recognition device and method
US-2021374403-A1 · Dec 2, 2021 · US
Electron beam observation device, electron beam observation system, and control method of electron beam observation device
US-11170969-B2 · Nov 9, 2021 · US
Electron beam observation device, electron beam observation system, and control method of electron beam observation device
US-2021125806-A1 · Apr 29, 2021 · US
Calibration device
US-10638115-B2 · Apr 28, 2020 · US
Object recognition device and object recognition system
US-10540777-B2 · Jan 21, 2020 · US
Object Recognition Device and Object Recognition System
US-2018165828-A1 · Jun 14, 2018 · US
Calibration device
US-2017289526-A1 · Oct 5, 2017 · US
People counting device and people trajectory analysis device
US-9183432-B2 · Nov 10, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi High Tech Corp | 13 |
| Hitachi Ltd | 5 |
| Hitachi Industry & Control Solutions Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 9 |
| G06T2207/20081 | 7 |
| G06T7/00 | 7 |
| G06T2207/20084 | 7 |
| G06V10/82 | 6 |