Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall
US-2024290592-A1 · Aug 29, 2024 · US
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Willwerth Michael David patents
Willwerth Michael David is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Willwerth Michael David |
| Total patents | 3 |
| First publication | Dec 16, 2021 |
| Latest publication | Aug 29, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall
US-12009191-B2 · Jun 11, 2024 · US
Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall
US-2021391157-A1 · Dec 16, 2021 · US
Recent patents
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Inc | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/238 | 3 |
| H10P74/203 | 3 |
| H01J37/32963 | 3 |
| H01J2237/24585 | 3 |
| G01B11/0625 | 3 |