Concentrated Solar Irradiation of Targets in Plasmas
US-2024363308-A1 · Oct 31, 2024 · US
Other variables, e.g. energy, mass, velocity, time, temperature
Other variables, e.g. energy, mass, velocity, time, temperature · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J2237/24585 |
| Official title | Other variables, e.g. energy, mass, velocity, time, temperature |
| Display label | Other variables, e.g. energy, mass, velocity, time, temperature |
| Total patents | 540 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 15 |
| 2016 | 12 |
| 2017 | 23 |
| 2018 | 25 |
| 2019 | 33 |
| 2020 | 45 |
| 2021 | 49 |
| 2022 | 55 |
| 2023 | 67 |
| 2024 | 85 |
| 2025 | 101 |
| 2026 | 30 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Seasoning method and plasma processing apparatus
US-2024030014-A1 · Jan 25, 2024 · US
Distortion Correction Method and Electron Microscope
US-2018366295-A1 · Dec 20, 2018 · US
Sputtering apparatus and processing apparatus
US-10062553-B2 · Aug 28, 2018 · US
Plasma processing apparatus and plasma processing method
US-2018240697-A1 · Aug 23, 2018 · US
Apparatus for vacuum sputter deposition and method therefor
US-2018211823-A1 · Jul 26, 2018 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-2018158649-A1 · Jun 7, 2018 · US
Methods and systems for chamber matching and monitoring
US-2018158652-A1 · Jun 7, 2018 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-2018151330-A1 · May 31, 2018 · US
Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium
US-9934938-B2 · Apr 3, 2018 · US
Method for characterizing two dimensional nanomaterial
US-2017358420-A1 · Dec 14, 2017 · US
Particle beam system and method for the particle-optical examination of an object
US-2017316912-A1 · Nov 2, 2017 · US
Compressive scanning spectroscopy
US-2017316916-A1 · Nov 2, 2017 · US
Automated SEM nanoprobe tool
US-9805910-B1 · Oct 31, 2017 · US
System for manufacturing semiconductor device
US-9793093-B2 · Oct 17, 2017 · US
Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system
US-2017278665-A1 · Sep 28, 2017 · US
Studying dynamic specimen behavior in a charged-particle microscope
US-2017243713-A1 · Aug 24, 2017 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-2017236687-A1 · Aug 17, 2017 · US
Mineral identification using sequential decomposition into elements from mineral definitions
US-9734986-B2 · Aug 15, 2017 · US
Cross sectional depth composition generation utilizing scanning electron microscopy
US-2017200583-A1 · Jul 13, 2017 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J2237/24585?
- CPC H01J2237/24585 is the Cooperative Patent Classification code for “Other variables, e.g. energy, mass, velocity, time, temperature.”
- How many patents are filed under CPC H01J2237/24585 (Other variables, e.g. energy, mass, velocity, time, temperature)?
- Our database includes 540 publications tagged with this CPC code.
- Is patent activity under CPC H01J2237/24585 growing?
- Publication counts under this code: 85 in 2024 vs 101 in 2025 (latest complete years).