Three dimensional integrated circuit electrostatic discharge protection and prevention test interface
US-9900970-B2 · Feb 20, 2018 · US
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Wang Mill Jer patents
Wang Mill Jer is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Wang Mill Jer |
| Total patents | 3 |
| First publication | Feb 8, 2018 |
| Latest publication | Feb 20, 2018 |
Notable patents
Publications ranked by popularity score, then publication date.
Test circuit and method
US-9891266-B2 · Feb 13, 2018 · US
Test probing structure
US-2018038894-A1 · Feb 8, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Taiwan Semiconductor Mfg Co Ltd | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R1/07378 | 2 |
| H10W90/724 | 1 |
| G01R1/07342 | 1 |
| H01L2224/16225 | 1 |
| G01R31/3025 | 1 |