Method and system for charged particle microscopy with improved image beam stabilization and interrogation
US-11120969-B2 · Sep 14, 2021 · US
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Trease David patents
Trease David is listed as an inventor on 9 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Trease David |
| Total patents | 9 |
| First publication | Dec 22, 2016 |
| Latest publication | Sep 14, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and system for edge-of-wafer inspection and review
US-10770258-B2 · Sep 8, 2020 · US
Method and System for Charged Particle Microscopy with Improved Image Beam Stabilization and Interrogation
US-2020227232-A1 · Jul 16, 2020 · US
Method and system for charged particle microscopy with improved image beam stabilization and interrogation
US-10643819-B2 · May 5, 2020 · US
Method and System for Edge-of-Wafer Inspection and Review
US-2019006143-A1 · Jan 3, 2019 · US
Method and system for edge-of-wafer inspection and review
US-10056224-B2 · Aug 21, 2018 · US
Automated SEM nanoprobe tool
US-9805910-B1 · Oct 31, 2017 · US
Method and System for Edge-of-Wafer Inspection and Review
US-2017047193-A1 · Feb 16, 2017 · US
Method and System for Charged Particle Microscopy with Improved Image Beam Stabilization and Interrogation
US-2016372304-A1 · Dec 22, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 9 |
| Kla-Tencor Tech Corp | 1 |
| Kla Corp | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/244 | 5 |
| H01J37/28 | 5 |
| H01J2237/24485 | 5 |
| H01J2237/1534 | 4 |
| G01N21/9501 | 4 |