X-ray inspection apparatus
US-10393675-B2 · Aug 27, 2019 · US
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Tingay John patents
Tingay John is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Tingay John |
| Total patents | 7 |
| First publication | Sep 8, 2015 |
| Latest publication | Aug 27, 2019 |
Notable patents
Publications ranked by popularity score, then publication date.
X-ray inspection apparatus for inspecting semiconductor wafers
US-10215716-B2 · Feb 26, 2019 · US
X-ray inspection apparatus
US-2017025317-A1 · Jan 26, 2017 · US
X-ray inspection apparatus for inspecting semiconductor wafers
US-2017011973-A1 · Jan 12, 2017 · US
Method and apparatus for generating a three-dimensional model of a region of interest using an imaging system
US-9442080-B2 · Sep 13, 2016 · US
Method and apparatus for generating a three-dimensional model of a region of interest using an imaging system
US-2015369757-A1 · Dec 24, 2015 · US
Method and apparatus for generating a three-dimensional model of a region of interest using an imaging system
US-9129427-B2 · Sep 8, 2015 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Nordson Corp | 7 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 4 |
| H10P72/0616 | 4 |
| H10P72/78 | 4 |
| H10P72/53 | 4 |
| G01N2223/6113 | 4 |