Charged particle beam device, and sample observation method employing same
US-12437959-B2 · Oct 7, 2025 · US
Tanaka Shunya is listed as an inventor on 13 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Tanaka Shunya |
| Total patents | 13 |
| First publication | Feb 1, 2018 |
| Latest publication | Oct 7, 2025 |
Publications ranked by popularity score, then publication date.
US-12437959-B2 · Oct 7, 2025 · US
US-2025292993-A1 · Sep 18, 2025 · US
US-2025246398-A1 · Jul 31, 2025 · US
US-2025132123-A1 · Apr 24, 2025 · US
US-2024242925-A1 · Jul 18, 2024 · US
US-10800702-B2 · Oct 13, 2020 · US
US-10322967-B2 · Jun 18, 2019 · US
US-10322969-B2 · Jun 18, 2019 · US
US-10322968-B2 · Jun 18, 2019 · US
US-2018162775-A1 · Jun 14, 2018 · US
Latest publications not already listed above.
US-2018086669-A1 · Mar 29, 2018 · US
US-2018029936-A1 · Feb 1, 2018 · US
US-2018029935-A1 · Feb 1, 2018 · US
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kao Corp | 8 |
| Hitachi High Tech Corp | 3 |
| Hitachi Ltd | 2 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| C04B28/02 | 8 |
| C04B24/32 | 8 |
| C04B2103/408 | 8 |
| C04B40/0039 | 8 |
| C04B24/226 | 8 |