Method for calibrating simulation process based on defect-based process window
US-2025355366-A1 · Nov 20, 2025 · US
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Slachter Abraham patents
Slachter Abraham is listed as an inventor on 22 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Slachter Abraham |
| Total patents | 22 |
| First publication | Mar 26, 2020 |
| Latest publication | Nov 20, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Method for calibrating simulation process based on defect-based process window
US-12386268-B2 · Aug 12, 2025 · US
Method for determining defectiveness of pattern based on after development image
US-2025237967-A1 · Jul 24, 2025 · US
Method for determining defectiveness of pattern based on after development image
US-12332573-B2 · Jun 17, 2025 · US
Method of determining control parameters of a device manufacturing process
US-12197136-B2 · Jan 14, 2025 · US
Method of manufacturing devices
US-12044980-B2 · Jul 23, 2024 · US
Process window based on defect probability
US-2024126181-A1 · Apr 18, 2024 · US
Method of determining control parameters of a device manufacturing process
US-2024012337-A1 · Jan 11, 2024 · US
Process window based on defect probability
US-11822255-B2 · Nov 21, 2023 · US
Method of determining control parameters of a device manufacturing process
US-11768442-B2 · Sep 26, 2023 · US
Recent patents
Latest publications not already listed above.
Method for predicting stochastic contributors
US-2023081821-A1 · Mar 16, 2023 · US
Method for calibrating simulation process based on defect-based process window
US-2023076218-A1 · Mar 9, 2023 · US
Method of determining control parameters of a device manufacturing process
US-2023058839-A1 · Feb 23, 2023 · US
Method of determining control parameters of a device manufacturing process
US-11513442-B2 · Nov 29, 2022 · US
Method for determining defectiveness of pattern based on after development image
US-2022342316-A1 · Oct 27, 2022 · US
Method of manufacturing devices
US-2021397172-A1 · Dec 23, 2021 · US
Process window based on defect probability
US-2021356874-A1 · Nov 18, 2021 · US
Method of manufacturing devices
US-11087065-B2 · Aug 10, 2021 · US
Process window based on defect probability
US-11079687-B2 · Aug 3, 2021 · US
Method of determining control parameters of a device manufacturing process
US-2021149312-A1 · May 20, 2021 · US
Process window based on defect probability
US-2021018850-A1 · Jan 21, 2021 · US
Method of manufacturing devices
US-2020097633-A1 · Mar 26, 2020 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Asml Netherlands Bv | 22 |
| Aslm Netherlands B V | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/70625 | 22 |
| G03F7/70525 | 16 |
| G03F7/70633 | 14 |
| G03F7/70558 | 14 |
| G03F7/705 | 12 |